LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 27th DAY OF May, 2025
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

N, Ravishankar; K S, Muniswamy Setty; H P, Praveen Kumar; Naik, Praveen; and Dhanaraju, Lakshmikanth, to Dell Products L.P. Policy-driven alert management 12314784 Cl. G06F 9/542.
N.V. Perricone LLC: See--
Caires, Christopher Cain 12311046 Cl. A61K 8/671.
Na, Hanbyeul: See--
Moon, Youngsik; Kim, Jiyoup; Na, Hanbyeul; Son, Hongrak; and Cho, Hyunsang 12316736 Cl. H04L 9/008.
Na, Hoonjoo: See--
Chung, Wonkeun; Kang, Byungchul; Park, Hongkeun; Na, Hoonjoo; and Shin, Chunghwan 12317572 Cl. H10D 64/62.
Na, Hyeong Ju; to SK hynix Inc. Storage device, host device and computing system 12314565 Cl. G06F 3/061.
Na, Hyoseok: See--
Choi, Taihwan; Kim, Dokyun; Kim, Jongdoo; Na, Hyoseok; Ahn, Kwangseok; and Hwang, Wongi 12316792 Cl. H04M 1/0237.
Na, Jisu: See--
Kim, Kiwook; Kim, Kwangmin; Kim, Yangwan; and Na, Jisu 12314519 Cl. G06F 3/0446.
Na, Tae Young: See--
Lee, Sun Young; Lim, Jeong-yeon; Na, Tae Young; Lee, Gyeong-taek; Shin, Jae-seob; Son, Se Hoon; and Kim, Hyo Song 12316876 Cl. H04N 19/70.
Na, Tae Young; Lee, Sun Young; Ko, Kyung Hwan; Son, Se Hoon; and Kim, Jae Il, to SK TELECOM CO., LTD. Inter-prediction method and video decoding apparatus using the same 12316835 Cl. H04N 19/105.
Na, Taesik: See--
Shu, Guanghua; Na, Taesik; Xu, Zhihong; Shende, Wideet; Singh, Manmeet; Tenneti, Tejaswi; and Sadri, Reza 12314286 Cl. G06F 16/283.
Na, Young Il: See--
Kang, Yim Ju; Na, Young Il; Lee, Hoon; Yoo, Jae Nam; Lee, Chang Jae; and Lee, Wan Jae 12314953 Cl. G06Q 20/40145.
Nabar, Kunal Prafulla: See--
Dageville, Benoit; Harjono, Johan; Nabar, Kunal Prafulla; and Pelley, Steven James 12314247 Cl. G06F 16/2365.
Nabar, Rohit U: See--
Sambhwani, Sharad; Nickisch, Dirk; Shanbhag, Madhukar K; Nabar, Rohit U; Balasubramanian, Sanjeevi; Narra, Shiva Krishna; Subramanian, Sriram; Tabet, Tarik; Kamala Govindaraju, Vishwanth; Sun, Yakun; and Subrahmanya, Parvathanathan 12317294 Cl. H04W 72/30.
Naber, Brandon David; Zufall, Scott; and Dunfee, II, Jeffrey S., to Stryker Corporation Techniques for transporting autonomous patient support apparatuses and medical equipment to an incident scene 12315613 Cl. G16H 20/13.
Nabernik, Stane: See--
Kiederle, Günter; Nabernik, Stane; and Muth, Maximilan 12310453 Cl. A43B 23/022.
Nabeshima, Yo-Ichi; Nabeshima, Yoko; and Abe, Chiaki, to FOUNDATION FOR BIOMEDICAL RESEARCH AND INNOVATION AT KOBE Method for producing active GcMAF 12312380 Cl. C07K 1/22.
Nabeshima, Yoko: See--
Nabeshima, Yo-Ichi; Nabeshima, Yoko; and Abe, Chiaki 12312380 Cl. C07K 1/22.
Nabeto, Yu: See--
Shiraishi, Soma; Kikuchi, Katsumi; Sato, Takami; and Nabeto, Yu 12314925 Cl. G06Q 20/208.
Nabi, Saleh; Benosman, Mouhacine; and Mowlavi, Saviz, to Mitsubishi Electric Research Laboratories, Inc. Time-varying reinforcement learning for robust adaptive estimator design with application to HVAC flow control 12313276 Cl. F24F 11/63.
Nabors Drilling Technologies USA, Inc.: See--
Ardic, Hifzi; Yousef, Faisal; Bluestone, Edward; Hall, James M.; and Belanger, Ryan 12312917 Cl. E21B 4/04.
NABTESCO CORPORATION: See--
Hashimoto, Hiroaki 12310863 Cl. A61F 2/644.
Nace, Nicholas Stone: See--
Freeman, Michael James; and Nace, Nicholas Stone 12312007 Cl. B62D 25/04.
Nachaegari, Satish K.: See--
Patel, Mahesh V.; Chidambaram, Nachiappan; and Nachaegari, Satish K. 12310978 Cl. A61K 31/568.
Nachtigal, Jay: See--
Staab, Jared; Barta, Brent; Flynn, Brigid; Krause, Tim; and Nachtigal, Jay 12310897 Cl. A61G 10/005.
Nadar, Mariappan S.: See--
Arberet, Simon; Nadar, Mariappan S.; Mailhe, Boris; Mostapha, Mahmoud; and Janardhanan, Nirmal 12315047 Cl. G06T 11/008.
Nader, Ali: See--
Reial, Andres; Maleki, Sina; and Nader, Ali 12317226 Cl. H04W 68/02.
Naderi, Roozbeh: See--
Slepchenkov, Mikhail; and Naderi, Roozbeh 12316240 Cl. H02M 7/003.
Nadgir, Abhay Balabhim: See--
Piech, Marcin; Corn, May L; Ciol, Joseph William; Harris, Peter R.; Ateeq, Mohammed Z.; and Nadgir, Abhay Balabhim 12311212 Cl. A62C 37/50.
Nadiminti, Chandra Mohan Babu: See--
Kulshreshtha, Ashutosh; Hulick, Jr., Walter T.; and Nadiminti, Chandra Mohan Babu 12316666 Cl. H04L 63/1433.
Nadzadi, Mark Ellsworth; Otto, Jason Karl; and Mistry, Amit, to Mako Surgical Corp. Femoral component for bone conservation 12310856 Cl. A61F 2/3859.
Nae, Nir: See--
Eigler, Neal; Whiting, James; and Nae, Nir 12311134 Cl. A61M 27/002.
Naegeli, Andrew H.: See--
Hayter, Gary Alan; McGarraugh, Geoffrey V.; Naegeli, Andrew H.; Mazza, John Charles; and Feldman, Benjamin Jay 12313622 Cl. G01N 33/49.
Naegeli, Werner Roland: See--
Sallee, Kevin Jared; Naegeli, Werner Roland; Jang, William; Khamly, Somphone; Tung, Michael Fei-Kit; and Abdallah, Thomas Frederick 12311908 Cl. B60W 10/184.
Nagae, Yusuke: See--
Kinsho, Takeshi; Baba, Akihiro; Nagae, Yusuke; and Watanabe, Tomohiro 12312309 Cl. C07C 67/40.
Kinsho, Takeshi; Baba, Akihiro; Nagae, Yusuke; and Watanabe, Tomohiro 12312310 Cl. C07C 67/40.
Nagahashi, Kazuto; Hirabayashi, Takuma; Miwa, Keishi; and Matsuda, Yukimasa, to RICOH COMPANY, LTD. Liquid discharge head, liquid discharge device, and liquid discharge apparatus 12311663 Cl. B41J 2/14233.
Nagahata, Taishi: See--
Hirayama, Takuya; Shida, Shogo; Nagahata, Taishi; Toda, Hayato; and Kurita, Tomoaki 12313308 Cl. F25B 31/026.
Nagai, Asumi; Nishimura, Noboru; and Yamaguchi, Hirofumi, to NGK INSULATORS, LTD. Stacked structure and semiconductor manufacturing apparatus member 12315757 Cl. H01L 21/68757.
Nagai, Hiroki; Matsui, Takaaki; Nose, Takafumi; Isobe, Koichiro; Nogimura, Ryo; and Kanai, Kazuyuki, to TOYOTA JIDOSHA KABUSHIKI KAISHA Battery module 12315952 Cl. H01M 50/291.
Nagai, Kenji: See--
Liao, Changliang; Wu, Weifeng; Liao, Li; Nagai, Kenji; Zhong, Ding; Deng, Qiao; Huang, Tao; Zhan, Qiang; Tian, Haiqiang; Hu, Yuehua; Zhao, Feng; Wang, Gang; Huang, Bo; Xu, Zhixiao; and Wang, Shangyun 12316791 Cl. H04M 1/0216.
Nagai, Yukihiro; and UNITED MICROELECTRONICS CORP., to Fujian Jinhua Integrated Circuit Co., Ltd. Method for forming memory device with buried gate in peripheral circuit region 12317474 Cl. H10B 12/09.
Nagalo, Bolni M.: See--
Borad, Mitesh J.; and Nagalo, Bolni M. 12311000 Cl. A61K 35/766.
Nagamatsu, Kento: See--
Inoue, Junpei; Goto, Noriyuki; Sakata, Yuichi; and Nagamatsu, Kento 12311471 Cl. B23K 26/702.
Inoue, Junpei; Goto, Noriyuki; Sakata, Yuichi; and Nagamatsu, Kento 12311477 Cl. B23K 37/0443.
Nagamine, Kenta: See--
Fujinoki, Norihito; Sakaida, Masashi; Nagamine, Kenta; Sakai, Akihiro; and Miyazaki, Akinobu 12315874 Cl. H01M 10/0562.
Naganna, Soma Shekar: See--
Vaithyalingam, Balakumaran; Seth, Abhishek; Gray-Donald, Trent A.; and Naganna, Soma Shekar 12314268 Cl. G06F 16/24573.
Nagano, Keijiroh: See--
Yokoyama, Ryo; Yamano, Ikuo; Ishikawa, Tsuyoshi; Shiroma, Shin; and Nagano, Keijiroh 12314473 Cl. G06F 3/016.
Nagano, Muneyoshi: See--
Sudo, Ushio; Nakamura, Wataru; Hasegawa, Tomoya; Nagano, Muneyoshi; Wada, Masahiro; Tada, Katsumi; Sato, Yousuke; and Naito, Daisuke 12312809 Cl. E04C 2/46.
Nagano, Satoshi: See--
Kosai, Ken-ichiro; Nagano, Satoshi; and Futagawa, Toshitaka 12310998 Cl. A61K 35/761.
Nagano, Shohji: See--
Takatani, Shinsuke; Okumura, Shunsuke; and Nagano, Shohji 12312662 Cl. C22C 38/06.
Takatani, Shinsuke; Ushigami, Yoshiyuki; Nakamura, Shuichi; Nagano, Shohji; and Okumura, Shunsuke 12312649 Cl. C21D 9/46.
Nagano, Takehiko; to HITACHI, LTD. Software query information management system and software query information management method 12314699 Cl. G06F 8/65.
Naganuma, Hiromasa: See--
Miyada, Naoyuki; Yanagisawa, Hideki; Ishida, Mamiko; Mizuno, Masayoshi; Egawa, Naoki; and Naganuma, Hiromasa 12315172 Cl. G06T 7/246.
Nagao, Hisako: See--
Sakuragi, Kenta; Takahashi, Shinji; Sunaga, Kentaroh; Moriwake, Chikako; and Nagao, Hisako 12313715 Cl. G01R 33/546.
Nagao, Katsuhisa; to ROHM CO., LTD. SIC semiconductor device with current sensing capability 12313659 Cl. G01R 19/0092.
Nagao, Kohei; Abe, Daiki; and Hamamoto, Ryota, to KUBOTA CORPORATION Work vehicle and control method for work vehicle 12312771 Cl. E02F 9/2221.
Nagapudi, Kanth: See--
Anusuri, Vijay; Bell, James; Herrera, Daniel; Hopkins, Michael A.; Joshi, Ramesh; Joshi, Sameer; Nagapudi, Kanth; and Siripurapu, Kiran 12314157 Cl. G06F 11/3684.
Nagaraja, Girish: See--
Ahmad, Arsalan; van den Dungen, Martinus Petrus Lambertus; Gupta, Lokesh; Nagaraja, Girish; and Vaishnavi, Nikhil Yograj 12316491 Cl. H04L 41/0803.
Wilson, Gregg Alan; Elmenshawy, Ayman Mohammed Aly Hassan; Nagaraja, Girish; Tammana, Venkata Rama Prasad; and Cole, Gary Philip 12316762 Cl. H04L 9/3213.
Nagarajan, Karthick Phillip; and Fisher, Thomas, to OMRON Corporation Method and apparatus for dynamically modifying a representation of an autonomous robot 12311554 Cl. B25J 9/1664.
Nagarajan, Kumar: See--
Dalmia, Sidharth S.; and Nagarajan, Kumar 12315853 Cl. H01L 25/105.
Nagari, Rohith: See--
Corsello, Steven; Spangler, Ryan; Nagari, Rohith; and Golub, Todd 12313632 Cl. G01N 33/57492.
Nagasaka, Hideo: See--
Kinoshita, Takashi; Aoyama, Ryu; Yagi, Izumi; Hirose, Yoji; Tokuhisa, Fumiaki; Nagasaka, Hideo; Doi, Shouichi; Yamada, Makoto; and Koike, Kaoru 12315492 Cl. G10L 13/08.
Nagasaka, Toshimitsu; to RINNAI CORPORATION Combustion apparatus 12313259 Cl. F23M 5/04.
Nagasawa, Kazunori; to MEDIPAL HOLDINGS CORPORATION Delivery unit and delivery system 12312156 Cl. B65D 88/12.
Nagase, Fumiaki; Kuriyama, Keita; Ono, Yu; Hasegawa, Hitoshi; Fukuzono, Hayato; Osaka, Kazuo; Furuya, Hiroyuki; Yoshioka, Masafumi; Miyagi, Toshifumi; and Hayashi, Takafumi, to Nippon Telegraph and Telephone Corporation Congestion control method, congestion control device, congestion control program 12316545 Cl. H04L 47/24.
Nagashima, Satoshi: See--
Hoh, Baik; Oguchi, Kentaro; Daly, John F.; Orii, Akio; Nagashima, Satoshi; Lombard, Adrian; Li, Paul; and Vekaria, Kruti 12314993 Cl. G06Q 30/0625.
Nagashima, Takumi; Koizumi, Yoshihiro; and Oya, Shun, to SEIKO EPSON CORPORATION Cartridge, printing system, and printing apparatus 12311671 Cl. B41J 2/17523.
Nagaswamy, Venkat: See--
Arsanjani, Ali; Martin, Bryan R.; Mukerji, Manu; Nagaswamy, Venkat; and Lincoln, Marshall 12314672 Cl. G06F 40/30.
Nagata, Masaki; Watanabe, Kazuya; Uchida, Keisuke; Honma, Kohei; and Hirabayashi, Hiraku, to TDK CORPORATION Magnetic field detection device 12313704 Cl. G01R 33/0005.
Nagata, Masashi: See--
Takasugi, Satoshi; Kawai, Yoshitaka; Nagata, Masashi; and Yamaji, Taketo 12310383 Cl. A23C 9/127.
Nagata, Sanato: See--
Okumura, Tadashi; Nagata, Sanato; and Ando, Masahiko 12314848 Cl. G06N 3/08.
Nagata, Satoshi: See--
Matsumura, Yuki; Takeda, Kazuki; and Nagata, Satoshi 12317300 Cl. H04W 72/535.
Nagata, Shuhei; Yorikane, Shigeyuki; Morita, Kenji; Kajie, Yuta; and Chiba, Kotaro, to Hitachi Industrial Equipment Systems Co., Ltd. Screw compressor 12313069 Cl. F04C 2/16.
Nagatsuka, Shuhei: See--
Kunitake, Hitoshi; and Nagatsuka, Shuhei 12317600 Cl. H10D 87/00.
Nagesh, Pavan; and Joshi, Shantanu, to Dell Products L.P. Distributed hardware and software component monitoring 12314119 Cl. G06F 11/004.
NAGESWARA RAO KONETI: See--
Koneti, Nageswara Rao 12310568 Cl. A61B 17/0057.
Nageswaran, Shravan: See--
Blania, Alex; Novendstern, Max; Sippl, Philipp; Brendel, Christian; Herbig, Sandro; Wenus, Luis; and Nageswaran, Shravan 12314952 Cl. G06Q 20/40145.
Nagorka, Jeremy: See--
Appel, D. Keith; Baker, Michael J.; and Nagorka, Jeremy 12312183 Cl. B65G 47/911.
Nagoya Denki Educational Foundation: See--
Kawano, Junichi; and Kobayashi, Yuichi 12312280 Cl. C04B 41/524.
Nagoya, Wataru; to DAISHINKU CORPORATION Piezoelectric resonator plate and piezoelectric resonator device 12316301 Cl. H03H 9/19.
Nagpal, Anil; Kozu, Yuho; Kumar, Nitesh; Kushibe, Masanori; Yamaguchi, Tomonari; and Toyota Motor North America, Inc., to Toyota Jidosha Kabushiki Kaisha Correcting a mismatched user profile for vehicle settings 12311855 Cl. B60R 16/037.
NAGRAVISION SARL: See--
Stransky-Heilkron, Philippe 12316670 Cl. H04L 63/145.
Stransky-Heilkron, Philippe 12316889 Cl. H04N 21/23424.
Nagy, Peter A; to Invisalert Solutions, Inc. Patient safety monitoring method and apparatus 12315353 Cl. G08B 21/02.
Nahavandi, Kurosh: See--
Brubaker, Michael T.; Matheny, Nathan Wray; and Nahavandi, Kurosh 12311085 Cl. A61M 1/00.
NAHLS CORPORATION CO., LTD.: See--
Watanabe, Bunta; Yoshioka, Ryuzo; and Ishida, Hideaki 12312371 Cl. C07F 9/3813.
Naidu, Sharath Subramanya: See--
Singh, Chanpreet; Herrmann, Stephan Matthias; Naidu, Sharath Subramanya; Sharma, Nikhil; Jha, Bhagwan Babu; and Kumar, Maninder 12316981 Cl. H04N 23/80.
Naik, Abhay: See--
Harikrishnasamy, Arunkumar; Krishna, Sai B.; Naik, Abhay; and Phalak, Sanket V. 12313332 Cl. F25D 23/085.
Naik, Praveen: See--
N, Ravishankar; K S, Muniswamy Setty; H P, Praveen Kumar; Naik, Praveen; and Dhanaraju, Lakshmikanth 12314784 Cl. G06F 9/542.
Naik, Sharath R.: See--
Harte, Matthew V.; Naik, Sharath R.; Petersen, Alexander S.; Spicer, Ryan M.; and Taipale, Mark S. 12317384 Cl. H05B 45/20.
Naik, Vighnesh: See--
Oliveira, Ivan Borges; Kazemi Tutunchi, Golbarg; Spaen, Quico Pepjin; Jacobs, Timothy Lee; Naik, Vighnesh; Singh, Akhand Pratap; Rangaswamy, Suresh; Nathan, Sendhil; Ward, Ian; Kumar, Manik; and Patsakis, Georgios 12316528 Cl. H04L 45/125.
Naim, Muhammad Ahsan: See--
Ross, Kevin; and Naim, Muhammad Ahsan 12317353 Cl. H04W 76/15.
Nain, Gautam; to FORTNA Systems, Inc. Vacuum-based end effector, system, and method for detecting parcel engagement and classifying parcels using audio 12311536 Cl. B25J 15/0683.
Nainar, Nagendra Kumar; Zacks, David John; and Saini, Vinay, to Cisco Technology, Inc. Authenticated secure audio calling and digitally signed metadata for integrity verification 12317076 Cl. H04W 12/065.
Nair, Geetha: See--
Rao, Ailneni Rakshitha; Verma, Shashwat; and Nair, Geetha 12312940 Cl. E21B 47/008.
Nair, Rahul: See--
Eubank, Christopher T.; Chalmers, Devin W.; Kalinichev, Kirill; Nair, Rahul; and Salter, Thomas G. 12314631 Cl. G06F 3/165.
Nair, Sandeep: See--
Masputra, Cahya Adiansyah; Fernandes, Delziel Jude; Jewell, Darrin; Nair, Sandeep; and Shen, Wei Francis 12314786 Cl. G06F 9/545.
Nair, Sreevishnu Somasekharan; and Venkatesh, Karthik, to WALDEN UNIVERSITY, LLC System and method for a cognitive conversation service 12314675 Cl. G06F 40/35.
Naito, Daisuke: See--
Sudo, Ushio; Nakamura, Wataru; Hasegawa, Tomoya; Nagano, Muneyoshi; Wada, Masahiro; Tada, Katsumi; Sato, Yousuke; and Naito, Daisuke 12312809 Cl. E04C 2/46.
Naito, Eiichi: See--
Kudoh, Takahiro; and Naito, Eiichi 12313692 Cl. G01R 31/392.
Naito, Hidehiro; to Toshiba Tec Kabushiki Kaisha Fraud monitoring device and fraud monitoring method therefor 12314955 Cl. G06Q 20/4016.
Naito, Hisamichi: See--
Takakura, Nobuyuki; Naito, Hisamichi; and Wakabayashi, Taku 12312603 Cl. C12N 5/0692.
Naito, Keigo: See--
Kabasawa, Naoaki; Naito, Keigo; and Kim, Taeyoung 12317744 Cl. H10K 85/657.
