| CPC G01R 31/2601 (2013.01) [G01R 31/2608 (2013.01); H02M 1/08 (2013.01)] | 20 Claims |
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8. A semiconductor-component test device for testing a semiconductor component having a first terminal and a second terminal, the semiconductor-component test device comprising:
a power supply having a third terminal and a fourth terminal, and being for supplying either a test current or a test voltage;
a first connection member;
a second connection member;
a switch circuit board on which a switch circuit is either mounted or formed;
a first connector attached to the switch circuit board;
a first conductor plate or conductor bar, attached to the switch circuit board;
a second conductor plate or conductor bar, attached to the switch circuit board; and
a mother board; wherein
the third terminal, and the first conductor plate or conductor bar are electrically connected;
the second conductor plate or conductor bar, and the first connection member are electrically connected;
the first connection member and the first terminal are electrically connected;
the second connection member and the second terminal are electrically connected;
the second connection member and the fourth terminal are electrically connected;
the switch circuit board is connected, via the first connector, with the mother board; and
the switch circuit carries out a first operation that electrically short-circuits the first conductor plate or conductor bar and the second conductor plate or conductor bar, and a second operation that electrically opens the circuit between the first conductor plate or conductor bar and the second conductor plate or conductor bar.
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