Naitou, Yasuhiro; to FANUC CORPORATION Robot control device, robot system, and robot control method 12311558 Cl. B25J 9/1674.
Najafi, Khalil: See--
Cho, Jae Yoong; and Najafi, Khalil 12313406 Cl. G01C 19/5712.
Najafi, Mohammad: See--
Main, Ian; Najafi, Mohammad; Knight, Mitchell Robert; Chui, Adele Syt Fu; Heckbert, Dylan; and Vince, Murray 12310742 Cl. A61B 5/4812.
NAJRAN UNIVERSITY: See--
Alqahtani, Ali Saeed; and Alahmari, Saeed Saad 12310731 Cl. A61B 5/163.
Nakadaira, Atsushi; Watanabe, Hiroki; Fujimura, Shigeru; Ohashi, Shigenori; Ishida, Tatsuro; and Hidaka, Kota, to Nippon Telegraph and Telephone Corporation Content contract system, content contract method, and control terminal 12314349 Cl. G06F 21/10.
Nakadori, Minoru: See--
Takanohashi, Kodai; Okubo, Atsushi; Tachibana, Yuji; Momoshima, Shogo; Kato, Takaaki; Kaneichi, Daiki; and Nakadori, Minoru 12315305 Cl. G07B 15/02.
Nakagawa, Akitoshi: See--
Noguchi, Hiroshi; Niwa, Terutake; and Nakagawa, Akitoshi 12311319 Cl. B01D 63/0822.
Nakagawa, Masanori; and Shoki, Tsutomu, to HOYA CORPORATION Reflective mask blank, reflective mask, and method for manufacturing semiconductor device 12313968 Cl. G03F 1/24.
Nakagawa, Ryo: See--
Mizukami, Tomoo; Sakamoto, Noriaki; Tsujikawa, Tomonobu; Kawarazaki, Shota; Nakagawa, Ryo; and Kobayashi, Yoshiyuki 12314105 Cl. G06F 1/28.
Nakagawa, Yuya; and Imakura, Yasuo, to NITTO KASEI CO., LTD. Curing catalyst used for curing of polymer, moisture curable composition, and method for producing cured product 12312464 Cl. C08L 71/02.
Nakahata, Isao; and Tsukahara, Takuya, to TDK CORPORATION Alloy ribbon and laminated core 12312667 Cl. C22C 45/02.
Nakai, Kota: See--
Murashige, Takeshi; Inagaki, Junichi; Hosokawa, Kazuhito; Nakai, Kota; and Kanno, Toshihiro 12311645 Cl. B32B 3/14.
Nakaiso, Toshiyuki: See--
Yoshioka, Yoshimasa; Toyoshima, Kenji; Mizuno, Takaaki; and Nakaiso, Toshiyuki 12315682 Cl. H01G 4/30.
Nakajima, Daisuke: See--
Yamaguchi, Kouhei; Yamamoto, Masaki; Nakajima, Daisuke; and Matsumoto, Izumi 12311636 Cl. B32B 17/10165.
Nakajima, Hiroshi: See--
Ogawa, Kohei; Oka, Hiroaki; Nakajima, Hiroshi; and Niihara, Koshiro 12311482 Cl. B23P 6/00.
Nakajima, Makoto: See--
Ogata, Hiroto; Nishimaki, Hirokazu; Nakajima, Makoto; Mitsutake, Yuki; and Hattori, Hayato 12313972 Cl. G03F 7/11.
Nakajima, Mari: See--
Fukushima, Shingo; Oshima, Kouji; Imamura, Naoto; Nakajima, Yuuki; Nakajima, Mari; and Kobayashi, Ryohei 12315481 Cl. G10H 1/34.
Nakajima, Yoshio: See--
Uetake, Yoko; Watanabe, Akemi; and Nakajima, Yoshio 12312480 Cl. C09D 11/322.
Nakajima, Yuuki: See--
Fukushima, Shingo; Oshima, Kouji; Imamura, Naoto; Nakajima, Yuuki; Nakajima, Mari; and Kobayashi, Ryohei 12315481 Cl. G10H 1/34.
Nakaki, Hiroshi: See--
Yoshimizu, Yasuhito; and Nakaki, Hiroshi 12317494 Cl. H10B 43/27.
Nakamaru, Yoshinobu: See--
Shimizu, Hidetoshi; Nakamaru, Yoshinobu; and Nishimura, Yukiko 12310946 Cl. A61K 31/4152.
NakaMats, Yoshiro Super smartphone 12314081 Cl. G06F 1/1641.
Nakamura, Akihiko; and Sasaki, Takaakira, to FUJIFILM Business Innovation Corp. Coating device, coating method, and method for manufacturing photoconductor for suppressing occurrence of bubble defects in coated film 12317632 Cl. H10F 71/00.
Nakamura, Akiko; Murase, Yoshiharu; Nishikawa, Hideaki; Yakabe, Taro; and Miyauchi, Naoya, to NATIONAL INSTITUTE FOR MATERIALS SCIENCE Device for observing permeation and diffusion path of observation target gas, observation target gas measuring method, point-defect location detecting device, point-defect location detecting method, and observation samples 12315696 Cl. H01J 37/20.
Nakamura, Atsushi: See--
Oda, Tomokazu; Nakamura, Atsushi; Iida, Daisuke; Koshikiya, Yusuke; and Honda, Nazuki 12313489 Cl. G01M 11/02.
Nakamura, Atsushi; Koshikiya, Yusuke; and Honda, Nazuki, to NIPPON TELEGRAPH AND TELEPHONE CORPORATION Mode field diameter measuring method and mode field diameter measuring device 12313493 Cl. G01M 11/332.
Nakamura, Fumiya: See--
Kobayashi, Kazuma; Kawagoe, Masako; Shirai, Haruhisa; Ichikawa, Shohei; Nakamura, Fumiya; Saigusa, Kazushige; and Hashimoto, Asami 12311668 Cl. B41J 2/1721.
Nakamura, Hiroaki; Iwata, Masashige; and Kimura, Kazunari, to Daifuku Co., Ltd. Transfer device 12312168 Cl. B65G 1/0435.
Nakamura, Hiroshi: See--
Maejima, Hiroshi; Isobe, Katsuaki; Okada, Nobuaki; Nakamura, Hiroshi; and Tsurudo, Takahiro 12315859 Cl. H01L 25/18.
Nakamura, Kazune: See--
Mizusawa, Hiroshi; Nakamura, Kazune; and Eguchi, Yosuke 12312119 Cl. B65B 69/0025.
Nakamura, Kenta; to Canon Kabushiki Kaisha Imaging apparatus, information processing apparatus, control method, and storage medium 12315038 Cl. G06T 11/00.
Nakamura, Kiyoshi: See--
Yoshida, Yoshinobu; Yoda, Toshiyuki; Nakamura, Kiyoshi; Namikoshi, Shohei; Ota, Takuya; and Hanawa, Keita 12311655 Cl. B41J 11/00218.
Nakamura, Masato: See--
Yoshida, Kei; Saito, Masatoshi; Nakamura, Masato; Mizutani, Sayaka; Mitani, Masato; Aoyama, Yoshinori; and Takahashi, Ryota 12312317 Cl. C07D 239/26.
Nakamura, Mitsuhiro: See--
Hatano, Michio; Nakamura, Mitsuhiro; and Ogura, Toshihiko 12315695 Cl. H01J 37/20.
Nakamura, Naoto; to Sony Group Corporation Surgery support system, surgery support method, information processing apparatus, and information processing program 12315638 Cl. G16H 50/30.
Nakamura, Satoshi: See--
Yoshida, Kota; Yotsuyanagi, Taiki; Kimura, Takayuki; Nakamura, Satoshi; and Miyamoto, Yoshihiro 12312010 Cl. B62D 25/082.
Nakamura, Shinichi; Yamayoshi, Tomoki; Suzuki, Taichi; and Tanaka, Hirokazu, to UACJ CORPORATION Brazed aluminum member and method for producing brazed product 12311473 Cl. B23K 35/0238.
Nakamura, Shuichi: See--
Takatani, Shinsuke; Ushigami, Yoshiyuki; Nakamura, Shuichi; Nagano, Shohji; and Okumura, Shunsuke 12312649 Cl. C21D 9/46.
Nakamura, Shuji; and Takahashi, Takeshi, to OLYMPUS CORPORATION Flexible tube insertion apparatus, control apparatus, and method of changing rigidity 12310557 Cl. A61B 1/0052.
Nakamura, Suguru: See--
Hamaguchi, Jun; Nakamura, Suguru; and Yokohara, Toshiyuki 12312169 Cl. B65G 1/0464.
Nakamura, Takashi: See--
Saito, Keiichi; Nakamura, Takashi; Koide, Gen; Someya, Takao; and Yokota, Tomoyuki 12313460 Cl. G01J 1/44.
Nakamura, Takayuki: See--
Kishi, Yumiko; Nakamura, Takayuki; and Fujii, Toshishige 12312138 Cl. B65D 51/245.
Nakamura, Tatsunori; to SHARP KABUSHIKI KAISHA Display device and display method 12315468 Cl. G09G 3/36.
Nakamura, Wataru: See--
Sudo, Ushio; Nakamura, Wataru; Hasegawa, Tomoya; Nagano, Muneyoshi; Wada, Masahiro; Tada, Katsumi; Sato, Yousuke; and Naito, Daisuke 12312809 Cl. E04C 2/46.
Nakanishi, Daichi: See--
Ono, Tetsuya; Nakanishi, Daichi; and Kibushi, Yuko 12313817 Cl. G02B 1/14.
Nakanishi, Takayuki: See--
Kitagawa, Yuichi; Kumagai, Marina; Hasegawa, Yasuchika; Nakanishi, Takayuki; and Fushimi, Koji 12312369 Cl. C07F 5/003.
Nakanishi, Yohei: See--
Imabayashi, Hiroki; Kanehiro, Masayuki; Utsumi, Hisayuki; Okamoto, Shota; and Nakanishi, Yohei 12317734 Cl. H10K 71/12.
Nakano, Chiharu: See--
Sugiyama, Daisuke; and Nakano, Chiharu 12312475 Cl. C09C 1/3081.
Nakano, Haruka: See--
Arai, Kenta; Ebata, Daisuke; Kudo, Ryusuke; Mizushita, Masaki; Nishimura, Tetsuya; and Nakano, Haruka 12315657 Cl. H01B 7/0045.
Nakano, Hiroyuki; Hirose, Akihiro; Takao, Kazuki; and Hirotani, Kozo, to TOYODA GOSEI CO., LTD. Vehicle exterior part 12311850 Cl. B60R 13/04.
Nakano, Yousuke; Fukumoto, Shiho; and Kataoka, Kouta, to Proterial, Ltd. Hot work tool steel and hot work tool 12312665 Cl. C22C 38/46.
Nakano, Yuki: See--
Tasaki, Satomi; Yamaki, Taro; Itoi, Hiroaki; Nakano, Yuki; and Kawamura, Yuichiro 12317740 Cl. H10K 85/626.
Nakano, Yusuke; to TOYOTA JIDOSHA KABUSHIKI KAISHA Image processing system, image processing method, and storage medium for associating moving objects in images 12315173 Cl. G06T 7/248.
Nakao, Isamu: See--
Hosokawa, Hiroyuki; Yotoriyama, Tasuku; Masuhara, Shin; and Nakao, Isamu 12313639 Cl. G01N 35/00584.
Nakaoku, Hiroshi; and Nishio, Akinori, to MITSUBISHI ELECTRIC CORPORATION Machining head and three-dimensional laser processing machine using the machining head 12311472 Cl. B23K 26/702.
Nakashima, Daiichiro: See--
Nogami, Toshizo; Ouchi, Wataru; Lee, Taewoo; Suzuki, Shoichi; Nakashima, Daiichiro; Yoshimura, Tomoki; and Lin, Huifa 12317293 Cl. H04W 72/231.
Nakashima, Toshiyuki: See--
Ohtsuka, Yoshio; Izawa, Masato; Ogawa, Tomoki; Nakashima, Toshiyuki; Aihara, Masayuki; Funamoto, Kazuhiro; and Miki, Tadashi 12310564 Cl. A61B 1/247.
Nakashima, Yasunari; to Murata Manufacturing Co., Ltd. Electronic component 12315668 Cl. H01F 27/29.
Nakashima, Yusuke: See--
Yasukawa, Kouji; Nakashima, Yusuke; and Okuzumi, Ryo 12313992 Cl. G03G 15/2053.
Nakata, Takatoshi; and Ui, Hiroki, to OmniVision Technologies, Inc. Image sensors having image blur correction 12316979 Cl. H04N 23/743.
Nakatani, Yoshihiro; to OMRON Corporation Control device and control method 12314025 Cl. G05B 19/058.
Nakatsuka, Yoshiki; and Matsuda, Takao, to CASIO COMPUTER CO., LTD. Case and timepiece 12314011 Cl. G04B 37/05.
Nakatsukasa, Kimihiko: See--
Ito, Tomoki; Yukimasa, Akinori; Ohara, Satoshi; Shintani, Yasuyuki; and Nakatsukasa, Kimihiko 12311796 Cl. B60L 53/62.
Nakayama, Chikao: See--
Fujiwara, Koichi; Nakayama, Chikao; and Iwasaki, Ayako 12310743 Cl. A61B 5/4818.
Nakayama, Kota: See--
Watanabe, Shu; Yamashita, Kunichi; Tokuchi, Kengo; Kimura, Masamichi; Nakayama, Kota; and Kawamura, Akihide 12311082 Cl. A61L 9/20.
Nakayama, Tomoko; and Kaneda, Haruki, to SUMITOMO METAL MINING CO., LTD. Positive electrode active material for lithium ion secondary battery, method for producing the same, and lithium ion secondary battery 12315909 Cl. H01M 4/131.
Nakazawa, Yasutaka: See--
Koezuka, Junichi; Okazaki, Kenichi; Hosaka, Yasuharu; Obonai, Toshimitsu; Nakazawa, Yasutaka; Yasumoto, Seiji; and Yamazaki, Shunpei 12317544 Cl. H10D 30/6755.
Nakura, Kensuke: See--
Tsujita, Takuji; Nishitani, Yu; Nakura, Kensuke; Tsuruoka, Tohru; Terabe, Kazuya; and Su, Jin 12315877 Cl. H01M 10/0562.
Nalbant, Mehmet K.; Safaee, Alireza; Sjoeroos, Jukka-pekka J.; AbuKhalaf, Zaid A.; Pastrana, Juan Carlos; and Kosut, Alexei E., to Apple Inc. Enhanced wireless power transfer 12316141 Cl. H02J 50/80.
Nallamothu, Pavan: See--
Hu, Yamu; Sahoo, Naren K; Nallamothu, Pavan; Fang, Deyou; McClure, David; and Garbarino, Marco 12313408 Cl. G01C 19/5726.
Nallapa, Venkatapathi Raju: See--
Micks, Ashley Elizabeth; Nallapa, Venkatapathi Raju; Nariyambut Murali, Vidya; and Myers, Scott Vincent 12314057 Cl. G05D 1/0257.
Nalluri, Srikanth: See--
Singh, Ram Sharan; Nalluri, Srikanth; and Kulkarni, Dattatraya 12314431 Cl. G06F 21/6245.
Singh, Ram Sharan; Nalluri, Srikanth; and Kulkarni, Dattatraya 12314432 Cl. G06F 21/6245.
Nam, Hui: See--
Bae, Min Seok; You, Bong Hyun; and Nam, Hui 12315454 Cl. G09G 3/3258.
Nam, Hyeunsik; Kim, Daewoong; and Kim, Bongjin, to LG ELECTRONICS INC. Vacuum adiabatic body and refrigerator 12313329 Cl. F25D 21/14.
Nam, Jung Hak: See--
Park, Nae Ri; Nam, Jung Hak; and Jang, Hyeong Moon 12316849 Cl. H04N 19/132.
Nam, Junghak: See--
Jang, Hyeongmoon; Nam, Junghak; Lim, Jaehyun; and Heo, Jin 12316836 Cl. H04N 19/11.
Nam, Kyung Ah: See--
Kim, Wan Jung; Yun, Dae Sang; Nam, Kyung Ah; Mun, Hyo Young; Park, Yong Seung; Um, Yi Seul; Lee, So Young; and Lee, Young Hoon 12315437 Cl. G09G 3/3208.
Nam, Seok Hyun: See--
Jang, Dae Hwan; Nam, Seok Hyun; and Cho, Jin Ho 12317645 Cl. H10H 20/831.
Nam, Seungwoo: See--
Moon, Seokil; Yoo, Dongheon; Nam, Seungwoo; Lee, Byoungho; Lee, Changkun; and Lee, Hongseok 12314008 Cl. G03H 1/0866.
Nam, Wooseok: See--
Fan, Zhifei; Sun, Jing; Zhang, Xiaoxia; Luo, Tao; Yerramalli, Srinivas; Chendamarai Kannan, Arumugam; Nam, Wooseok; Park, Sungwoo; Zewail, Ahmed Abdelaziz Ibrahim Abdelaziz; and Reddy, Akula Aneesh 12317274 Cl. H04W 72/23.
Marzban, Mohamed Fouad Ahmed; Nam, Wooseok; Luo, Tao; and Yoo, Taesang 12317301 Cl. H04W 72/54.
Yuan, Fang; Khoshnevisan, Mostafa; Nam, Wooseok; Luo, Tao; Zhang, Xiaoxia; and Sun, Jing 12316406 Cl. H04B 7/0404.
Nam, Wooseok; and Luo, Tao Reference signal resource indication 12316416 Cl. H04B 7/0626.
Nam, Young Woo: See--
Zhang, Miao; Parang, Keykavous; Ibrahim, Naglaa; Nam, Young Woo; Bezprozvanny, Ilya; and Cui, Meng 12312333 Cl. C07D 403/04.
Nam, Youngmin: See--
Choi, Hyeonho; Hwang, Kyuyoung; Kwak, Seungyeon; Nam, Youngmin; Lee, Kum Hee; Jeon, Aram; Choi, Whail; Kim, Kyungdoc; Yoo, Jiho; and Choi, Younsuk 12312364 Cl. C07F 15/0033.
Namadevan, Arvind: See--
Ganiger, Ravindra Shankar; Nath, Hiranya; Woodrow, Thomas D.; Schimmels, Scott Alan; Namadevan, Arvind; Raju, Mohan; Adhiachari, Subramani; Bilaiya, Prasant; and Kumar, Rajesh 12311330 Cl. B01J 19/0026.
Nambi, Prasanna: See--
Divekar, Noopur; Yang, Tao; Mustufa, Heba; McLaughlin, Bryan; White, Paul; Sutarwala, Quresh; and Nambi, Prasanna 12311780 Cl. B60L 3/0046.
Nambiar, Manoj: See--
Shah, Dhaval; Dey, Sounak; Kumar, Meripe Ajay; Nambiar, Manoj; and Pal, Arpan 12314845 Cl. G06N 3/065.
Nambu, Kyojiro: See--
Sakaguchi, Takuya; Nambu, Kyojiro; and Takemoto, Hisato 12310771 Cl. A61B 6/12.
NAMDHARI USAGRISEEDS, INC.: See--
Randhawa, Lakhwinder; Alvarado, Mario Velasco; and Mayorquin, Higinio 12310325 Cl. A01H 6/825.
Namikoshi, Shohei: See--
Yoshida, Yoshinobu; Yoda, Toshiyuki; Nakamura, Kiyoshi; Namikoshi, Shohei; Ota, Takuya; and Hanawa, Keita 12311655 Cl. B41J 11/00218.
NAMILUNT: See--
Lee, Jun Hee; and Lee, Rae Jung 12310529 Cl. A47J 36/06.
Namishia, Dan; Flowers, Mitch; Woo, Eng Wah; and Cohen, Erwin, to Wolfspeed, Inc. Limiting failures caused by dendrite growth on semiconductor chips 12315836 Cl. H01L 24/32.
Nammi Therapeutics, Inc.: See--
Stover, David; Bharali, Dhruba; Hay, Bruce A; and Safaie, Tahmineh 12311010 Cl. A61K 38/177.
Nan, Yang: See--
Ding, Yimiao; Nan, Yang; Qin, Xuefei; and Wang, Lihua 12315856 Cl. H01L 25/167.
NANALYSIS CORP.: See--
Leskowitz, Garett M. 12313713 Cl. G01R 33/4616.
Nanchang Hangkong University: See--
Zhang, Congxuan; Zhang, Shijie; Jiang, Leqi; Ge, Liyue; Wang, Zige; Chen, Zhen; Wu, Chengzhong; and Wang, Yaonan 12315232 Cl. G06V 10/774.
Nandagopalan, Saishankar: See--
Simileysky, Victor; Uln, Kiran; and Nandagopalan, Saishankar 12317131 Cl. H04W 28/065.
Nandakumar, Mahalingam; and Pan, Yanbiao, to TEXAS INSTRUMENTS INCORPORATED Semiconductor device with low noise transistor and low temperature coefficient resistor 12317583 Cl. H10D 84/811.
Nandan, Manu: See--
Molony, Robert; Brautbar, Michael; Nandan, Manu; and O'Brien, Ciaran 12316667 Cl. H04L 63/1433.
Nandanwar, Darshan Kumar; Desai, Kartik Gunvantbhai; and Mv, Raghava Rao, to QUALCOMM Incorporated Predictive runtime thermal management systems and methods 12314099 Cl. G06F 1/206.
Nandanwar, Rahul Pramod: See--
Ramanjani, Rajiv; Katheria, Yogendra; Sharma, Harsh; Nandanwar, Rahul Pramod; Pothukuchi, Bhanu Sirisha; Raut, Rohit V.; and Kapoor, Milin 12314960 Cl. G06Q 20/42.
Nandyala, Hussaina Begum: See--
Jindal, Gaurav; Nandyala, Hussaina Begum; and Puvvada, Bhargav 12316478 Cl. H04L 12/4641.
Nangeroni, Paul; Bellers, Erwin Ben; Curtis, Robert Caston; and Ozgen, Mustafa, to Roku, Inc. Content classifiers for automatic picture and sound modes 12316921 Cl. H04N 21/4852.
Nanhu Laboratory: See--
Zhang, Lei; Li, Zehao; Liao, Jiachun; and Yu, Jinhao 12316741 Cl. H04L 9/0618.
Zhang, Lei; and Yan, Zhichao 12314419 Cl. G06F 21/6218.
Nani, Roger: See--
Rothberg, Jonathan M.; Lackey, Jeremy; Nani, Roger; and Dodd, David 12312377 Cl. C07H 21/04.
Nanjing Chervon Industry Co., Ltd.: See--
Feng, Jifeng; Fan, Xiancheng; and Guo, Zengbing 12316261 Cl. H02P 27/085.
Fu, Xiangqing; Yang, Junyong; Li, Cong; Chen, Liang; Ye, Junjie; Lv, Fangya; and Wu, Shuming 12311454 Cl. B23D 47/12.
Lu, Wei; and Zuo, Changwei 12311518 Cl. B25D 16/006.
Xu, Yanqing; Yang, Dezhong; and Wang, Hongwei 12316250 Cl. H02P 21/22.
NANJING CROSS ENVIRONMENTAL TECHNOLOGY CO., LTD.: See--
Wu, Jun; Chen, Yifan; Pan, Zhouzhi; Lv, Yilian; Ma, Haitao; Zhu, Junwei; Yang, Zhili; Li, Pinghai; and Xue, Wangfeng 12312160 Cl. B65D 88/744.
Nanjing Leapsonics Technology Co., Ltd.: See--
Guo, Wenyu; An, Jian; Dong, Feihong; Huang, Shuo; and Zhang, Jue 12310792 Cl. A61B 8/481.
NANJING NORMAL UNIVERSITY: See--
Yu, Zhaoyuan; Hu, Xu; Yan, Zhenjun; Yuan, Linwang; and Zhang, Jiyi 12314817 Cl. G06N 10/60.
NANJING TECH UNIVERSITY: See--
Luo, Jianing 12314639 Cl. G06F 30/20.
Xu, Zhi; and Huang, Kang 12315967 Cl. H01M 8/0239.
NANJING UNIVERSITY: See--
Wu, Jun; Chen, Yifan; Pan, Zhouzhi; Lv, Yilian; Ma, Haitao; Zhu, Junwei; Yang, Zhili; Li, Pinghai; and Xue, Wangfeng 12312160 Cl. B65D 88/744.
Nanjing University of Aeronautics and Astronautics: See--
Guo, Xunzhong; Tao, Jie; Cheng, Cheng; Liu, Chunmei; Wang, Hui; and Wei, Wenbin 12311424 Cl. B21D 11/02.
Wang, Jun; Zhang, Yuan; Li, Hu; and Li, Zikuan 12315098 Cl. G06T 19/20.
Nanjing University of Posts and Telecommunications: See--
Zou, Yulong; Fang, Zimu; Lin, Zhixian; and Chu, Zhongmiao 12316444 Cl. H04J 3/0667.
Nankai University: See--
Zhu, Shoufei; Liu, Huawei; Sun, Wei; Li, Wentao; Dang, Ling; Huang, Mingyao; and Zhang, Xinyu 12312373 Cl. C07F 9/5018.
Nano Dimension Technologies, Ltd.: See--
David, Eli 12314864 Cl. G06N 3/086.
Nant Holdings IP, LLC: See--
Soon-Shiong, Patrick 12310392 Cl. A23L 33/16.
NantCell, Inc.: See--
Niazi, Kayvan 12311018 Cl. A61K 39/001102.
NANYA TECHNOLOGY CORPORATION: See--
Chiu, Hsih-Yang 12315578 Cl. G11C 17/16.
Chiu, Hsih-Yang 12317579 Cl. H10D 84/038.
Huang, Tse-Yao 12315808 Cl. H01L 23/53238.
Liao, Chun-Cheng 12315793 Cl. H01L 23/5226.
Lin, Li-Han; Wang, Jr-Chiuan; and Hou, Szu-Yu 12315734 Cl. H01L 21/31111.
Lin, Yu-Ting 12317482 Cl. H10B 12/34.
Shih, Shing-Yih 12315774 Cl. H01L 23/3142.
Shih, Shing-Yih 12315796 Cl. H01L 23/5226.
Su, Kuo-Hui 12315725 Cl. H01L 21/0273.
Tsai, Jhen-Yu 12317571 Cl. H10D 64/513.
Tsai, Tzu-Ching 12314032 Cl. G05B 19/4099.
Wang, Kuo-Chiang 12315556 Cl. G11C 11/4093.
Yang, Wu-Der 12315789 Cl. H01L 23/49833.
Nanyang Technological University: See--
Salfity, Jonathan Munir; Allen, William J.; Nguyen Dinh, Huy; Adrian, Nicholas; Lim, Joyce Xin Yan; and Pham, Quang-Cuong 12311605 Cl. B29C 64/386.
Tan, Wei Ming Matthew; Thangavel, Gurunathan; and Lee, Pooi See 12317750 Cl. H10N 30/206.
Naoi, Katsuo: See--
Ichi, Masao; Suzuki, Shingo; Mitsunaga, Takuma; Naoi, Katsuo; and Uto, Hisakazu 12314022 Cl. G05B 19/042.
Napoli, Daniel Raymond; to Jasci LLC Systems and methods for autonomous labor intelligent dynamic assignment 12314877 Cl. G06Q 10/06311.
Narasaiah, Mohan: See--
Padmanabhan, Ashok Kumar; Narasaiah, Mohan; Ghosh Chowdhury, Sumandra; and Bammanni, Rajeev 12316051 Cl. H01R 13/7036.
Narayana Gowda, Shivasharan; to Dell Products L.P. Method and apparatus for snapshot management 12314535 Cl. G06F 3/0482.
Narayanan, Praveen Kumar: See--
Hoel, Robin O.; Narayanan, Praveen Kumar; and Shankar, Ruchi 12315586 Cl. G11C 29/883.
Narayanan, Sriram Nochur; Moslemi, Ramin; and Roh, Junha, to NEC Corporation Robotic navigation and transport of objects 12311555 Cl. B25J 9/1666.
Narayanan, Sriram Nochur; Moslemi, Ramin; Pittaluga, Francesco; Liu, Buyu; and Chandraker, Manmohan, to NEC Corporation Divide-and-conquer for lane-aware diverse trajectory prediction 12311925 Cl. B60W 30/0956.
Nardo, Lorenzo: See--
Mazzarolo, Giovanni; and Nardo, Lorenzo 12310432 Cl. A41D 13/018.
Narisawa, Fumio: See--
Rathour, Swarn Singh; Ishigooka, Tasuku; Sakamoto, Hideyuki; Fukuda, Takeshi; and Narisawa, Fumio 12311963 Cl. B60W 50/029.
Nariyambut Murali, Vidya: See--
Micks, Ashley Elizabeth; Nallapa, Venkatapathi Raju; Nariyambut Murali, Vidya; and Myers, Scott Vincent 12314057 Cl. G05D 1/0257.
Narkis, Lior: See--
Yefet, Gal; Marcovitch, Daniel; Moyal, Roee; Shahar, Ariel; Bloch, Gil; and Narkis, Lior 12316555 Cl. H04L 49/9005.
Narla, Sandeep; to Unirac, Inc. Load control architecture of an energy control system 12316125 Cl. H02J 3/381.
Narra, Shiva Krishna: See--
Sambhwani, Sharad; Nickisch, Dirk; Shanbhag, Madhukar K; Nabar, Rohit U; Balasubramanian, Sanjeevi; Narra, Shiva Krishna; Subramanian, Sriram; Tabet, Tarik; Kamala Govindaraju, Vishwanth; Sun, Yakun; and Subrahmanya, Parvathanathan 12317294 Cl. H04W 72/30.
Narula, Prasant: See--
Abutabl, Ahmed; and Narula, Prasant 12316802 Cl. H04M 1/72421.
Narumi, Tomohiro: See--
Furusako, Shoji; Satoh, Tsutomu; Narumi, Tomohiro; and Sato, Shingo 12312574 Cl. C12M 25/10.
Naruse, Junichi: See--
Awano, Naomi; Naruse, Junichi; and Suzuki, Hironari 12316163 Cl. H02K 1/148.
Narvasa, Sean: See--
Beaver, III, Robert I.; Beaver, Jeffrey J.; Harvill, Leslie Young; and Narvasa, Sean 12314992 Cl. G06Q 30/0621.
Nasdaq, Inc.: See--
Franklin, Andrew 12314822 Cl. G06N 20/00.
Thangeswaran, Sivakumaresan 12316710 Cl. H04L 67/34.
Naser, Karam: See--
Leleannec, Fabrice; Naser, Karam; Poirier, Tangi; and Galpin, Franck 12316874 Cl. H04N 19/625.
Naseri Ali Abadi, Mehdi: See--
Kovacic, Stephen Joseph; Arfaei Malekzadeh, Foad; Naseri Ali Abadi, Mehdi; Abdulhadi, Abdulhadi Ebrahim; and Jain, Sanjeev 12316411 Cl. H04B 7/0479.
Nasgowitz, Zachary Mario: See--
Driver, Thomas John Killian; and Nasgowitz, Zachary Mario 12317086 Cl. H04W 12/47.
Nash, Brent Ryan: See--
Lance, Kenton; Nash, Brent Ryan; Rowen, Matthew; and Morgan, William 12314420 Cl. G06F 21/6227.
Nash, Fred: See--
Nash, Gina; and Nash, Fred 12310331 Cl. A01K 15/025.
Nash, Gina; and Nash, Fred Pet mind toy 12310331 Cl. A01K 15/025.
Nash, Sean C.: See--
Iglesias, Ramon Jose; Mishelevich, David J.; Nash, Sean C.; Schaefer, Kaitlin B.; Lokre, Jahnavi; Trcka, Milan V.; Patel, Himanshu; Zwierstra, Jan B.; Dunlop, Trevor; and Gifford, Aaron 12311228 Cl. A63B 23/20.
Nash, Summer L: See--
Caldona, Eugene B.; Wipf, David O.; Smith, Dennis W.; and Nash, Summer L 12313617 Cl. G01N 33/1833.
Näslund, Erik: See--
Calleja, Clint; Holloway, Jacob; Camilleri, Luke; Mifsud, Stephanie; Näslund, Erik; Asimoglou, Katerina; Assabri, Abdulrahman; Mortka, Adam; and Berliner, David 12314538 Cl. G06F 3/0483.
Näslund, Sebastian; Grancharov, Volodya; and Svedberg, Jonas, to TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) Frame error concealment 12315519 Cl. G10L 19/005.
Nasr Azadani, Ehsan; Kumbhare, Alok Gautam; Monroe, Mark Alan; Morales, Osvaldo P.; Belady, Christian L.; Woolcock, Kyle; Bianchini, Ricardo Gouvêa; Saunders, Winston Allen; Kunnath, Lalu Vannankandy; Assis, Rodrigo Lemos de; Warrier, Brijesh; Fontoura, Marcus Felipe; Abbott, Sean Patrick; Gauthier, David Thomas; Raniwala, Ashish; Mahalingam, Nithish; Janous, Brian Addams; and Quinby, V, Upshur Bagwell, to Microsoft Technology Licensing, LLC Allocating power between overhead, backup, and computing power services 12314102 Cl. G06F 1/26.
Nasr, Nader: See--
Smith, Chad; Nasr, Nader; Harsh, Rachell; Bolton, Mike J.; Zeitler, Bradon; Crabtree, Ryan; and Braun, Eric E. 12311754 Cl. B60K 17/02.
Nasseri, Reza: See--
Attar, Ramtin; Nasseri, Reza; Khalili, Alireza; Brix, Darren; Pechlivanoglou, Tilemachos; Mobasser, Farid; Yu, Haitao; and Johnston, Robert George Kenneth 12311549 Cl. B25J 9/1661.
Nasum, Sreeram Subramanyam; and Barot, Kashyap, to Texas Instruments Incorporated Spread spectrum modulation technique for isolation devices 12315979 Cl. H01P 1/36.
Natanzon, Igor: See--
Muir, Michael; Natanzon, Igor; and Yadav, Anirudh 12314938 Cl. G06Q 20/3678.
Nataraja, Pramod: See--
Prabhakar, Raghu; Sivaramakrishnan, Ram; Jackson, David Brian; and Nataraja, Pramod 12314754 Cl. G06F 9/485.
Natarajan, Amarnath; to BOARD OF REGENTS OF THE UNIVERSITY OF NEBRASKA Quinoxaline compounds and uses thereof 12312334 Cl. C07D 403/04.
Nate, Satoru: See--
Yamamoto, Natsuki; and Nate, Satoru 12316329 Cl. H03K 5/1536.
Nath, Hiranya: See--
Ganiger, Ravindra Shankar; Nath, Hiranya; Benjamin, Michael A.; Brown, Daniel D.; Pal, Sibtosh; and Zelina, Joseph 12313264 Cl. F23R 3/60.
Ganiger, Ravindra Shankar; Nath, Hiranya; Woodrow, Thomas D.; Schimmels, Scott Alan; Namadevan, Arvind; Raju, Mohan; Adhiachari, Subramani; Bilaiya, Prasant; and Kumar, Rajesh 12311330 Cl. B01J 19/0026.
Nathan, Jordan; Recor, Bret; Andrejcic, Christoph; Ahn, Sehee; Young, Kenneth; and Gross, Benjamin, to Caraway Home, Inc. Modular culinary implement storage system 12310519 Cl. A47G 21/14.
Nathan, Paul Ashley: See--
Zhang, Wenshui; Chang, Chee Teong; and Nathan, Paul Ashley 12313673 Cl. G01R 31/2862.
Nathan, Robert; to Alfred Kärcher SE & Co. KG Piston pump for a high pressure cleaning device 12313047 Cl. F04B 1/0452.
Nathan, Sendhil: See--
Oliveira, Ivan Borges; Kazemi Tutunchi, Golbarg; Spaen, Quico Pepjin; Jacobs, Timothy Lee; Naik, Vighnesh; Singh, Akhand Pratap; Rangaswamy, Suresh; Nathan, Sendhil; Ward, Ian; Kumar, Manik; and Patsakis, Georgios 12316528 Cl. H04L 45/125.
Nathella, Krishnendra: See--
Prasad, Divya Madapusi Srinivas; Nathella, Krishnendra; and Pietromonaco, David Victor 12315545 Cl. G11C 11/40607.
National Autonomous University of Mexico: See--
Romero-Ortega, Mario I.; Martinez-Gomez, Margarita; Cogan, Stuart F.; and Kanneganti, Aswini 12311164 Cl. A61N 1/0556.
NATIONAL CANCER CENTER: See--
Sakai, Akira; Komatsu, Masaaki; and Shozu, Kanto 12315151 Cl. G06T 7/0012.
National center for nanoscience and technology: See--
Xu, Jianxun; Zhao, Yuliang; and Ge, Yifei 12313653 Cl. G01R 1/0675.
National Center of Inspection and Testing on Electric Light Source Quality (Shanghai): See--
Yang, Wei; Yu, Zaidao; Jiang, Lili; Yang, Yue; and Chen, Chaozhong 12312520 Cl. C09K 11/025.
National Health Research Institutes: See--
Tseng, Yufeng Jane; Liu, Yu-Li; Sun, Chung-Ming; Lai, Wen-Sung; Liu, Chih-Min; and Hwu, Hai-Gwo 12312326 Cl. C07D 401/12.
NATIONAL INSTITUTE FOR MATERIALS SCIENCE: See--
Nakamura, Akiko; Murase, Yoshiharu; Nishikawa, Hideaki; Yakabe, Taro; and Miyauchi, Naoya 12315696 Cl. H01J 37/20.
Tsujita, Takuji; Nishitani, Yu; Nakura, Kensuke; Tsuruoka, Tohru; Terabe, Kazuya; and Su, Jin 12315877 Cl. H01M 10/0562.
National Institute of Advanced Industrial Science and Technology: See--
Hasegawa, Masataka 12315778 Cl. H01L 23/373.
Hatano, Michio; Nakamura, Mitsuhiro; and Ogura, Toshihiko 12315695 Cl. H01J 37/20.
NATIONAL INSTITUTE OF PLANT GENOME RESEARCH: See--
Kapuganti, Jagadis Gupta; Bulle, Mallesham; and Kumari, Aprajita 12310380 Cl. A23B 7/152.
National Nanfan Research Institute (Sanya), Chinese Academy of Agricultural Sciences: See--
Li, Huihui; Feng, Yingwei; and Zhang, Hao 12315600 Cl. G16B 40/00.
NATIONAL RESEARCH COUNCIL OF CANADA: See--
Carlson, Brent 12316332 Cl. H03L 7/093.
NATIONAL TAIWAN NORMAL UNIVERSITY: See--
Lu, Chia-Jung; and Jian, Rih-Sheng 12313557 Cl. G01N 21/78.
NATIONAL TAIWAN UNIVERISTY: See--
Wang, Yu-Kuang; Wu, Ruey-Beei; Chen, Ching-Sheng; Huang, Chun-Jui; Liao, Wei-Yu; and Chang, Chi-Min 12315981 Cl. H01P 3/088.
National Taiwan University: See--
Luo, Zong-You; Tsou, Ya-Jui; Liu, Chee-Wee; Lin, Shao-Yu; Chung, Liang-Chor; and Wang, Chih-Lin 12315541 Cl. G11C 11/161.
Tseng, Yufeng Jane; Liu, Yu-Li; Sun, Chung-Ming; Lai, Wen-Sung; Liu, Chih-Min; and Hwu, Hai-Gwo 12312326 Cl. C07D 401/12.
National Taiwan University of Science and Technology: See--
Guo, Jing-Ming; Yang, Jr-Sheng; and Wu, Hung-Wei 12315224 Cl. G06V 10/766.
National Tsing Hua University: See--
Cheng, Li-Wei; Chen, Zhi-Yong; and Chang, Jen-Yuan 12311227 Cl. A63B 23/14.
Yang, Shang-Da; Lu, Chih-Hsuan; and Chen, Bo-Han 12313551 Cl. G01N 21/65.
National University Corporation Hokkaido University: See--
Kadoya, Ken; Suzuki, Yuki; Sotome, Akihito; Maenaka, Katsumi; and Otsuguro, Satoko 12310941 Cl. A61K 31/29.
Kitagawa, Yuichi; Kumagai, Marina; Hasegawa, Yasuchika; Nakanishi, Takayuki; and Fushimi, Koji 12312369 Cl. C07F 5/003.
NATIONAL UNIVERSITY CORPORATION UNIVERSITY OF TOYAMA: See--
Niimi, Hideki; Kitajima, Isao; Miyakoshi, Akio; and Higashi, Yoshitsugu 12312643 Cl. C12Q 1/689.
National University Corporation YOKOHAMA National University: See--
Fukuda, Junji; and Kageyama, Tatsuto 12312581 Cl. C12N 11/098.
National University of Singapore: See--
Yoo, Jerald; Li, Jiamin; Dong, Yilong; and Park, Jeong Hoan 12316388 Cl. H04B 13/005.
National Yang Ming Chiao Tung University: See--
Tseng, Yufeng Jane; Liu, Yu-Li; Sun, Chung-Ming; Lai, Wen-Sung; Liu, Chih-Min; and Hwu, Hai-Gwo 12312326 Cl. C07D 401/12.
Natkaniec, Christoph: See--
Weniger, Stephan; Dick, Viktor; Reif, Zdenek; Guthörle, Manfred; Brinkert, Nils; Weeber, Jürgen; and Natkaniec, Christoph 12312994 Cl. F02B 37/025.
Nattermann, Kurt: See--
Ortner, Andreas; Kunisch, Clemens; Lentes, Frank-Thomas; Thomas, Jens Ulrich; Nattermann, Kurt; and Kluge, Michael 12311469 Cl. B23K 26/359.
Nattinger, Elena J.; Burgner, Peter; Brewer, Anna L.; and Chalmers, Devin W., to APPLE INC. Capturing and storing an image of a physical environment 12315034 Cl. G06T 1/60.
Natu, Mahesh: See--
Yao, Jiewen; Harriman, David; Ruan, Xiaoyu; and Natu, Mahesh 12314397 Cl. G06F 21/572.
NAUE GMBH & CO. KG: See--
Ehrenberg, Henning; Vollmert, Lars; Hoyme, Helge; Vissing, Norbert; and Tazl, Martin 12311649 Cl. B32B 5/14.
Naughton, David: See--
Houlihan, Lena Mary; Naughton, David; and Preul, Mark 12315616 Cl. G16H 20/40.
Naujok, Jeffrey Robert; to Prove Identity, Inc. Device authentication via high-entropy token 12316626 Cl. H04L 63/0838.
Nauma, Mauri: See--
Kvarnström, Carita; Damlin, Pia; Salomäki, Mikko; Nauma, Mauri; and Yewale, Rahul Balu 12312492 Cl. C09D 181/02.
Nauta, Tore: See--
Sakariya, Kapil V.; Nauta, Tore; Bae, Hopil; Jen, Henry C.; Pedder, James E.; Kang, Sunggu; Hatanaka, Shingo; Lu, Xiang; Baroughi, Mahdi Farrokh; Akyol, Hasan; Choudhary, Saif; and Bita, Ion 12315418 Cl. G09G 3/2088.
Nautical Structures Industries, Inc.: See--
Bolline, Robert; Danforth, Scott; Freeburg, Matthew; Milford, Scott; Sciarrotta, Art; Gioiosa, Steven; Krawczyk, Mike; Stephens, Keith; McCormick, Nat; and Capuco, Benedict 12312047 Cl. B63B 27/146.
Nautiya, Girish: See--
Madhavan, Rajan; Venkataraman, Madalasa; Nautiya, Girish; and Ghanta, Dinesh 12314433 Cl. G06F 21/6245.
Navarrete, Jorge String tool for replacing strings on instruments and method of using 12315477 Cl. G10D 3/12.
Naveca, Felipe Gomes; Do Nascimento, Valdinete Alves; De Souza, Victor Costa; Monteiro, Dana Cristina Da Silva; Da Silva, Arlesson Viana; Junior, Carlos Raimundo Pereira Dos Santos; Moura, Thiago Daniel De O.; and Cardoso, Valtemar Fernandes, to FUNDAÇÃO OSWALDO CRUZ LAMP assay device 12313555 Cl. G01N 21/78.
Naveen, Akhila: See--
Rolando, Pierluigi; Manuguri, Subramanyam; Koganty, Raju; Zhang, Yuxiao; Naveen, Akhila; Kancherla, Mani Prasad; Ramaswamy, Srinivas; Chathu, Jayakrishnan; Bandi, Krishna Chaitanya; and Zheng, Hui 12316538 Cl. H04L 45/586.
Naveh, Ariel: See--
Bomzon, Zeev; Naveh, Ariel; and Yesharim, Ofir 12311167 Cl. A61N 1/36002.
Naveira Bukahi, Lilia: See--
Pitchon Sampaio, Tatiana; Naveira Bukahi, Lilia; Moreira Da Silva, Fernando Antonio; Almeida Gomes, Marcelo; Braga Gusmao, Patricia; Ferreira Da Silva, Mario Germino; Caldeira Dias, Bernardo; Fernandes Telles, Leandro; Marcos Cristante, Valtair; Gomes Calil, Geraldo Marcel; De Oliveira Vale, Pedro Andre Nogueria Souza; Cavalcante Freitas, Tiago; Monteiro Pimentel, Daniel; and Da Costa Ribeiro, Thiago 12312915 Cl. E21B 37/06.
NAVER CORPORATION: See--
Jung, Namkyu; Kim, Geonmin; Kwon, Youngki; Heo, Hee Soo; Lee, Bong-Jin; and Lee, Chan Kyu 12315517 Cl. G10L 17/14.
Perez, Julien; and Grail, Quentin 12314847 Cl. G06N 3/08.
Nawaz, Muhammad: See--
Alves, Roberto; Bakas, Panagiotis; Svensson, Jan; Nawaz, Muhammad; Mousavi, Seyed Ali; Johannesson, Daniel; and Steimer, Peter 12316235 Cl. H02M 5/12.
Nawfal, Ismael H.: See--
Boothe, Daniel K.; Johnson, Martin E.; Nawfal, Ismael H.; Valentine, Timothy J.; Nevill, Stuart M.; and Feng, Chanjuan 12317028 Cl. H04R 1/26.
Nayyar, Amit: See--
Ndubaku, Chudi; Moore, Jared Thomas; Gibbons, Paul Anthony; Chang, Jae Hyuk; Romero, F. Anthony; Du, Xiaohui; Kawai, Hiroyuki; Ciblat, Stephane; Wang, Hong; Albert, Vincent; Constantineau-Forget, Lea; Silva, Hugo de Almeida; Polat, Dilan Emine; Nayyar, Amit; Shore, Daniel Gordon Michael; Wu, Kejia; and Tan, Joanne 12312339 Cl. C07D 403/14.
Nayyar, Anish; to Juniper Networks, Inc. Apparatus, system, and method for optimizing storage usage in connection with segment identifiers 12316531 Cl. H04L 45/24.
Nazar, Faizan: See--
Gaulter, Simon; Ferrere, Thomas; Nazar, Faizan; and Elliott, Sam 12314645 Cl. G06F 30/33.
Nazarov, Sergey: See--
Golikov, Michael; Sabur, Zaheed; Burakov, Denis; Behzadi, Behshad; Nazarov, Sergey; Cotting, Daniel; Bertschler, Mario; Mirelmann, Lucas; Cheng, Steve; Vlasyuk, Bohdan; Lee, Jonathan; Terrenghi, Lucia; and Zumbrunnen, Adrian 12315508 Cl. G10L 15/22.
Nazeeruddin, Mohammad Khaja: See--
Getautis, Vytautas; Rakstys, Kasparas; Daskeviciene, Maryte; Daskeviciute-Geguziene, Sarune; Zhang, Yi; and Nazeeruddin, Mohammad Khaja 12317741 Cl. H10K 85/636.
Nazeri, Arash: See--
Chen, Hong; Nazeri, Arash; Pacia, Christopher; and Leuthardt, Eric 12310697 Cl. A61B 5/0042.
NCHAIN LICENSING AG: See--
Chan, Ying 12316771 Cl. H04L 9/3239.
Covaci, Alexandra; Motylinski, Patrick; Madeo, Simone; Vincent, Stephane; and Wright, Craig Steven 12314716 Cl. G06F 9/3001.
Wright, Craig Steven; and Savanah, Stephane 12314379 Cl. G06F 21/52.
Wright, Craig Steven; and Savanah, Stephane 12316740 Cl. H04L 9/0618.
NCR Voyix Corporation: See--
Apps, Shelby Frances; Adams, Gregory Keith; Lee, Kwan Woo; and Paton, Grant Charles 12314950 Cl. G06Q 20/4014.
Eddu, Praneeth Erwin Luck; and Reusche, Andrew Michael 12314945 Cl. G06Q 20/401.
Ndubaku, Chudi; Moore, Jared Thomas; Gibbons, Paul Anthony; Chang, Jae Hyuk; Romero, F. Anthony; Du, Xiaohui; Kawai, Hiroyuki; Ciblat, Stephane; Wang, Hong; Albert, Vincent; Constantineau-Forget, Lea; Silva, Hugo de Almeida; Polat, Dilan Emine; Nayyar, Amit; Shore, Daniel Gordon Michael; Wu, Kejia; and Tan, Joanne, to ORIC PHARMACEUTICALS, INC. Polo like kinase 4 inhibitors 12312339 Cl. C07D 403/14.
Neal, William Andrew: See--
Ahlgren, Stephen Gilbert; Neal, William Andrew; and Auld, Chad Robert 12314769 Cl. G06F 9/505.
Neale, Paul V.: See--
Bohm, Sebastian; Dervaes, Mark; Johnson, Eric; Kamath, Apurv Ullas; Larvenz, Shawn; Leach, Jacob S.; Lieu, Phong; Mahalingam, Aarthi; Miller, Tom; Neale, Paul V.; Pryor, Jack; Peyser, Thomas A.; Rong, Daiting; San Vicente, Kenneth; Shariati, Mohammad Ali; Simpson, Peter C.; and Wightlin, Matthew 12310723 Cl. A61B 5/14532.
Nebl, Mario: See--
Kishore, Abhinav; Nebl, Mario; Katahanas, Jonathan George; Johnson, Natalie Kate; Alant, Cornelis Jacobus; and Clarke, Damien 12314543 Cl. G06F 3/0484.
NEC CORPORATION: See--
Ashino, Yuki; Hitani, Takashi; and Yakumaru, Miyu 12316525 Cl. H04L 45/02.
Dong, Tingting; Liu, Jianquan; Sugidomari, Daisuke; Shimada, Taisuke; and Takahashi, Yusuke 12314310 Cl. G06F 16/538.
Furukawa, Azusa; Arai, Kan; Shibuya, Kei; Hashimoto, Hiroshi; Hanazawa, Ken; and Akiguchi, Makiko 12314967 Cl. G06Q 30/0201.
Gao, Yukai; and Wang, Gang 12316563 Cl. H04L 5/005.
Ijaz, Ayesha; and Sasaki, Takahiro 12316459 Cl. H04L 1/1812.
Mizukoshi, Yasuhiro 12314858 Cl. G06N 3/082.
Mizushima, Ryo; Ueda, Hirofumi; and Yagyu, Tomohiko 12314399 Cl. G06F 21/577.
Narayanan, Sriram Nochur; Moslemi, Ramin; Pittaluga, Francesco; Liu, Buyu; and Chandraker, Manmohan 12311925 Cl. B60W 30/0956.
Narayanan, Sriram Nochur; Moslemi, Ramin; and Roh, Junha 12311555 Cl. B25J 9/1666.
Oami, Ryoma 12315260 Cl. G06V 20/52.
Ong, Hui Lam; Peh, Wei Jian; Ong, Hong Yen; and Yamazaki, Satoshi 12315303 Cl. G06V 40/50.
Shiraishi, Soma; Kikuchi, Katsumi; Sato, Takami; and Nabeto, Yu 12314925 Cl. G06Q 20/208.
Takemura, Takeshi 12316373 Cl. H04B 10/07955.
Toyama, Hiroaki 12315290 Cl. G06V 40/1365.
Zhang, Ni; Li, Yan; Liu, Bingrong; and Zhou, Lin 12310674 Cl. A61B 34/20.
NEC Platforms, Ltd.: See--
Ono, Satoko; Kubota, Yasuhiro; and Ohashi, Takeshi 12313212 Cl. F16M 11/10.
Nechushtan, Oded: See--
Falls, Bruce; Kochan, Scott; Nechushtan, Oded; and Adelson, Adam 12315946 Cl. H01M 50/204.
Nedeltchev, Plamen: See--
Song, Yang; Pan, Cheng; Lin, Qingliang; Nedeltchev, Plamen; Lu, Xuanbei; and Ye, Fangyan 12316678 Cl. H04L 63/20.
Nedergaard, Maiken; Plog, Benjamin; and Payne, Humberto Mestre, to University of Rochester Glymphatic delivery by manipulating plasma osmolarity 12311035 Cl. A61K 49/0058.
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO: See--
Dimitrovski, Toni; Norp, Antonius; and Djurica, Miodrag 12317341 Cl. H04W 76/14.
Van Der Heiden, Maurits Sebastiaan; Van Neer, Paul Louis Maria Joseph; Harmsma, Peter Johan; Altmann, Robert Karl; and Piras, Daniele 12313921 Cl. G02F 1/125.
Neeb, Timothy Howard; and Zimmermann, Tristan, to EXCELSIOR INC. Support for cutting a linear product 12311566 Cl. B26D 7/02.
Needleman, Daniel: See--
Aghvami, S. Ali; Sanchez, Tim; Fraden, Seth; Needleman, Daniel; and Pedro, Marta Venturas 12313833 Cl. G02B 21/34.
Neelakantam, Naveen: See--
Karr, Ronald; Neelakantam, Naveen; and Jibaja, Ivan 12314134 Cl. G06F 11/1415.
Neelannavar, Savita: See--
Bhoopali, Laxmi; Muthiah, Ramanathan; and Neelannavar, Savita 12314601 Cl. G06F 3/0655.
Neeman, Noam: See--
Badichi, Meytal; Eilon, Moshik; and Neeman, Noam 12314882 Cl. G06Q 10/0633.
Neemeh, Steven Joseph: See--
Saenz, Adam Joseph; Aguilar, Victor Hugo; Chang, Frank Ji; and Neemeh, Steven Joseph 12311960 Cl. B60W 50/02.
Neeson, Alec: See--
Chen, Zun; Fury, Jonathan J.; and Neeson, Alec 12312479 Cl. C09D 11/106.
Negishi, Shun; to SEIKO EPSON CORPORATION Generation method, computer program, and generation system 12311541 Cl. B25J 9/0081.
Negueruela Imaña, Alberto: See--
De Guzmán Montón, Santiago; Moreu Gamazo, Jaime; Terceño Hernández, Mirian; López Vizcayno, Pedro; García Meroño, Caridad; Delgado Franco, Salvador; Pérez Díaz, Óscar; Taboada Gosálvez, Alberto; Negueruela Imaña, Alberto; González López, Daniel; and Moreu Munaiz, Manuel 12313034 Cl. F03D 13/22.
Nehra, Jagavar: See--
Garai, Debasish; Gautam, Amandeep; Gupta, Apurv; Nehra, Jagavar; and Vairavanathan, Emalayan 12314138 Cl. G06F 11/1451.
Neil, Benjamin Francis: See--
Blackley, Jonathan Seamus; Bahr, Richard; Boyett, Watson Brent; Colin, Sylvain Marcel; Green, Robin James; Guasch, Isaac Serrano; Hart, Stephen John; Hess, Robert Alan; Hsu, Margaret H.; Jutrzenka, Christoph Von; Kim, DeaGyu; Loya, Mark Anthony; MacNeill, Kelly Swan; Neil, Benjamin Francis; Qaderi, Kamran; Qin, Tina; Ramirez, Jesus Manuel Caridad; Sashidharan, Jayakrishna; Sefami, Asher Zelig; Smith, Jeff; Srinivasiah, Robert David; Walavalkar, Sameer Sudhir; Wiensch, Joshua D.; and Williamson, Daniel Dereck 12315403 Cl. G09G 3/003.
Neild, Ian; and Reeves, Andrew, to BRITISH TELECOMMUNICATIONS PUBLIC LIMITED COMPANY Method of operating a wireless telecommunications network 12317173 Cl. H04W 48/10.
Neill, John: See--
Nobbee, Wazir; Thrower, II, Jesse C.; Katsaros, James Dean; Costeux, Stephane; Neill, John; Lieburn, William Brian; and Thomas, Bryn 12312820 Cl. E04F 19/04.
Neilson, Juan Andrés Ramírez: See--
Abeliuk, Eduardo; Manríquez, Andrés Igor Pérez; Neilson, Juan Andrés Ramírez; and Iturra, Diego Francisco Valenzuela 12315599 Cl. G16B 30/00.
Nekarda, Jan: See--
Paschen, Jan Tobias; Nekarda, Jan; and Brand, Andreas 12317607 Cl. H10F 19/904.
Nelogal, Chandrashekar: See--
Bolen, Austin Patrick; and Nelogal, Chandrashekar 12314371 Cl. G06F 21/44.
Nelson, Aaron: See--
Benike, Beth; Coffey, Alex; Gonos, Luke; Nelson, Aaron; and Fynbo, Eric 12310423 Cl. A41B 13/103.
Nelson, Caleb T.: See--
Liu, Tao; Johnson, Nicholas A.; Kenney, Raymond J.; Nelson, Caleb T.; and Schmidt, Daniel J. 12313864 Cl. G02B 5/003.
Nelson, Daniel; and Miner, Donald, to Nielsen Company (US), LLC, The Methods and apparatus to identify media using hybrid hash keys 12316811 Cl. H04N 1/00.
Nelson, Deane: See--
Watson, Bradley E.; and Nelson, Deane 12311884 Cl. B60R 3/02.
Nelson, Doug: See--
Hegde, Pradeep; Cogan, Timothy; Nelson, Doug; and Paterson, Drew 12313779 Cl. G01S 7/4813.
Nelson, Dwayne R.; and Filipour, Cameron A., to IGT System and method for wagering on virtual elements overlaying a sports betting field 12315346 Cl. G07F 17/3288.
Nelson, Dwight E.; Wu, Jianping; Gupta, Rahul; and Zhao, Yan, to Medtronic, Inc. Patient state determination based on one or more spectral characteristics of a bioelectrical brain signal 12310744 Cl. A61B 5/4833.
Nelson, Greg: See--
Patil, Bipin; Sundberg, Sean; McKenna, Kelli; Sundar, Rangaraj; Nelson, Greg; and Bennett, David 12316052 Cl. H01R 24/38.
Nelson, Henry: See--
Muehlfeld, Andrew; Nelson, Henry; Nelson, Ryan; Taipale, Eric; and Witthoeft, Nicholas 12310274 Cl. A01B 79/005.
Nelson, James Mackey: See--
Courtney, Stephen Benjamin; Nelson, James Mackey; and Jennings, Matthew Jerome 12311204 Cl. A62B 18/006.
Nelson, Jared: See--
Qiu, Yongxing; Samuel, Newton T.; Pruitt, John Dallas; Kolluru, Chandana; Medina, Arturo Norberto; Winterton, Lynn Cook; Wu, Daqing; Qian, Xinming; and Nelson, Jared 12311621 Cl. B29D 11/00067.
Nelson, John Logan; Drahman, Chris; Griggs, Eric; Campbell, Kelvin; Spetich, Scott David; and Williams, Corey Richard, to T-H Marine Supplies, LLC Watercraft battery switch system with visual indicator 12311851 Cl. B60R 16/005.
Nelson, Joseph; Shirley, Jerry; and Behrens, Reid, to OSHKOSH CORPORATION Adjustable canopy for a refuse vehicle 12312165 Cl. B65F 3/02.
Nelson, Nathan; to CTL Medical Corporation Spring cage spinal fixation systems 12310632 Cl. A61B 17/7037.
Nelson, Ryan: See--
Muehlfeld, Andrew; Nelson, Henry; Nelson, Ryan; Taipale, Eric; and Witthoeft, Nicholas 12310274 Cl. A01B 79/005.
Nelson, Samuel: See--
Chan, Rony; and Nelson, Samuel 12310300 Cl. A01G 3/0251.
Nelson, Scott; Grubbs, John; and Gong, Stephanie, to Rolls-Royce Corporation Metal matrix composite seal using directed energy deposition 12311439 Cl. B22F 10/25.
NELUMBOINC.: See--
Brockway, Lance R.; and Walther, David C. 12311641 Cl. B32B 18/00.
Nemani, Srinivas D.: See--
Citla, Bhargav S.; Nemani, Srinivas D.; Modi, Purvam; and Yieh, Ellie Y. 12315718 Cl. H01L 21/02274.
Nemeth, Huba; Kokrehel, Csaba; Bardos, Adam; and Toereki, Gabor, to KNORR-BREMSE Systeme fuer Nutzfahrzeuge GmbH Apparatus and a method for providing a redundant communication within a vehicle architecture and a corresponding control architecture 12316475 Cl. H04L 12/40182.
NeoChord, Inc.: See--
Caffes, Levi; Helgerson, Joel; Schifle, Andrew; and Edmiston, Daryl 12310577 Cl. A61B 17/0469.
Nepomniashchy, Alexander: See--
Kopel, Evgeni; Weingarten, Oren P.; Nepomniashchy, Alexander; and Merlet, Nicolas J. 12310677 Cl. A61B 34/20.
Neptune Medical Inc.: See--
Tilson, Alexander Q.; Morris, Stephen J.; Gomes, Garrett J.; Wigginton, Adam S.; Scheeff, Mark C.; and Love, Charles S. 12311122 Cl. A61M 25/005.
Nepveu, Bertrand: See--
Chapdelaine-Couture, Vincent; Nepveu, Bertrand; and Barakat, Samer Samir 12316819 Cl. H04N 13/117.
Nerkar, Manoj: See--
Guo, Hailan; Nerkar, Manoj; Vuong, Sharon M.; and Chorvath, Igor 12312461 Cl. C08L 27/06.
Guo, Hailan; Nerkar, Manoj; Vuong, Sharon M.; and Chorvath, Igor 12312462 Cl. C08L 27/06.
Nerurkar, Alok: See--
Patel, Snahel; Mandegar, Mohammad A.; Ding, Pingyu; Bhatt, Ulhas; Holan, Martin; Lee, John; Li, Yihong; Medina, Julio; Nerurkar, Alok; Seidl, Frederick; Sperandio, David; and Widjaja, Tien 12312345 Cl. C07D 417/14.
Nerurkar, Sharvari: See--
Isayeva, Ganna; Jang, Youjin; Nerurkar, Sharvari; and Vardidze, Archil 12316588 Cl. H04L 51/046.
Ness, Kevin: See--
Hindson, Benjamin; Hindson, Christopher; Schnall-Levin, Michael; Ness, Kevin; Jarosz, Mirna; and Saxonov, Serge 12312640 Cl. C12Q 1/6883.
Nesseth, Gregory N.: See--
Johnson, Kristin M.; Nesseth, Gregory N.; Baxter, Jonathan E.; and Wong, Thomas A. 12311125 Cl. A61M 25/0147.
NESTE OYJ: See--
Lindqvist, Petri; Sippola, Väinö; Aalto, Pekka; Hovi, Meri; Suntio, Ville; and Escobedo, José Luis González 12312542 Cl. C10G 3/50.
NETACEA LIMITED: See--
Greenwood, Mark; Jackson, Matthew; and Modin, John 12316695 Cl. H04L 67/02.
Netanel, Eran: See--
Gotesdyner, Rony; Netanel, Eran; Sharma, Narendra; Johnson, Drew S.; Schaefer, Jr., George Edward L.; and Agarwal, Vivek 12314872 Cl. G06N 5/04.
NetApp, Inc.: See--
Jernigan, IV, Richard Parvin 12314189 Cl. G06F 12/123.
Rathnakara, Kartik; LeCates, Roy Matthew; Bhowmik, Sushrut; and Jernigan, IV, Richard Parvin 12314221 Cl. G06F 16/122.
NETFLIX, INC.: See--
Alvino, Christopher V.; Basilico, Justin; Wu, Chao-Yuan; and Smola, Alexander J. 12314537 Cl. G06F 3/0483.
NETGAMI SYSTEM L.L.C.: See--
Lynn, John; and Lynn, Eric 12316379 Cl. H04B 10/25.
Nethaji, Alagirisamy: See--
Dunberger, Lars Henrik; Nethaji, Alagirisamy; and Wennerström, Johan Daniel 12313279 Cl. F24F 11/77.
Nethongkome, Benjamin; Houng, Derek; and Hozalski, Kreig, to NIKE, INC. Article of footwear including a support flap 12310454 Cl. A43B 23/0245.
Netland, Nicole: See--
Lohan, Ryan John; Porter, Beth Anne; Ebert, Kristiana Helmick; De Almeida, Felipe Gustavo; Van Zeeland, Andrew John; Larsen, Peter; Butin, Kimberly Anne; Khivasara, Trushna Dilip; Netland, Nicole; Rathnavelu, Kadir; and Shaikh, Bilal Nasir 12314890 Cl. G06Q 10/0834.
Neto, Paulo: See--
Oliveira, Fernando Ribeiro de; Neto, Paulo; Ferreira, Daniel Santos; Ikuno, Oscar; Figueiredo, Fabio; Alencar, Yuri Kaluf; and Rodrigues, Rodrigo 12311887 Cl. B60R 7/08.
Netskope, Inc.: See--
Liao, Yihua; Koduri, Niranjan; Daryoush, Emanoel; Bryslawskyj, Jason B.; Zhang, Yi; Azarafrooz, Ari; and Xin, Wayne 12315231 Cl. G06V 10/774.
Pierce, Jr., Stevan W.; Chung, Damian Charles; Butler, Robert Wayne; and Sridhar, Madhura 12316647 Cl. H04L 63/1408.
Nett, Brian E.; to GE Precision Healthcare LLC Region of interest computed tomography imaging using one or more static collimators 12310768 Cl. A61B 6/06.
NETZSCH Pumpen & Systeme GmbH: See--
Sinseder, Dominik; Nübl, Philipp; Weigl, Stefan; Voit, Stefan; Schöberl, Stefan; and Schmitt, Thomas 12313070 Cl. F04C 2/16.
Neu, James C. Sweetener compositions 12310387 Cl. A23L 27/33.
Neubauer, Jöerg: See--
Hild, Alexandra; Neubauer, Jöerg; Schmidt, Steffen; and Baumann, Robert 12312420 Cl. C08B 15/005.
Neubeck, Joel: See--
Saxon, Steve; Neubeck, Joel; Collins, Michael; Weinmann, Dan; and Dorman, William 12315393 Cl. G09B 7/02.
Neudecker, Ansgar; to AUDI AG Energy storage device for electric energy, charging arrangement and method for installing an energy storage device or charging arrangement 12311791 Cl. B60L 53/31.
Neuendorf, Nick: See--
Coskun, Tayfur; Neuendorf, Nick; and Huber, Andreas 12315215 Cl. G06V 10/60.
Neuer, Marcus: See--
Kremeyer, Julian; Mücke, Gert; Neuer, Marcus; and Krambeer, Hagen 12311422 Cl. B21B 38/02.
Neugebauer, Bernhard: See--
Lecomte, Jeremie; Schnabel, Michael; Markovic, Goran; Dietz, Martin; and Neugebauer, Bernhard 12315518 Cl. G10L 19/005.
Neuhaus, Peter; Cobb, Tyson; and Gines, Jeremy, to OxeFit, Inc. Multipurpose exercise bench 12311222 Cl. A63B 21/4029.
Neumann, Felix; Haenisch, Jan; Schneider, Christian; Guerin, Veronique; and Grupp, Johannes, to Purem GmbH Electrical supply line connection unit suitable for harsh high heat environmental conditions 12312986 Cl. F01N 3/2013.
Neumann, Gerald; and Bodensteiner, Christoph, to Kistler Holding AG Screw load testing device and method for performing a load test on a screw 12313486 Cl. G01L 5/24.
Neumann, IV, Kort W.: See--
Klein, Ross; Neumann, IV, Kort W.; and Youngs, Bryan K. 12310446 Cl. A43B 13/127.
Neumann, Kenneth Apparatus and method for generating an ingredient chain 12314824 Cl. G06N 20/00.
Neumann, Yair A.: See--
Dvorsky, Anatoly; Levi, Tamir S.; Neumann, Yair A.; Axelrod Manela, Noa; Atias, Eitan; Cohen, Oren; Schwarcz, Elazar Levi; Witzman, Ofir; Miller, Noam; Manash, Boaz; and Garmahi, Danny M. 12310847 Cl. A61F 2/2418.
Neuromod Devices Limited: See--
O'Neill, Ross; Hughes, Stephen; D'Arcy, Shona; Hamilton, Caroline; and Conlon, Brendan 12311114 Cl. A61M 21/02.
NeuroPace, Inc.: See--
Sun, Felice; Esteller, Rosana; and Lee, Adam 12310755 Cl. A61B 5/686.
Neusch, William H.; and Lewellen, Peter Counterweight deployable vehicle barrier 12312754 Cl. E01F 13/046.
NEUSTAR, INC.: See--
Barker, Edward F. 12314223 Cl. G06F 16/13.
Nevdahs, Ilja; and Kipurs, Agris, to Alarm.com Incorporated Security camera drone base station detection 12315259 Cl. G06V 20/52.
Neve, Sameer: See--
Chaudhury, Ameet; Chandrashekhar, Shekhar; and Neve, Sameer 12311067 Cl. A61L 2/10.
Nevill, Stuart M.: See--
Boothe, Daniel K.; Johnson, Martin E.; Nawfal, Ismael H.; Valentine, Timothy J.; Nevill, Stuart M.; and Feng, Chanjuan 12317028 Cl. H04R 1/26.
Neville, Craig M: See--
Ito, Koju; Kakinuma, Chihaya; Nishino, Masafumi; Mima, Shinji; Neville, Craig M; and Sundback, Cathryn A 12313625 Cl. G01N 33/5088.
New, Anthony: See--
Dobos, Leonard; and New, Anthony 12316210 Cl. H02M 1/08.
New England Biolabs, Inc.: See--
Vainauskas, Saulius; Chan, Siu-hong; and Taron, Christopher H. 12312610 Cl. C12N 9/1241.
New York Air Brake LLC: See--
Benson, G. Samuel; Stroder, Michael; and Shore, Craig 12312551 Cl. C10M 103/02.
Parisian, Michael L.; and Margeson, Scott E. 12311897 Cl. B60T 13/683.
New York Blood Center, Inc.: See--
Lustigman, Sara; Nutman, Thomas B.; and Bennuru, Sasisekhar 12311016 Cl. A61K 39/0003.
NEW YORK SOCIETY FOR THE RELIEF OF THE RUPTURED AND CRIPPLED, MAINTAINING THE HOSPITAL FOR SPECIAL SURGERY: See--
Chen, Tony; Maher, Suzanne A.; and Warren, Russell 12311077 Cl. A61L 27/3662.
NEW YORK UNIVERSITY: See--
Keerthivasan, Mahesh Bharath; and Khodarahmi, Iman 12313710 Cl. G01R 33/246.
Newcomb, Bradley A.: See--
Kumar, Satish; Chae, Han Gi; Newcomb, Bradley A.; Gulgunje, Prabhakar V.; Liu, Yaodong; Gupta, Kishor K.; and Kamath, Manjeshwar G. 12312711 Cl. D01F 9/225.
Newell, Garrett James: See--
Pace, Michael Thomas; Baur, David Gregory; Schuler-Sandy, Theodore Lyman; Kennedy, William; Micono, Jeffrey Gerard; Walker, William Louis; and Newell, Garrett James 12316027 Cl. H01Q 5/48.
Newell, John C.: See--
Baughman, Aaron K.; Van Der Stockt, Stefan; Trim, Craig M.; Newell, John C.; and Hammer, Stephen C. 12314870 Cl. G06N 5/04.
Newhall, Ileana C.: See--
Salem, Matthew G.; Moon, Jason P.; and Newhall, Ileana C. 12316013 Cl. H01Q 21/26.
Newlight Technologies, Inc.: See--
Herrema, Markus D. 12312629 Cl. C12P 7/625.
Newlin, Seth: See--
Linsmeier, Eric R.; Shively, Jason; Newlin, Seth; Kay, David; Bermingham, Jack; Morrow, Jon; and Steinberger, David 12311910 Cl. B60W 10/26.
Newman, David E.; and Massengill, R. Kemp Systems and methods for hazard mitigation 12311923 Cl. B60W 30/09.
Newronika S.p.A.: See--
Arlotti, Mattia; and Rossi, Lorenzo 12311180 Cl. A61N 1/36175.
Newsome, Jr., Norman D.; and Newsome, Kristen D. Depilatory wax additive and process 12311038 Cl. A61K 8/0204.
Newsome, Kristen D.: See--
Newsome, Jr., Norman D.; and Newsome, Kristen D. 12311038 Cl. A61K 8/0204.
Newsonic Technologies: See--
Tang, Gongbin 12316303 Cl. H03H 9/643.
NEWTECH GROUP CO., LTD.: See--
Tan, Kunlun; Cao, Lei; Bai, Gaoyu; Liu, Yelin; Du, Qiuping; Zhang, Zhicheng; Zhu, Yubin; and Zheng, Xiaotian 12311627 Cl. B29D 99/0028.
Newtech wellness Corporation: See--
Byun, Hyun Jung 12311226 Cl. A63B 23/0233.
Newton, Christopher Gregory: See--
Rao, Kodanda Ranganatha Nagraja; Newton, Christopher Gregory; and Evans, Gareth James Street 12312301 Cl. C07C 323/65.
Newton, Matthew: See--
Gravagne, Ian; Jack, David A.; Blandford, Benjamin M.; Newton, Matthew; Georgeson, Gary; and Chowdhury, Tonoy 12313592 Cl. G01N 27/9013.
Newtonoid Technologies, L.L.C.: See--
Staton, Fielding B.; and Strumpf, David 12317007 Cl. H04N 9/3152.
neXat SA: See--
Sansone, Fulvio 12316432 Cl. H04B 7/18513.
Nextchip Co., Ltd.: See--
Oh, Young Seok; Jo, Hye Seong; and Kim, Kyoung Tae 12315270 Cl. G06V 20/588.
NEXTER MUNITIONS: See--
Pavier, Julien 12313387 Cl. F42B 35/00.
NEXTGEN BIOLOGICS, INC.: See--
Early, Ryanne 12311079 Cl. A61L 27/3687.
NextGen Organics, Inc.: See--
West, Jeffrey 12311420 Cl. B09B 3/70.
NEXUS PHOTONICS, INC: See--
Komljenovic, Tin; Tran, Minh; and Zhang, Zeyu 12313881 Cl. G02B 6/1228.
Neyer, Daniel; Glass, Leon; Kraenzler, Matthias; and Hilali, Wael, to Robert Bosch GmbH Method and apparatus for determining temperatures in an electric machine 12314098 Cl. G06F 1/206.
Nezamabadi, Mahdi: See--
Lewty, Nicholas C.; Nezamabadi, Mahdi; Hung, Po-Chieh; and Poh, Tze Yong 12314489 Cl. G06F 3/03545.
NFLECTION THERAPEUTICS, INC.: See--
Powala, Christopher; Morefield, Elaine; Evans, Charles Rodney Greenaway; Stevenson, Cameron Robert; and Brady, Brendan Philip 12310950 Cl. A61K 31/437.
Ng, Chun Kit; Cummings, Peter; Wendorff, Matthew B.; Kiely, John; and Kristiansen, Keith Toy projectile with vented suction cup head 12311283 Cl. A63H 33/18.
Ng, Dzam-Si Jesse: See--
Andeshmand, Sayeed; Cauley, III, Thomas H.; Dixon, John; Glade, David; Maamar, Hédia; McAdams, Michael John; Ng, Dzam-Si Jesse; and Rolfe, David Alexander 12310730 Cl. A61B 5/150961.
Ng, Hong Wan; Lee, Choon Kuan; Corisis, David J.; and Chong, Chin Hui, to Micron Technology, Inc. Build-up package for integrated circuit devices, and methods of making same 12315769 Cl. H01L 23/18.
Ng, Kok Chian: See--
Steele, Derek; and Ng, Kok Chian 12313152 Cl. F16H 41/26.
Ng, Rondy C.: See--
Abraham, Dawn; and Ng, Rondy C. 12314948 Cl. G06Q 20/401.
Ng, Yu-Shen: See--
Gupta, Anubhav; Sethumadhavan, Subramanian; Jupudi, Naga Venkata Sai Indubhaskar; Howard, Jeffrey; Singh, Manvendra Tomar; and Ng, Yu-Shen 12314326 Cl. G06F 16/907.
NGK INSULATORS, LTD.: See--
Nagai, Asumi; Nishimura, Noboru; and Yamaguchi, Hirofumi 12315757 Cl. H01L 21/68757.
Ngo, Binh: See--
Ha, Chang Wan; Ngo, Binh; Rahman, Ahsanur; Chinnammagari, Radhika; and Upadhyay, Sagar 12315567 Cl. G11C 16/08.
Nguyen, Alexandre Thanh Nhan: See--
Lawniczek, Baptiste Dorian; Escure, Didier René André; and Nguyen, Alexandre Thanh Nhan 12313008 Cl. F02C 7/36.
Nguyen, Anh Tuan; Kim, Jeffrey; Ahn, Keunho; and Zhang, Daixuan, to Slingshot Biosciences, Inc. Hydrogel particles as feeder cells and as synthetic antigen presenting cells 12312595 Cl. C12N 5/0018.
Nguyen, Binh Thanh; Freeman, Joshua David; Ruth, Matt David; and Finley, Stephan Wayne, to Gillig LLC High-voltage system test measurement systems and methods 12313684 Cl. G01R 31/3275.
Nguyen, Chi Thang: See--
Cho, Eunhyoung; Lee, Hanboram; Lee, Sunghee; Lee, Jeongyub; and Nguyen, Chi Thang 12312686 Cl. C23C 16/45529.
Nguyen, Christian Thieu: See--
Iwata, Geoffrey Zerbinatti; Nguyen, Christian Thieu; Tharratt, Kevin Robert; Ruf, Maximilian Thomas; Reinhardt, Tucker Blake; Crivelli-Decker, Jordan Edward; Liddy, Madelaine Susan Zoritza; Rugar, Alison Emiko; Lu, Fuxi; Pratt, Ethan Jesse; Au-Yeung, Kit Yee; and Bogdanovic, Stefan 12310734 Cl. A61B 5/243.
Nguyen, Cong: See--
Kulkarni, Pushkar Bajirao; Burke, Joseph Patrick; Nguyen, Cong; Kim, Sanghoon; Ibrahim, Abdelrahman Mohamed Ahmed Mohamed; and Gutman, Igor 12316358 Cl. H04B 1/0458.
Nguyen, Cuong The: See--
Hatfield, Jennifer M.; Dhillon, Jill S.; Nguyen, Cuong The; Suto, Tiberiu; Adams, Brian K.; and Delima, Neil 12314121 Cl. G06F 11/0712.
Nguyen Dinh, Huy: See--
Salfity, Jonathan Munir; Allen, William J.; Nguyen Dinh, Huy; Adrian, Nicholas; Lim, Joyce Xin Yan; and Pham, Quang-Cuong 12311605 Cl. B29C 64/386.
Nguyen, Duc: See--
Senecal, David; Kahn, Andrew; Segal, Ory; Shuster, Elad; and Nguyen, Duc 12316672 Cl. H04L 63/1483.
Nguyen, Hieu: See--
Vo, Huang Trung; and Nguyen, Hieu 12316766 Cl. H04L 9/3213.
Nguyen, Hoang Viet; Rao, Raghunandan M.; Zhu, Yuming; Yang, Yi; and Shin, Jiho, to Samsung Electronics Co., Ltd. Joint estimation of respiratory and heart rates using ultra-wideband radar 12313772 Cl. G01S 7/414.
Nguyen, Kim: See--
Weingaertner, David; Ta, Andy; Govindarasu, Navaneethakrishnan; Patel, Siddharth; Nguyen, Kim; Joshi, Nandan; and Bell, Shannon 12312697 Cl. C25B 1/042.
Nguyen, Manh Tai: See--
Sugimoto, Yoshiki; Murai, Akito; Hamana, Kentaro; and Nguyen, Manh Tai 12316582 Cl. H04L 5/16.
Nguyen, Phan Hoang Tung: See--
Schwarz, Heiko; Wiegand, Thomas; Nguyen, Phan Hoang Tung; and Marpe, Detlev 12316847 Cl. H04N 19/13.
Nguyen, Phi; to T-Mobile USA, Inc. Enable interaction between a user and an agent of a 5G wireless telecommunication network using augmented reality glasses 12314626 Cl. G06F 3/1454.
Nguyen, Thanh T.: See--
Wyatt, Perry M.; and Nguyen, Thanh T. 12315870 Cl. H01M 10/0525.
Nguyen, Thao: See--
Binmoeller, Kenneth F.; Duong, Sieu T.; Duong, Hanh; and Nguyen, Thao 12310832 Cl. A61F 2/04.
Nguyen, Thao A.; Ho, Michael; Bai, Zhigang; Liu, Xiaoyong; Li, Zhanjie; Ahn, Yongchul; Jiang, Hongquan; and Le, Quang, to Western Digital Technologies, Inc. Matrix-vector multiplication using SOT-based non-volatile memory cells 12314842 Cl. G06N 3/063.
Nguyen, Thierry; Lu, Ray; and Runser, Rory, to GAF Energy LLC Roofing systems with water ingress protection 12316268 Cl. H02S 20/25.
Nguyen, Thuan: See--
Barbulescu, Ion-Horatiu; Delgado, Emmanuel; Faeq, Ahmed Hassan; Nguyen, Thuan; Salazar, David; Tran, Huong Ngoc; and Tran, Thanh Nhan 12312858 Cl. E06B 1/70.
Nguyen, Tien Viet: See--
Guo, Hui; Baghel, Sudhir Kumar; Gulati, Kapil; Wu, Shuanshuan; Nguyen, Tien Viet; and Sarkis, Gabi 12316462 Cl. H04L 1/1887.
Guo, Hui; Nguyen, Tien Viet; Gulati, Kapil; and Baghel, Sudhir Kumar 12316452 Cl. H04L 1/08.
Nguyen, Tung: See--
George, Valeri; Bross, Benjamin; Kirchhoffer, Heiner; Marpe, Detlev; Nguyen, Tung; Preiss, Matthias; Siekmann, Mischa; Stegemann, Jan; and Wiegand, Thomas 12316846 Cl. H04N 19/13.
Nguyen, Vinh Dai: See--
Jhas, Amit; Siddiqui, Abrar; Jiang, Lei; Nguyen, Vinh Dai; and Konecny, Martin 12314929 Cl. G06Q 20/3224.
Nguyen, Xuan Tung: See--
Azman, Nur Amalyna Binte; Zhao, Yang; Siew, Ye Wee; Liu, Dongyu; Holmberg, Brett; Sun, Guofei; Ho, Weng Hong; and Nguyen, Xuan Tung 12311321 Cl. B01D 69/1251.
Ngwendson, Luther-King Ekonde; Deviny, Ian; Sharma, Yogesh Kumar; and DYNEX SEMICONDUCTOR LIMITED, to ZHUZHOU CRRC TIMES SEMICONDUCTOR CO. LTD. SIC MOSFET structures with asymmetric trench oxide 12317561 Cl. H10D 62/8325.
NHLO Holding B.V.: See--
Schinkel, Edouard Frans Alexander; Schinkel, Michaël Hubert; Walgaard, Bart; Lindeboom, Gjalt; and De Vries, Eelke Gerrit 12312217 Cl. B66C 13/06.
Ni, Dajun: See--
Chang, Wen; Hu, Jun; Zheng, Qiuhui; Lei, Yang; Lu, Haoran; Feng, Shiping; Chen, Canbin; Wu, Qing; Ni, Dajun; Duan, Pengfei; and Zhao, Baiquan 12315887 Cl. H01M 10/0583.
Ni, Guanjun: See--
Chen, Yan; Ni, Guanjun; Zhu, Yuhong; Peng, Bingguang; Sun, Shangbang; Yao, Jingjing; and Wang, Rong 12316348 Cl. H03M 13/13.
Ni, Hsiang-Pu: See--
Tsorng, Yaw-Tzorng; Wu, Tung-Hsien; Tseng, Yu-Ying; and Ni, Hsiang-Pu 12317438 Cl. H05K 5/03.
Ni, Jiacheng: See--
Wang, Zijia; Ni, Jiacheng; and Jia, Zhen 12315079 Cl. G06T 17/10.
Ni, Jiacheng; He, Bin; Chen, Tianxiang; Jia, Zhen; and Wang, Zijia, to Dell Products L.P. Method, device, and product for searching data 12314266 Cl. G06F 16/2457.
Ni, Siyuan: See--
Yu, Jingwei; Li, Qibo; Gao, Zhongfeng; and Ni, Siyuan 12317018 Cl. H04R 1/025.
Niantic, Inc.: See--
Benfold, Ben 12313706 Cl. G01R 33/0035.
Niazi, Kayvan; to NantCell, Inc. Targeted neoepitope vectors and methods therefor 12311018 Cl. A61K 39/001102.
Niazi, Zakariya: See--
Kurtz, Andrew F.; Bowron, John; Krisiloff, Allen; Niazi, Zakariya; and Sasian-Alvarado, Jose Manuel 12313825 Cl. G02B 13/06.
NIBCO Inc.: See--
Mason, Christopher W. 12312261 Cl. C02F 1/488.
Nibe, John R.: See--
Prause, Richard A.; Modin, Andrew E.; Halbritter, Allen; Heath, Richard E.; Ramirez, Ivan G.; and Nibe, John R. 12311618 Cl. B29C 70/504.
NICHIA CORPORATION: See--
Abe, Koji; and Nishiuchi, Kazusa 12317661 Cl. H10H 20/857.
Enomoto, Kiyoshi 12316069 Cl. H01S 5/02257.
Kozuru, Kazuma 12316068 Cl. H01S 5/02253.
Sanga, Daisuke 12317663 Cl. H10H 20/857.
Yoshida, Norimasa; and Okahisa, Tsuyoshi 12313242 Cl. F21V 13/04.
Nicholas, David A.; to Covidien LP Surgical stapling device with flexible shaft 12310591 Cl. A61B 17/1155.
Nicholas, Jim Edward: See--
Lomas, David; Bean, Michael David; Macalister, Iain; and Nicholas, Jim Edward 12314517 Cl. G06F 3/0421.
Nichols, Chase: See--
Long, Geoffrey Alan; Nichols, Chase; and Kelly, Patrick 12312075 Cl. B64C 29/0033.
Nichols, David E.: See--
Londesbrough, Derek John; Brown, Christopher; Northen, Julian Scott; Moore, Gillian; Patil, Hemant Kashinath; and Nichols, David E. 12312375 Cl. C07F 9/5728.
Nichols, Nathan D.: See--
Paley, Andrew R.; Nichols, Nathan D.; Trahan, Matthew L.; Lewis Meza, Maia; Pham, Michael Tien Thinh; and Truong, Charlie M. 12314674 Cl. G06F 40/30.
Nicholson, Richard; and Phillips, Timothy Alan, to Empower Semiconductor, Inc. Phase multiplexed series stacked DC-DC converter 12316223 Cl. H02M 3/158.
Nicholson, Stuart James Myron; to GOOGLE Scanning projector dynamic resolution 12317010 Cl. H04N 9/3188.
Nick, Teresa A.: See--
Saunders, Winston Allen; Viitaniemi, Maria Leena Kyllikki; Nick, Teresa A.; Keehn, Nicholas Andrew; Belady, Christian L.; and Peterson, Eric C. 12316377 Cl. H04B 10/116.
Nickel, Marcel Dominik: See--
Benkert, Thomas; Nickel, Marcel Dominik; Arberet, Simon; Mailhe, Boris; and Mostapha, Mahmoud 12315044 Cl. G06T 11/003.
Nickel, Matthew R.; and Sweet, Hillary M., to PAVONIS DIAGNOSTICS INC. Optical interference diagnostic apparatus and methods of use 12313556 Cl. G01N 21/78.
Nickerson, Robert M.: See--
Nofen, Elizabeth; Gokhale, Shripad; Ross, Nick; Eitan, Amram; Ananthakrishnan, Nisha; Nickerson, Robert M.; Muthur Srinath, Purushotham Kaushik; Guo, Yang; Decker, John C.; and Li, Hsin-Yu 12315777 Cl. H01L 23/373.
Nickisch, Dirk: See--
Sambhwani, Sharad; Jadhav, Digvijay A.; Nickisch, Dirk; Katzir, Gil; and Pillutla, Laxminarayana 12316366 Cl. H04B 1/3838.
Sambhwani, Sharad; Nickisch, Dirk; Shanbhag, Madhukar K; Nabar, Rohit U; Balasubramanian, Sanjeevi; Narra, Shiva Krishna; Subramanian, Sriram; Tabet, Tarik; Kamala Govindaraju, Vishwanth; Sun, Yakun; and Subrahmanya, Parvathanathan 12317294 Cl. H04W 72/30.
Nicklin, Alexandra: See--
Friedman, Marc D.; Kamaev, Pavel; Coffey, Martin Joseph; Rajpal, Rajesh K.; and Nicklin, Alexandra 12311025 Cl. A61K 41/0057.
Nickolaus, Melanie: See--
Schneider, Frank; Marin, Kay; Nickolaus, Melanie; Tegethoff, Julia; and Oesterhoff, Marleen 12312622 Cl. C12P 13/04.
Nicks, III, Martice Eldridge: See--
Kallman, Jesse Daniel; and Nicks, III, Martice Eldridge 12314335 Cl. G06F 16/9537.
Nicodemus, Rolf; and Nordbruch, Stefan, to ROBERT BOSCH GMBH Method for assisting a motor vehicle 12315373 Cl. G08G 1/166.
Nicolette, Michael R.: See--
Parsons, Robert R.; Nicolette, Michael R.; and Schweigert, Bradley D. 12311239 Cl. A63B 53/0466.
Nicoli, Raymond L: See--
Walker, Steven H.; Nicoli, Raymond L; and Pausal, Rolando 12310448 Cl. A43B 13/189.
Nicolini, Luca Assembly and method for the automated folding of corners of a box 12311631 Cl. B31B 50/52.
Nicolon Corporation: See--
King, Kevin Nelson; and Jones, David Michael 12312831 Cl. E04H 4/10.
Nicoson, Richard: See--
Gross, Matthew L.; Colwell, Joseph J.; and Nicoson, Richard 12312765 Cl. E02F 3/4075.
Nicoventures Trading Limited: See--
Beidelman, Keith George 12310417 Cl. A24F 40/57.
Chen, Shixiang 12310415 Cl. A24F 40/53.
Gerardi, Anthony Richard; Beeson, Dwayne William; Hutchens, Ronald K.; Keller, Christopher; Poole, Thomas H.; Sebastian, Andries Don; and St. Charles, Frank Kelley 12310959 Cl. A61K 31/465.
Horrod, Martin; and Lopez, Victor Clavez 12310408 Cl. A24F 40/465.
Kaufman, Duane; and Blandino, Thomas P. 12310410 Cl. A24F 40/465.
Mua, John Paul; and Monsalud, Luis 12310394 Cl. A24B 15/10.
Nicoya Lifesciences Inc.: See--
Iyer, Krishna; and Denomme, Ryan 12313527 Cl. G01N 21/03.
Niculaescu, Oana: See--
Damewood, Liam James; Niculaescu, Oana; Rozenshteyn, Alexander; and Rudoy, Mikhail 12314418 Cl. G06F 21/6218.
NIDEC CORPORATION: See--
Endo, Shuji; and Ishimura, Hiroyuki 12312024 Cl. B62D 5/0463.
Tanaka, Junya; and Ueda, Tomoya 12316173 Cl. H02K 15/03.
NIDEC GLOBAL APPLIANCE BRASIL LTDA.: See--
Reich, Robert; Rodrigues, Tadeu Tonheiro; and Andrade, Daniel Lacerda De 12313053 Cl. F04B 39/1066.
NIDEC PSA EMOTORS: See--
Moya, Cyril 12316180 Cl. H02K 3/28.
NIDEC SANKYO CORPORATION: See--
Kuribayashi, Tamotsu; Inomata, Tetsuya; and Murata, Wataru 12311540 Cl. B25J 9/0081.
Tsuchihashi, Masao 12316185 Cl. H02K 33/02.
Niderberg, Alex Leo: See--
Koeppel, Adam R.; and Niderberg, Alex Leo 12314927 Cl. G06Q 20/3221.
Koeppel, Adam R.; Niderberg, Alex Leo; Kelly, Kevin; Mittal, Mili; Calandro, Sarah; and Turfboer, Jonathan R. 12314933 Cl. G06Q 20/327.
Nie, Weipin; Gao, Yue; Zeng, Hao; Fu, Chao; and Wang, Ce, to SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD. System and method for extracting a region of interest from volume data 12315084 Cl. G06T 19/00.
Niederleithner, Michael: See--
Leitgeb, Rainer; and Niederleithner, Michael 12313402 Cl. G01B 9/02077.
Niederweis, Michael; and Pavlenok, Mikhail, to THE UAB RESEARCH FOUNDATION MSP nanopores and uses thereof 12312385 Cl. C07K 14/35.
Niedrig, Roman: See--
Kramer, Reinhard; Märten, Otto; Wolf, Stefan; Roßnagel, Johannes; Hänsel, Marc; and Niedrig, Roman 12313455 Cl. G01J 1/4257.
Niedt, James R: See--
Johnson, Beth; Kleuskens, Sarah; Niedt, James R; Barriger, Kyle M; Morin, Jr., Marc A; Ray, Thomas A; Thorson, Timothy A.; and Stevens, Victor 12310827 Cl. A61F 13/49.
Nielsen Co (US), LLC, The: See--
Livoti, John T.; Madhanganesh, Rajakumar; Woodruff, Stanley Wellington; Lehing, Ryan C.; and Conklin, Charles Clinton 12316288 Cl. H03G 3/30.
Nielsen Company (US), LLC, The: See--
Nelson, Daniel; and Miner, Donald 12316811 Cl. H04N 1/00.
Nielsen Consumer LLC: See--
Arroyo, Roberto; and Yebes Torres, Jose Javier 12315283 Cl. G06V 30/42.
Nielsen, Martin Refslund: See--
Johnsen, Lasse Markworth; Hjortlund, Jonas; and Nielsen, Martin Refslund 12311141 Cl. A61M 39/22.
Nielsen, Mogens; to SIEMENS GAMESA RENEWABLE ENERGY A/S Aerodynamic element for a blade of a wind turbine 12313032 Cl. F03D 1/0675.
Nielsen, Ryan William: See--
Cao, Min; Nielsen, Ryan William; and Camarata, Eric Ryan 12314426 Cl. G06F 21/6245.
Niemelä, Erik Johan; to FINNCURE OY Methods of fabricating carriers for targeted delivery to a host 12311061 Cl. A61K 9/5184.
Niemiec, Marcin; Sibson, Duncan; Hansell, Noah; Glerum, Chad; McLaughlin, Colm; Davenport, Daniel; Weiman, Mark; Gray, Jason; Pham, Khiem; Black, Michael; Silber, Ben; Fromhold, Mark; Iott, Andrew; Hill, Kathleen; Gilbert, John; and Castle, Richard, to Globus Medical, Inc. Aligning vertebral bodies 12310643 Cl. A61B 17/8866.
Niemöller, Jörg: See--
Ahmed, Talal; Tusheva, Nevena; Pramatarov, Dimitar; and Niemöller, Jörg 12316770 Cl. H04L 9/3239.
Nieto Cavia, Laura: See--
Buisan Ferrer, José; Valat, Laurent David; and Nieto Cavia, Laura 12310664 Cl. A61B 3/165.
Nighan, Jr., William L.; Korringa, Maarten; Rolin, John Howard; and Henderlong, Devin, to Teledyne ETM, Inc. Scanning linear accelerator system for producing X-rays of variable controlled dose per pulse 12317400 Cl. H05G 2/00.
Nigro, Ryanne; to JINGLES BUNNIES LLC Methods and apparatus for stuffable plush toy 12311279 Cl. A63H 3/02.
Nihalani, Raj: See--
Waataja, Jonathan James; and Nihalani, Raj 12311174 Cl. A61N 1/36053.
Nihalani, Vishay: See--
Zhao, Xiaoyue; Hohnhold, Henning; Gao, Xiang; Joshi, Ajay; Nihalani, Vishay; Patterson, Katharine; and Lee, Joseph 12314058 Cl. G05D 1/0272.
Nihas, Guduru Sai: See--
Lui, Benjamin; Nihas, Guduru Sai; and Batlouni, Salim 12315190 Cl. G06T 7/73.
Niihara, Koshiro: See--
Ogawa, Kohei; Oka, Hiroaki; Nakajima, Hiroshi; and Niihara, Koshiro 12311482 Cl. B23P 6/00.
Niikura, Yasuhiro: See--
Suzuki, Tsunenori; Niikura, Yasuhiro; Hirose, Tomoya; and Seo, Satoshi 12317723 Cl. H10K 59/38.
Niimi, Hideki; Kitajima, Isao; Miyakoshi, Akio; Higashi, Yoshitsugu; and MITSUI CHEMICALS, INC., to NATIONAL UNIVERSITY CORPORATION UNIVERSITY OF TOYAMA Method for determining bacterial number in specimen 12312643 Cl. C12Q 1/689.
Niinuma, Hitoshi: See--
Mimura, Takuya; Yamamoto, Junpei; and Niinuma, Hitoshi 12313312 Cl. F25B 43/02.
NIKE, Inc.: See--
Auyang, Arick; Houng, Derek; Schmalzer, Eric A.; Temple, Matthew; To, Jeffrey S.; and Weston, Geoffrey A 12310449 Cl. A43B 13/20.
Bailly, Devin; Patton, Levi J.; and Vollmer, Adam 12310450 Cl. A43B 13/203.
Derr, Kevin R.; Evans, Martin E.; Huang, Chin-Chen; Levy, Cassidy R.; Nordstrom, Matthew D.; Raffaele, Guillermo; and Kim, Hyo Young 12310457 Cl. A43C 11/1493.
Klein, Ross; Neumann, IV, Kort W.; and Youngs, Bryan K. 12310446 Cl. A43B 13/127.
McFarland, II, William C.; and Resneck, Leah 12312718 Cl. D04B 1/24.
Nethongkome, Benjamin; Houng, Derek; and Hozalski, Kreig 12310454 Cl. A43B 23/0245.
Regan, Patrick C.; Chang, Chih-Chi; Lee, Kuo-Hung; and Jean, Ming-Feng 12313395 Cl. G01B 11/24.
Walker, Steven H.; Nicoli, Raymond L; and Pausal, Rolando 12310448 Cl. A43B 13/189.
Nikipelov, Andrey: See--
Polyakov, Alexey Olegovich; Smakman, Erwin Paul; Nikipelov, Andrey; and Mangnus, Albertus Victor Gerardus 12313980 Cl. G03F 7/7065.
Nikkhoo, Michael; Toleno, Brian; and Codd, Patrick, to Meta Platforms Technologies, LLC Stack-PCB architecture with embedded vapor chamber 12317408 Cl. H05K 1/0207.
Niklason, Loren: See--
Stango, Timothy R.; DeFreitas, Kenneth F.; Shaw, Ian; Stein, Jay; Jameson-Meehan, Lynne; and Niklason, Loren 12310766 Cl. A61B 6/0414.
Nikolakaki, Sofia M.: See--
Bermperidis, Dimitrios; Nikolakaki, Sofia M.; Chakraborty, Rabi S.; Kumar, Rajesh; Venkataraman, Chandrasekar; Silveira, Natalia G.; and Das, Puja 12314272 Cl. G06F 16/24578.
Nikon Corporation: See--
Ichihashi, Toru; and Yamazaki, Yoichi 12315162 Cl. G06T 7/0016.
Inoue, Hideya; Iwaoka, Toru; Noborisaka, Michiko; Hatori, Masayuki; and Hamada, Tomohide 12316950 Cl. H04N 23/631.
Yamashita, Masashi; Ito, Tomoki; Kuribayashi, Tomonori; Koida, Keigo; Miwa, Satoshi; Komatsubara, Yoko; Watanabe, Katsuya; Nonaka, Azuna; and Makida, Ayumu 12313826 Cl. G02B 15/145523.
Nikon SLM Solutions AG: See--
Kopschinski, Daniel; Huebinger, Karsten; and Overberg, Marcel 12311602 Cl. B29C 64/343.
Niles, Savannah: See--
Bailey, Richard St. Clair; Pothapragada, Siddartha; Mori, Koichi; Stolzenberg, Karen; Niles, Savannah; Noriega-Padilla, Domingo; and Heiner, Cole Parker 12315094 Cl. G06T 19/006.
Nilsson, Anders: See--
Björkman, Andreas; Nilsson, Anders; and Erlman, Lars 12316997 Cl. H04N 7/0806.
Björkman, Andreas; Nilsson, Anders; and Erlman, Lars 12316998 Cl. H04N 7/0806.
Nilsson, Jarl; to Intertrust Technologies Corporation Key generation systems and methods 12316755 Cl. H04L 9/0861.
Nilsson, Magnus: See--
Persson, Hans; Pervan, Darko; and Nilsson, Magnus 12311572 Cl. B27N 3/24.
Nimbalker, Ajit; Nory, Ravikiran; Wager, Stefan; Orsino, Antonino; and Koorapaty, Havish, to Telefonaktiebolaget LM Ericsson (publ) Signaling enhancement for dynamic power sharing in dual connectivity 12317350 Cl. H04W 76/15.
Nimgaonkar, Ashish: See--
Powers, Jessica; Caldwell, Jacob; Cho, Sungmin R.; Yazdi, Youseph; Durr, Nicholas J.; Pasricha, Pankaj J.; Weiler, Chad; and Nimgaonkar, Ashish 12310562 Cl. A61B 1/043.
Nimmala, Srinivasan: See--
Vangala, Sarma V.; Tabet, Tarik; Ye, Chunxuan; Zhang, Dawei; Xu, Fangli; Hu, Haijing; Shikari, Murtaza A; Palle Venkata, Naveen Kumar R; Rivera-Barreto, Rafael L; Rossbach, Ralf; Vallath, Sreevalsan; Nimmala, Srinivasan; Zeng, Wei; Chen, Yuqin; and Wu, Zhibin 12317326 Cl. H04W 74/0833.
Nimrod, Guy: See--
Amit, Inbar; Levin, Itay; Nimrod, Guy; Fischman, Sharon; Barak Fuchs, Reut; Strajbl, Marek; Wyant, Timothy; Zhenin, Michael; Bluvshtein Yermolaev, Olga; Sasson, Yehezkel; Grossman, Noam; Levitin, Natalia; and Ofran, Yanay 12312400 Cl. C07K 16/246.
Nimura, Wataru: See--
Ichikawa, Kenzo; Mizushina, Takahiro; and Nimura, Wataru 12315474 Cl. G10C 3/12.
NINE DOWNHOLE TECHNOLOGIES, LLC: See--
Brandsdal, Viggo; and Aasheim, Geir 12312911 Cl. E21B 34/08.
Ning, Ce: See--
He, Jiayu; Ning, Ce; Li, Zhengliang; Hu, Hehe; Huang, Jie; and Yao, Nianqi 12317699 Cl. H10K 59/126.
Ning, Liaoyuan; Liu, Hongze; Wang, Cong; Cui, Guilin; and Liu, Zengchan, to BEIJING BYTEDANCE NETWORK TECHNOLOGY CO., LTD. Page operation processing method, electronic device, and non-transitory computer-readable storage medium 12314337 Cl. G06F 16/958.
Ning, Zhaonan; Wang, Bing; Zhang, Binghui; and Tian, Muqing, to SUZHOU METABRAIN INTELLIGENT TECHNOLOGY CO., LTD. Method and apparatus for bios option modifications to take effect, non-volatile readable storage medium, and electronic device 12314728 Cl. G06F 9/4401.
Ning, Zhenfei: See--
Song, Deyong; Zhou, Li; Dong, Chuangchuang; and Ning, Zhenfei 12312402 Cl. C07K 16/28.
NINGBO GEELY AUTOMOBILE RESEARCH & DEVELOPMENT CO., LTD.: See--
Rignäs, Ronja 12311752 Cl. B60K 15/03519.
NINGBO HYDERON HARDWARE CO., LTD: See--
Zhang, Lifeng 12310498 Cl. A47B 91/16.
NINGBO INLIGHT TECHNOLOGY CO., LTD.: See--
Ma, Daoyuan; and Guo, Lingjie Jay 12312474 Cl. C09C 1/0015.
Ningbo Kaili Holding Group Co., Ltd: See--
Lin, Jian; and Chen, Zongyue 12311564 Cl. B26B 19/3873.
Ningbo Maoli Electric Appliance Co., Ltd.: See--
Ruan, Lidan 12316053 Cl. H01R 25/003.
NINGBO MICRO-FOAM MATERIAL CO., LTD.: See--
Yan, Haikuo; Zhou, Wushun; He, Tingwei; Zhou, Fajun; Zhang, Wei; and Wang, Shengchao 12312455 Cl. C08K 5/06.
NINGBO SOMLE AUDIO-VISUAL TECHNOLOGY CO., LTD: See--
Tao, Liming; and Chen, Weidong 12310496 Cl. A47B 81/065.
NINGBO SUNNY OPOTECH CO., LTD: See--
Zhao, Bojie; Yao, Lifeng; Yuan, Dongli; Yu, Sisi; and Huang, Zhen 12316941 Cl. H04N 23/55.
NINGBO UNIVERSITY: See--
Sun, Weiwei; Yang, Gang; Meng, Xiangchao; and Zhou, Jun 12315104 Cl. G06T 3/40.
NINGBO WEIE ELECTRONICS TECHNOLOGY LTD.: See--
Yu, Feng; Xu, Lizhi; and Feng, Weiyi 12316130 Cl. H02J 50/10.
NINGDE AMPEREX TECHNOLOGY LIMITED: See--
Zhong, Huawei; Lin, Chaowang; Yang, Fan; and Su, Yisong 12315912 Cl. H01M 4/139.
Ninglekhu, Jiwan: See--
Li, Hongkun; Starsinic, Michael; Ly, Quang; Mladin, Catalina; and Ninglekhu, Jiwan 12317164 Cl. H04W 40/02.
Ninglekhu, Jiwan L.: See--
Ly, Quang; Liu, Lu; Seed, Dale N.; Chen, Zhuo; Flynn, IV, William Robert; Mladin, Catalina Mihaela; Ninglekhu, Jiwan L.; Li, Hongkun; and Di Girolamo, Rocco 12314236 Cl. G06F 16/215.
NIO TECHNOLOGY (ANHUI) CO., LTD: See--
Zhou, Hang 12315269 Cl. G06V 20/588.
NIPPON FILCON CO., LTD.: See--
Fujisawa, Shigenobu; and Nomura, Yusuke 12312716 Cl. D03D 13/004.
NIPPON KAYAKU KABUSHIKI KAISHA: See--
Ohtani, Kohei; Muto, Hitomi; Hattori, Yu; and Suzuki, Saori 12312294 Cl. C07C 229/74.
NIPPON SEIKI CO., LTD.: See--
Saji, Shunsuke 12313854 Cl. G02B 27/0179.
NIPPON SHEET GLASS COMPANY, LIMITED: See--
Kubo, Yuichiro; and Shimmo, Katsuhide 12313869 Cl. G02B 5/226.
NIPPON STEEL CORPORATION: See--
Fujita, Soshi; Suzuki, Yuki; Fuda, Masahiro; Irikawa, Hideaki; Maki, Jun; Yoshikawa, Nobuo; and Nomura, Naruhiko 12311427 Cl. B21D 39/031.
Hayakawa, Ryunosuke; and Villert, Sébastien 12312874 Cl. E21B 17/042.
Kurisu, Yasushi; Li, Yu; and Yagyu, Koji 12312646 Cl. C21D 9/0012.
Takatani, Shinsuke; Okumura, Shunsuke; and Nagano, Shohji 12312662 Cl. C22C 38/06.
Takatani, Shinsuke; Ushigami, Yoshiyuki; Nakamura, Shuichi; Nagano, Shohji; and Okumura, Shunsuke 12312649 Cl. C21D 9/46.
Yasutomi, Takashi; and Kobayashi, Akinobu 12311451 Cl. B23D 15/08.
NIPPON STEEL HARDFACING CORPORATION: See--
Kurisu, Yasushi; Li, Yu; and Yagyu, Koji 12312646 Cl. C21D 9/0012.
NIPPON TELEGRAPH AND TELEPHONE CORPORATION: See--
Aoshima, Hiromu 12316781 Cl. H04L 9/3268.
Fujimoto, Tatsuya; Kawano, Tomohiro; Terakawa, Kuniaki; and Katayama, Kazunori 12314649 Cl. G06F 30/392.
Goto, Daisuke; Itokawa, Kiyohiko; Kojima, Yasuyoshi; and Sakamoto, Kazumitsu 12316418 Cl. H04B 7/0634.
Hattori, Takashi; Kobayashi, Tessei; and Fujita, Sanae 12314297 Cl. G06F 16/3344.
Hattori, Takashi; Kobayashi, Tessei; and Fujita, Sanae 12314298 Cl. G06F 16/3344.
Hattori, Takashi; Kobayashi, Tessei; and Fujita, Sanae 12314299 Cl. G06F 16/3344.
Hayashi, Aki; Yokohata, Yuki; Hata, Takahiro; Mori, Kohei; and Obana, Kazuaki 12313428 Cl. G01C 21/3848.
Hayashi, Yuhei; Suzuki, Hiroshi; Kudo, Ichiro; Osawa, Hiroshi; Miyoshi, Yuki; and Nishioka, Takeaki 12316604 Cl. H04L 63/0236.
Hosokawa, Kenchi; and Maruya, Kazushi 12310658 Cl. A61B 3/063.
Katsurai, Hiroaki; and Yoshida, Tomoaki 12316385 Cl. H04B 10/80.
Kawahara, Hiroki; Seki, Takeshi; Suda, Sachio; and Saito, Kohei 12316383 Cl. H04B 10/293.
Koyama, Takuma; Tanaka, Masashi; Okano, Yasushi; and Matsubayashi, Masaru 12316644 Cl. H04L 63/107.
Kudo, Riichi; Inoue, Takeru; Taniguchi, Atsushi; and Mizuno, Kohei 12316395 Cl. H04B 17/373.
Murayama, Daisuke; and Kawamura, Kenichi 12317144 Cl. H04W 36/0072.
Nagase, Fumiaki; Kuriyama, Keita; Ono, Yu; Hasegawa, Hitoshi; Fukuzono, Hayato; Osaka, Kazuo; Furuya, Hiroyuki; Yoshioka, Masafumi; Miyagi, Toshifumi; and Hayashi, Takafumi 12316545 Cl. H04L 47/24.
Nakadaira, Atsushi; Watanabe, Hiroki; Fujimura, Shigeru; Ohashi, Shigenori; Ishida, Tatsuro; and Hidaka, Kota 12314349 Cl. G06F 21/10.
Nakamura, Atsushi; Koshikiya, Yusuke; and Honda, Nazuki 12313493 Cl. G01M 11/332.
Nishida, Kosuke; Otsuka, Atsushi; Nishida, Kyosuke; Asano, Hisako; Tomita, Junji; and Saito, Itsumi 12314659 Cl. G06F 40/20.
Oda, Tomokazu; Nakamura, Atsushi; Iida, Daisuke; Koshikiya, Yusuke; and Honda, Nazuki 12313489 Cl. G01M 11/02.
Shindo, Takahiko; Chin, Meishin; and Kanazawa, Shigeru 12316074 Cl. H01S 5/12.
Sugiura, Ryosuke; Moriya, Takehiro; and Kamamoto, Yutaka 12315520 Cl. G10L 19/008.
Takahashi, Kensuke; Kanemaru, Sho; Ikegaya, Tomoki; and Toyoshima, Tsuyoshi 12314685 Cl. G06F 8/10.
Wakisaka, Yoshifumi; Iida, Daisuke; and Oshida, Hiroyuki 12313449 Cl. G01H 9/004.
NIPRO CORPORATION: See--
Kikumoto, Shunsuke; Yasumura, Naoaki; and Minohara, Rui 12311088 Cl. A61M 1/1698.
Nir, Ittai: See--
Goldring, Damian; Sharon, Dror; Brodetzki, Guy; Ruf, Amit; Kaplan, Menahem; Rosen, Sagee; Keilaf, Omer; Kinrot, Uri; Engelhardt, Kai; and Nir, Ittai 12313464 Cl. G01J 3/108.
NIRA Dynamics AB: See--
Magnusson, Per Olof Magnus; Jonsson, Lars William; and Eriksson, Lisa Ingegerd 12311952 Cl. B60W 40/06.
Nishi, Syuichi; Shiratsukayama, Yasumitsu; and Arita, Hisakazu, to DMG MORI CO., LTD. Processing machine 12311442 Cl. B22F 12/80.
Nishi, Takahiro: See--
Abe, Kiyofumi; Nishi, Takahiro; Toma, Tadamasa; Kanoh, Ryuichi; and Hashimoto, Takashi 12316869 Cl. H04N 19/52.
Sun, Hai Wei; Lim, Chong Soon; Li, Jing Ya; Teo, Han Boon; Kuo, Che-Wei; Wang, Chu Tong; Toma, Tadamasa; Nishi, Takahiro; Abe, Kiyofumi; and Kato, Yusuke 12316838 Cl. H04N 19/117.
Nishida, Kosuke; Otsuka, Atsushi; Nishida, Kyosuke; Asano, Hisako; Tomita, Junji; and Saito, Itsumi, to NIPPON TELEGRAPH AND TELEPHONE CORPORATION Answer generating device, answer learning device, answer generating method, and answer generating program 12314659 Cl. G06F 40/20.
Nishida, Kyosuke: See--
Nishida, Kosuke; Otsuka, Atsushi; Nishida, Kyosuke; Asano, Hisako; Tomita, Junji; and Saito, Itsumi 12314659 Cl. G06F 40/20.
Nishida, Shuji; Yoshino, Masataka; Gao, Fagang; and Yamaguchi, Hiroshi, to JFE STEEL CORPORATION Ferritic stainless steel sheet and method for manufacturing the same 12312650 Cl. C21D 9/46.
Nishida, Takaaki: See--
Noda, Hiroki; and Nishida, Takaaki 12314062 Cl. G05D 1/2297.
Nishida, Tsubasa; to MURATA MANUFACTURING CO., LTD. Antenna device 12316031 Cl. H01Q 9/0414.
Nishide, Yosuke: See--
Iwawaki, Hironobu; Kamatani, Jun; Miyashita, Hirokazu; Yamada, Naoki; Nishide, Yosuke; Shiobara, Satoru; and Ohrui, Hiroki 12317746 Cl. H10K 85/6572.
Nishigawa, Takeshi; Ito, Jun; and Oda, Kohei, to Takemoto Oil & Fat Co., Ltd. Treatment agent for elastic fibers, and elastic fibers 12312738 Cl. D06M 13/17.
Nishikawa, Hideaki: See--
Nakamura, Akiko; Murase, Yoshiharu; Nishikawa, Hideaki; Yakabe, Taro; and Miyauchi, Naoya 12315696 Cl. H01J 37/20.
Nishikawa, Kenzo; to SONY INTERACTIVE ENTERTAINMENT INC. Information processing apparatus and device position estimation method 12314486 Cl. G06F 3/0346.
Nishikawa, Kenzo; to SONY INTERACTIVE ENTERTAINMENT INC. Information processing apparatus, device speed estimation method, and device position estimation method 12314487 Cl. G06F 3/0346.
Nishikawa, Ryosuke; to RISO KAGAKU CORPORATION Liquid supply apparatus 12311673 Cl. B41J 2/17596.
Nishikawara, Riichi; to SUMITOMO CONSTRUCTION MACHINERY CO., LTD. Excavator 12312773 Cl. E02F 9/2292.
Nishimaki, Hirokazu: See--
Ogata, Hiroto; Nishimaki, Hirokazu; Nakajima, Makoto; Mitsutake, Yuki; and Hattori, Hayato 12313972 Cl. G03F 7/11.
Nishimiya, Satoshi: See--
Takegoshi, Katsuya; Nishimiya, Satoshi; Muta, Hiroki; Hatano, Teruki; Watanabe, Yoshimi; and Koga, Hibiki 12315308 Cl. G07C 5/008.
Nishimura, Noboru: See--
Nagai, Asumi; Nishimura, Noboru; and Yamaguchi, Hirofumi 12315757 Cl. H01L 21/68757.
Nishimura, Takumi: See--
Tada, Minoru; Shirata, Mitsuyuki; and Nishimura, Takumi 12313345 Cl. F28D 20/0034.
Nishimura, Tetsuya: See--
Arai, Kenta; Ebata, Daisuke; Kudo, Ryusuke; Mizushita, Masaki; Nishimura, Tetsuya; and Nakano, Haruka 12315657 Cl. H01B 7/0045.
Nishimura, Tomohiro; to FUJI ELECTRIC CO., LTD. Semiconductor module 12315771 Cl. H01L 23/295.
Nishimura, Yukiko: See--
Shimizu, Hidetoshi; Nakamaru, Yoshinobu; and Nishimura, Yukiko 12310946 Cl. A61K 31/4152.
Nishino, Hiromitsu: See--
Ishida, Jun; and Nishino, Hiromitsu 12311639 Cl. B32B 17/1066.
Nishino, Masafumi: See--
Ito, Koju; Kakinuma, Chihaya; Nishino, Masafumi; Mima, Shinji; Neville, Craig M; and Sundback, Cathryn A 12313625 Cl. G01N 33/5088.
Nishino, Wataru: See--
Kumagai, Yushi; Nishino, Wataru; Saito, Yutaka; and Kobayashi, Naoki 12312433 Cl. C08F 293/00.
Nishino, Yuki: See--
Sugie, Misaki; and Nishino, Yuki 12312481 Cl. C09D 11/324.
Nishio, Akihiko; and Doi, Hiroyuki, to NUVOTON TECHNOLOGY CORPORATION JAPAN Semiconductor device for power amplification 12317533 Cl. H10D 30/475.
Nishio, Akinori: See--
Nakaoku, Hiroshi; and Nishio, Akinori 12311472 Cl. B23K 26/702.
Nishio, Masashi; Wada, Yuji; Okada, Mamoru; and Shimizu, Eri, to Lenovo (Singapore) Pte. Ltd. Information processing apparatus and control method 12315412 Cl. G09G 3/20.
Nishio, Masashi; and Kosugi, Kazuhiro, to Lenovo (Singapore) Pte. Ltd. Information processing apparatus and control method 12315472 Cl. G09G 5/10.
Nishioka, Daisuke; to CANON KABUSHIKI KAISHA Image pickup apparatus suppressing flange back changes 12316937 Cl. H04N 23/54.
Nishioka, Takeaki: See--
Hayashi, Yuhei; Suzuki, Hiroshi; Kudo, Ichiro; Osawa, Hiroshi; Miyoshi, Yuki; and Nishioka, Takeaki 12316604 Cl. H04L 63/0236.
Nishitani, Yu: See--
Tsujita, Takuji; Nishitani, Yu; Nakura, Kensuke; Tsuruoka, Tohru; Terabe, Kazuya; and Su, Jin 12315877 Cl. H01M 10/0562.
Nishiuchi, Kazusa: See--
Abe, Koji; and Nishiuchi, Kazusa 12317661 Cl. H10H 20/857.
Nishiyama, Tadashi: See--
Mori, Takuya; Nishiyama, Tadashi; Kiyotomi, Akiko; and Tomita, Hiroshi 12314023 Cl. G05B 19/042.
Nishiyama, Yukinori: See--
Fujiwara, Shinya; Saito, Taro; Shimada, Tomoharu; Koguchi, Takehiro; and Nishiyama, Yukinori 12316958 Cl. H04N 23/64.
Nishizono, Akira: See--
Matsuoka, Shigeru; Katoh, Akira; Mishina, Tadashi; Yamada, Kentaro; Yoshimori, Atsushi; Ishizaki, Toshimasa; Nishizono, Akira; and Kouji, Hiroyuki 12310955 Cl. A61K 31/439.
NISSAN CHEMICAL CORPORATION: See--
Ogata, Hiroto; Nishimaki, Hirokazu; Nakajima, Makoto; Mitsutake, Yuki; and Hattori, Hayato 12313972 Cl. G03F 7/11.
NISSAN MOTOR CO., LTD.: See--
Bezeault, Loic; and Law, Robin 12312011 Cl. B62D 25/14.
Ito, Yui; and Sawada, Akira 12311775 Cl. B60L 15/20.
Musha, Yusuke; Suzuki, Yasuhiro; and Takeda, Muku 12315050 Cl. G06T 11/203.
Uwabo, Kazuyuki; and Taira, Yasuhisa 12311937 Cl. B60W 30/143.
NISSAN NORTH AMERICA, INC.: See--
Dey, Debraj 12311743 Cl. B60J 5/0456.
NISSEI ELECTRIC CO., LTD.: See--
Noda, Mineyuki; Yabe, Hiromasa; Kikuchi, Hideki; Miyamoto, Kei; and Suzuki, Kota 12313191 Cl. F16L 11/12.
Nistler, Jürgen: See--
Schneider, Rainer; Nistler, Jürgen; Lazar, Razvan; and Biber, Stephan 12313712 Cl. G01R 33/3852.
Niswander, Randy: See--
Carter, Donald G. R.; and Niswander, Randy 12313378 Cl. F41G 11/008.
Nitiyanandan, Rajeshwar: See--
Apfel, Christian; Maestri, Chiara; Nitiyanandan, Rajeshwar; Chandrakesan, Parthasarathy; and Parker, Ricardo Jerome 12312631 Cl. C12Q 1/06.
Nitta, Koji; and Teraoka, Hiroyuki, to AAC Optics (Changzhou) Co., Ltd. Camera lens 12313821 Cl. G02B 13/0045.
Nitto Denko Corporation: See--
Adami, Roger; Wang, Yuwei; Yin, Haiqing; Wang, Liping; Liu, Dong; and Ying, Wenbin 12311055 Cl. A61K 9/19.
Murashige, Takeshi; Inagaki, Junichi; Hosokawa, Kazuhito; Nakai, Kota; and Kanno, Toshihiro 12311645 Cl. B32B 3/14.
Takimoto, Kenya; Shibata, Naoki; and Takakura, Hayato 12317424 Cl. H05K 3/244.
Yano, Youzou; and Takahashi, Takumi 12317435 Cl. H05K 5/0213.
NITTO KASEI CO., LTD.: See--
Nakagawa, Yuya; and Imakura, Yasuo 12312464 Cl. C08L 71/02.
NITTO SHINKO CORPORATION: See--
Fujii, Takaaki; Hirata, Shun; and Yamada, Takaaki 12312503 Cl. C09J 153/02.
Nittur, Pavan: See--
Mutalik, Sripurna; Shetty, Manith; Kanukotla, Anuradha; Agrawal, Sumeen; Mutyala, Narendra; Moorthy, Naresh Kumar Narasimma; Nittur, Pavan; Gupta, Mayank; and Jung, Kwanjin 12315028 Cl. G06T 1/20.
Nitzberg, Mark Jay: See--
Groth, Olaf Jonny; Nitzberg, Mark Jay; Kalia, Manu; Straube, Tobias Christopher; and Zehr, Daniel A 12314353 Cl. G06F 21/31.
Niu, Guowei; Zhou, Dan; and ZF WIND POWER (TIANJIN) CO., LTD., to ZF Wind Power Antwerpen N.V. Lubricating mechanism for planetary gear train 12313158 Cl. F16H 57/0482.
Niu, Huaning: See--
Sun, Haitong; Ye, Chunxuan; Zhang, Dawei; He, Hong; Niu, Huaning; Fakoorian, Seyed Ali Akbar; Zeng, Wei; and Zhang, Yushu 12317283 Cl. H04W 72/23.
Niu, Huaning; Zhang, Dawei; Zeng, Wei; Sun, Haitong; Zhang, Yushu; He, Hong; Oteri, Oghenekome; Yang, Weidong; Fakoorian, Seyed Ali Akbar; Ye, Sigen; and Ye, Chunxuan, to Apple Inc. Multiple transmission reception point (mTRP) enhancement in unlicensed 12317322 Cl. H04W 74/0816.
Niu, Jinfei; Xuan, Minghua; Zhang, Can; Wang, Can; Cong, Ning; Zhang, Jingjing; and Bai, Xiao, to BOE Technology Group Co., Ltd. Pixel circuit, drive method therefor, display substrate, and display device 12315430 Cl. G09G 3/32.
Niu, Wei: See--
Sun, Nicholas; Keung, Phillip H.; Luo, Fan; and Niu, Wei 12315498 Cl. G10L 15/1815.
Niu, Yanchun: See--
Huang, Yiping; Zhan, Dingpeng; Niu, Yanchun; He, Chao; and Zhang, Lu 12316145 Cl. H02J 7/00045.
Niu, Zhengrong: See--
Li, Bo; Feng, Haitao; Dong, Yaping; Li, Xinqian; Li, Shuqi; Niu, Zhengrong; and Li, Wu 12312698 Cl. C25B 1/24.
Niv, Eva: See--
Baras, Dorit; Dekel, Eyal; and Niv, Eva 12315166 Cl. G06T 7/11.
Niwa, Terutake: See--
Noguchi, Hiroshi; Niwa, Terutake; and Nakagawa, Akitoshi 12311319 Cl. B01D 63/0822.
Nix, Molly Castle; Chin, Sean; and Zhao, Dennis, to AURORA OPERATIONS, INC. Systems and methods to obtain feedback in response to autonomous vehicle failure events 12315315 Cl. G07C 5/0841.
Nixon, Mark J.: See--
Amaro, Jr., Anthony; and Nixon, Mark J. 12314037 Cl. G05B 19/41835.
Nixon, Thomas: See--
Wallace, Daniel T.; Schuh, Travis; Tanner, Neal; Nixon, Thomas; Hayes, Evelyn; and Gregg, Peter 12310688 Cl. A61B 34/30.
Niyikiza, Clet; and Moyo, Victor Mandla, to L.E.A.F. HOLDINGS GROUP LLC Alpha polyglutamated aminopterin and uses thereof 12310966 Cl. A61K 31/519.
NKT Photonics A/S: See--
Lyngsøe, Jens Kristian; Jakobsen, Christian; and Michieletto, Mattia 12313877 Cl. G02B 6/02328.
NLB, Corp.: See--
Wojciechowski, III, Donald Anthony 12313063 Cl. F04B 53/16.
No, Jong Seon; Lee, Joon Woo; Kim, Young Sik; and SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, to INDUSTRY-ACADEMIC COOPERATION FOUNDATION, CHOSUN UNIVERSITY Electronic device for delegating generation of homomorphic rotation key to server and method of operating the same 12316738 Cl. H04L 9/008.
No, Jong Seon; Lee, Joon Woo; Kim, Young Sik; and SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, to INDUSTRY-ACADEMIC COOPERATION FOUNDATION, CHOSUN UNIVERSITY Key management system for homomorphic encryption operation and method of operating the same 12316750 Cl. H04L 9/0825.
Noack, Stephan: See--
Tenhaef, Niklas; Noack, Stephan; Bruesseler, Christian; and Marienhagen, Jan 12312608 Cl. C12N 9/0006.
Noah-Navarro, Jonathan: See--
Taylor, Dwayne; Filipkowski, Matt; Gocho, Mika; Compton, Aaron; Belanger, Brian; and Noah-Navarro, Jonathan 12311724 Cl. B60H 1/00021.
Nobayashi, Kazuya; Tanaka, Shin; Oigawa, Makoto; Kodama, Shigeo; and Kawamoto, Tomoyuki, to Canon Kabushiki Kaisha Electronic device and control method to acquire distance information for detected object 12315179 Cl. G06T 7/55.
Nobbee, Wazir; Thrower, II, Jesse C.; Katsaros, James Dean; Costeux, Stephane; Neill, John; Lieburn, William Brian; and Thomas, Bryn, to DUPONT SAFETY & CONSTRUCTION, INC. Composite structural board and wall systems containing same 12312820 Cl. E04F 19/04.
Nobel Biocare Services AG: See--
Weitzel, Jörg; Abazi, Ramadan; and Bill, Oliver 12310806 Cl. A61C 1/142.
Noborisaka, Michiko: See--
Inoue, Hideya; Iwaoka, Toru; Noborisaka, Michiko; Hatori, Masayuki; and Hamada, Tomohide 12316950 Cl. H04N 23/631.
Nobuoka, Kosuke; to CANON KABUSHIKI KAISHA Image processing apparatus, image capturing apparatus, image processing method, and storage medium 12316928 Cl. H04N 23/11.
Nobuyasu, Seitaro: See--
Ito, Sho; and Nobuyasu, Seitaro 12316204 Cl. H02K 9/193.
Nocera, Tanya Marie: See--
McElroy, James Allen; Graham, Nadi Charlie; and Nocera, Tanya Marie 12310598 Cl. A61B 17/1325.
NOCTRIX HEALTH, INC.: See--
Charlesworth, Jonathan David; and Raghunathan, Shriram 12311175 Cl. A61N 1/36057.
Noda, Akihiro: See--
Maruyama, Yuki; Imagawa, Taro; Kusaka, Hiroya; and Noda, Akihiro 12315129 Cl. G06T 7/0004.
Noda, Hiroki; and Nishida, Takaaki, to HONDA MOTOR CO., LTD. Route data creation device and work machine 12314062 Cl. G05D 1/2297.
Noda, Mineyuki; Yabe, Hiromasa; Kikuchi, Hideki; Miyamoto, Kei; Suzuki, Kota; and NISSEI ELECTRIC CO., LTD., to CHEMOURS-MITSUI FLUOROPRODUCTS CO., LTD. Heat shrink tube and method for forming same 12313191 Cl. F16L 11/12.
Noda, Takeshi; Takenaka, Katsuro; Iwai, Haruki; and Sato, Daisuke, to Canon Kabushiki Kaisha X-ray image processing apparatus, x-ray diagnosis apparatus, method, and storage medium 12310782 Cl. A61B 6/585.
Nofen, Elizabeth; Gokhale, Shripad; Ross, Nick; Eitan, Amram; Ananthakrishnan, Nisha; Nickerson, Robert M.; Muthur Srinath, Purushotham Kaushik; Guo, Yang; Decker, John C.; and Li, Hsin-Yu, to Intel Corporation Microelectronics package comprising a package-on-package (POP) architecture with inkjet barrier material for controlling bondline thickness and POP adhesive keep out zone 12315777 Cl. H01L 23/373.
Nofsinger, Rebecca: See--
Johnson, Mary Ann; Allain, Leonardo R.; Eickhoff, W. Mark; Ikeda, Craig B.; Brown, Chad D.; Flanagan, Jr., Francis J.; Nofsinger, Rebecca; Marota, Melanie J.; Lupton, Lisa; Patel, Paresh B.; Xi, Hanmi; and Xu, Wei 12310953 Cl. A61K 31/4375.
Nogami, Keiji: See--
Kawabe, Toshiki; Oda, Yukio; Shima, Midori; Nogami, Keiji; and Ogiwara, Kenichi 12313638 Cl. G01N 33/86.
Nogami, Toshizo; Ouchi, Wataru; Lee, Taewoo; Suzuki, Shoichi; Nakashima, Daiichiro; Yoshimura, Tomoki; and Lin, Huifa, to SHARP KABUSHIKI KAISHA User equipments, base stations, and methods 12317293 Cl. H04W 72/231.
Nogimura, Ryo: See--
Nagai, Hiroki; Matsui, Takaaki; Nose, Takafumi; Isobe, Koichiro; Nogimura, Ryo; and Kanai, Kazuyuki 12315952 Cl. H01M 50/291.
Noguchi, Daisuke: See--
Hotsuki, Masaki; Shioda, Hideki; Noguchi, Daisuke; and Okuma, Yoshihito 12316041 Cl. H01R 13/2428.
Noguchi, Daisuke; Fujihara, Yoshimasa; Sugawara, Atsushi; Anno, Shintaro; and Miura, Satoshi, to FUJIFILM Business Innovation Corp. Electrostatic image developing toner and electrostatic image developer 12314003 Cl. G03G 9/08728.
Noguchi, Hiroki: See--
Lin, Shy-Jay; Lee, Chien-Min; Noguchi, Hiroki; Song, MingYuan; Huang, Yen-Lin; and Gallagher, William Joseph 12317513 Cl. H10B 61/22.
Noguchi, Hiroshi; Niwa, Terutake; and Nakagawa, Akitoshi, to MEIDENSHA CORPORATION Filtration membrane unit, holder holding same, filtration system including filtration membrane unit and holder, and filtration treatment apparatus including plurality of filtration systems 12311319 Cl. B01D 63/0822.
Noguchi, Kenta: See--
Gakuhari, Keiichi; Noguchi, Kenta; Taira, Kenji; and Yamamoto, Tsutomu 12316000 Cl. H01Q 13/16.
Noguchi, Koji: See--
Mizuhashi, Hiroshi; Kida, Yoshitoshi; and Noguchi, Koji 12314500 Cl. G06F 3/0412.
Noguchi, Takio: See--
Ajiri, Tadafumi; and Noguchi, Takio 12312238 Cl. C01B 21/0648.
Nogueira, Jonathan: See--
Ayers, Brandon Brent; Ben Haim, Lior; and Nogueira, Jonathan 12314697 Cl. G06F 8/61.
Noh, Hoondong: See--
Choi, Seunghoon; Kang, Jinkyu; Kim, Youngbum; Kim, Taehyoung; and Noh, Hoondong 12317269 Cl. H04W 72/21.
Noh, Jae Guk: See--
Lee, Jae Hoon; Kim, Young Hwan; Ryu, Hoon; and Noh, Jae Guk 12315884 Cl. H01M 10/0568.
Noh, Junyong: See--
Hong, Seokpyo; Noh, Junyong; Choi, Soojin; Kim, Chaelin; Cho, Kyungmin; and Kim, Jiyeon 12315058 Cl. G06T 13/40.
Noh, Minseok; Kwak, Jinsam; and Son, Juhyung, to WILUS INSTITUTE OF STANDARDS AND TECHNOLOGY INC. Method, apparatus, and system for physical channel transmission in unlicensed band 12317092 Cl. H04W 16/14.
Noh, Suncheol; Kim, Taegung; and Yun, Junwoo, to LG Display Co., Ltd. Display device 12315428 Cl. G09G 3/2096.
Noh, Wontae; and Lee, Jooho, to L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Step coverage using an inhibitor molecule for high aspect ratio structures 12312677 Cl. C23C 16/045.
Noh, Yujin; Ahn, Seung Hyeok; Choo, Seung Ho; Kang, Young-Hwan; Shin, Jungchul; Park, Tan Joong; and Kim, Daehong, to Senscomm Semiconductor Co., Ltd. Method and apparatus for supporting multiple user cascading sequence including A-PPDU in a wireless communication system 12316571 Cl. H04L 5/0053.
Nohara, Tomohiro: See--
Ohno, Katsuya; Nohara, Tomohiro; and Yokota, Teruaki 12310363 Cl. A01N 37/42.
Nojima, Kazuhiro; and Yuki, Kohei, to Kioxia Corporation Semiconductor memory device 12315564 Cl. G11C 16/0483.
Nojiri, Shota; Maneyama, Shiori; Izumi, Kazuki; and Kume, Takuya, to DENSO CORPORATION Vehicle notification control device and vehicle notification control method 12311837 Cl. B60Q 1/543.
NOK CORPORATION: See--
Eguchi, Nobuyuki 12313164 Cl. F16J 15/3212.
Inoue, Junpei; Goto, Noriyuki; Sakata, Yuichi; and Nagamatsu, Kento 12311471 Cl. B23K 26/702.
Inoue, Junpei; Goto, Noriyuki; Sakata, Yuichi; and Nagamatsu, Kento 12311477 Cl. B23K 37/0443.
Nokia Solutions and Networks Oy: See--
Bajzik, Lajos 12316521 Cl. H04L 43/106.
Chandramouli, Devaki; S Bykampadi, Nagendra; and Theimer, Thomas 12317077 Cl. H04W 12/068.
Dutta, Pranjal Kumar 12314719 Cl. G06F 9/30145.
Enrici, Andrea; Ait Aoudia, Faycal; and Lallet, Julien 12316692 Cl. H04L 65/61.
Ramachandran, Srilatha; Feki, Afef; Kadadi, Shivanand; and Mihailescu, Claudiu 12314826 Cl. G06N 20/00.
Tsiaflakis, Paschalis; Christodoulopoulos, Konstantinos; and Bidkar, Sarvesh Sanjay 12317013 Cl. H04Q 11/0067.
Nokia Technologies Oy: See--
Chandramouli, Devaki; and Casati, Alessio 12317215 Cl. H04W 60/005.
Goutay, Mathieu; Ait Aoudia, Faycal; and Hoydis, Jakob 12316454 Cl. H04L 1/16.
Hakola, Sami-Jukka; Schober, Karol; and Tiirola, Esa Tapani 12316569 Cl. H04L 5/0051.
Hviid, Jan; Portela Lopes De Almeida, Erika; Blücher Brink, Stig; Petersen, Karsten A.; Kiilerich Pratas, Nuno; and Christensen, Lars Holst 12317343 Cl. H04W 76/14.
Karjalainen, Juha Pekka; Koskela, Timo; Hakola, Sami-Jukka; Hulkkonen, Jari Yrjana; Arvola, Antti; Joshi, Satya Krishna; and Tolli, Antti 12317099 Cl. H04W 16/28.
Kucera, Stepan; and Khaled, Y. M. 12316602 Cl. H04L 61/5014.
Landais, Bruno; Pulipati, Narasimha Rao; and Khare, Saurabh 12316713 Cl. H04L 67/51.
Laselva, Daniela; Koskinen, Jussi-Pekka; and Lauridsen, Mads 12317227 Cl. H04W 68/02.
Mate, Sujeet Shyamsundar; Leppanen, Jussi Artturi; Eronen, Antti Johannes; Laaksonen, Lasse Juhani; and Lehtiniemi, Arto Juhani 12317056 Cl. H04S 7/30.
Pauli, Volker; and Berhanu Tesema, Fasil 12316422 Cl. H04B 7/0695.
Ratasuk, Rapeepat; Mangalvedhe, Nitin; Selvaganapathy, Srinivasan; Koskinen, Jussi-Pekka; and Robert, Michel 12317328 Cl. H04W 74/0833.
Turtinen, Samuli; and Wu, Chunli 12317332 Cl. H04W 74/0833.
Wang, Yonggang; Chao, Hua; and Lunttila, Timo Erkki 12316460 Cl. H04L 1/1812.
Xu, Xiang; Sebire, Benoist; Ali, Amaanat; Godin, Philippe; and Casati, Alessio 12317372 Cl. H04W 8/24.
Nolen, Jr., Jerry A.: See--
Rotsch, David; Nolen, Jr., Jerry A.; Song, Jeongseog; Chemerisov, Sergey D.; Bailey, James L.; and Kmak, Ronald T. 12315651 Cl. G21G 1/12.
NoLimits Enterprises, Inc.: See--
Dandrow, Jonathan; and Taylor, Robert Carson 12313763 Cl. G01S 7/022.
Nolin, Christian; Maltais-Larouche, Emile; Bourque, Yannick; Leclair, Alexandre; Laberge, Nicolas; and Gilbert, Andre, to BOMBARDIER RECREATIONAL PRODUCTS INC. Method for assembling motorcycles of a family of motorcycles and corresponding motorcycles 12312041 Cl. B62K 11/02.
Nolte, Christopher E.; to AHHFACTOR LLC Method for production and service of a rearrangeable mattress 12315000 Cl. G06Q 30/0631.
Noma, Daisuke: See--
Iba, Tatsuya; Ueno, Kentaro; and Noma, Daisuke 12311946 Cl. B60W 30/18127.
Nomi, Motoko; to OLYMPUS CORPORATION Objective optical system, image pickup apparatus,and endoscope 12313906 Cl. G02B 9/10.
NOMO INTERNATIONAL, INC.: See--
Ray, Kevin; Codreanu, Cristian; and Winer, Kris 12310696 Cl. A61B 5/0022.
Nomoto, Tazu: See--
Kiuchi, Atsuki; and Nomoto, Tazu 12314875 Cl. G06Q 10/04.
Nomura, Naruhiko: See--
Fujita, Soshi; Suzuki, Yuki; Fuda, Masahiro; Irikawa, Hideaki; Maki, Jun; Yoshikawa, Nobuo; and Nomura, Naruhiko 12311427 Cl. B21D 39/031.
Nomura Research Institute, Ltd.: See--
Yamada, Hiroyuki; Arai, Akira; and Morioka, Taro 12315011 Cl. G06Q 40/06.
Nomura, Seiya; to SCREEN Holdings Co., Ltd. Printing apparatus, printing method, printing program and recording medium 12311679 Cl. B41J 2/2121.
Nomura, Takumi: See--
Fukuoka, Daisuke; Okumura, Tomomi; Ootani, Yuuji; Kobayashi, Wataru; Nomura, Takumi; Mitsunaga, Tomoaki; Hirano, Takahiro; Sakai, Takamichi; and Oka, Kengo 12315825 Cl. H01L 23/562.
Nomura, Takuya: See--
Ebina, Futaro; and Nomura, Takuya 12317404 Cl. H05H 7/04.
Nomura, Yoshio; to Wacom Co., Ltd. Pen state detection circuit and method inhibiting unexpecterd results from periphery of touch sensor 12314516 Cl. G06F 3/04186.
Nomura, Yoshiyuki; to MURATA MANUFACTURING CO., LTD. Multilayer ceramic capacitor 12315678 Cl. H01G 4/012.
Nomura, Yusuke: See--
Fujisawa, Shigenobu; and Nomura, Yusuke 12312716 Cl. D03D 13/004.
Nonaka, Azuna: See--
Yamashita, Masashi; Ito, Tomoki; Kuribayashi, Tomonori; Koida, Keigo; Miwa, Satoshi; Komatsubara, Yoko; Watanabe, Katsuya; Nonaka, Azuna; and Makida, Ayumu 12313826 Cl. G02B 15/145523.
Nonaka, Tatsuki: See--
Tanabe, Jinichi; Nonaka, Tatsuki; and Yamabe, Atsushi 12311817 Cl. B60N 2/427.
Nonnenmacher, Jorg; and Major, Robert Drew, to DISH Network L.L.C. Systems and methods for adapting content items to secured endpoint media device data 12316896 Cl. H04N 21/266.
NOODOE GROUP INC.: See--
Hou, Yi-An; Huang, Ming-San; Shih, En-Yu; Liou, Yu-Ting; and Kung, Chun-Hung 12311798 Cl. B60L 53/67.
Noojin, Gary: See--
Bixler, Joel; Kiester, Allen; and Noojin, Gary 12313957 Cl. G03B 15/05.
Nordaa, Stig Magnor: See--
Purdy, Clay; Weissenberger, Markus; and Nordaa, Stig Magnor 12312533 Cl. C09K 8/528.
Nordang, Lars N.: See--
Schoon, Brad W.; Nordang, Lars N.; and Mueller, Paul D. 12310826 Cl. A61F 13/15707.
Nordbruch, Stefan: See--
Nicodemus, Rolf; and Nordbruch, Stefan 12315373 Cl. G08G 1/166.
Norden, Markus: See--
Quadir, Ahmedul; Johansson, Mats; and Norden, Markus 12317249 Cl. H04W 72/1263.
Nordex Energy SE & Co. KG: See--
Warzok, Felix; and Salaberri, Mikel 12312215 Cl. B66C 1/108.
Nordex Energy Spain S.A.U.: See--
Warzok, Felix; and Salaberri, Mikel 12312215 Cl. B66C 1/108.
Nordholm, Linus; Lennevi, Jerker; Karlsson, Robert; and Dutt, Devraj, to VOLVO TRUCK CORPORATION Method for thermal preconditioning a thermal buffer in a vehicle 12311736 Cl. B60H 1/00878.
Nordsell, Robert Anthony; and Chadha, Arvinder M., to Applied Materials, Inc. Reflective display devices and components 12313838 Cl. G02B 26/02.
Nordson Corporation: See--
Saidman, Laurence B; and Strong, Warren N. 12311326 Cl. B01F 27/2711.
Nordstrom, Matthew D.: See--
Derr, Kevin R.; Evans, Martin E.; Huang, Chin-Chen; Levy, Cassidy R.; Nordstrom, Matthew D.; Raffaele, Guillermo; and Kim, Hyo Young 12310457 Cl. A43C 11/1493.
Noriega-Padilla, Domingo: See--
Bailey, Richard St. Clair; Pothapragada, Siddartha; Mori, Koichi; Stolzenberg, Karen; Niles, Savannah; Noriega-Padilla, Domingo; and Heiner, Cole Parker 12315094 Cl. G06T 19/006.
Normalyze, Inc.: See--
Zhang, Yang; Agrawal, Ajay; and Ithal, Ravishankar Ganesh 12314288 Cl. G06F 16/285.
Normand, Chris L.: See--
Yohannes, Zekarias W.; Wilson, Matthew; Smith, David A.; and Normand, Chris L. 12311755 Cl. B60K 17/16.
Noro, Satoru: See--
Koyama, Yu; Matsuura, Mitsuyasu; Noro, Satoru; and Aoyama, Tetsuya 12313737 Cl. G01S 15/523.
Noroozi, Mehdi; Fayyaz, Mohsen; and Behrmann, Nadine, to ROBERT BOSCH GMBH Method for coding a sequence of video images 12315239 Cl. G06V 10/82.
Norp, Antonius: See--
Dimitrovski, Toni; Norp, Antonius; and Djurica, Miodrag 12317341 Cl. H04W 76/14.
Norrefeldt, Victor; Pathak, Arnav; and Riedl, Gerhard, to Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Reducing condensate precipitate on inner surfaces of an outer skin of an aircraft 12312090 Cl. B64D 13/06.
Norris, Leslie M.; to Flavorsense Dried flakes with active ingredients 12310379 Cl. A23B 2/94.
North Carolina State University: See--
Dewey, Ralph E.; and Lewis, Ramsey S. 12310324 Cl. A01H 6/823.
North, Stuart Richard: See--
Lindbo, Lars Sverker Ture; Ingram-Tedd, Andrew John; North, Stuart Richard; and Stadie, Robert Rolf 12312170 Cl. B65G 1/0464.
North, Travis: See--
Khosrowpour, Farzad; Markow, Mitchell; and North, Travis 12316511 Cl. H04L 41/5019.
North, Travis C.: See--
Hamlin, Daniel L.; Varma, Suraj M; and North, Travis C. 12314103 Cl. G06F 1/26.
North, Travis C.; and He, Qinghong, to DELL PRODUCTS LP System and method for thermally controlling a wax encapsulated antenna during burst transport 12315983 Cl. H01Q 1/002.
Northeastern University: See--
Zhang, Miao; Parang, Keykavous; Ibrahim, Naglaa; Nam, Young Woo; Bezprozvanny, Ilya; and Cui, Meng 12312333 Cl. C07D 403/04.
Zhang, Xiwei; Feng, Xiating; Xue, Chunyuan; and Shi, Lei 12314636 Cl. G06F 30/13.
Northen, Julian Scott: See--
Londesbrough, Derek John; Brown, Christopher; Northen, Julian Scott; Moore, Gillian; Patil, Hemant Kashinath; and Nichols, David E. 12312375 Cl. C07F 9/5728.
Northern Digital Inc.: See--
Chen, Larry; Zwambag, Derek Peter; White, Shaulaine; Balkos, Athanasios Tommy; Galea, Kirsten; and Willms, David Charles 12313867 Cl. G02B 5/136.
Northrop Grumman Systems Corporation: See--
Krafcik, John S.; and Weigel, Charles L. 12313389 Cl. F42C 15/184.
NORTHWESTERN POLYTECHNICAL UNIVERSITY: See--
Guo, Pengfei; Wu, Lin; Wang, Jiachang; Liu, Yansong; Lin, Xin; and Lan, Hongbo 12311458 Cl. B23H 3/08.
Northwestern University: See--
Lin, Wenwen; Chung, Duck Young; and Kanatzidis, Mercouri G. 12313796 Cl. G01T 1/241.
Notestein, Justin M.; Stair, Peter C.; and Yan, Huan 12311343 Cl. B01J 23/42.
Schiltz, Gary E.; and Wainwright, Derek A. 12311029 Cl. A61K 47/64.
Scott, Evan A.; Yi, Sijia; Engman, David; and Li, Xiaomo 12311054 Cl. A61K 9/1273.
Wang, Jeremy; Olvera de la Cruz, Monica; and Torkelson, John M. 12312262 Cl. C02F 1/56.
NORTIZ CORPORATION: See--
Ohigashi, Takeshi; Sugie, Shigeo; Wada, Norihide; Horiuchi, Kengo; and Shiotsu, Naoya 12313296 Cl. F24H 1/124.
NORTON (WATERFORD) LIMITED: See--
O′Neill, Brian Paul; Shah, Hardik Kirtikumar; Blair, Julian Alexander; Edlin, Chris David; and McKeon, Shane Michael 12310979 Cl. A61K 31/569.
Norvila, Charles Erle; Wilson, Stewart George; Rypstra, Scott; and Michaud, George James, to Beyond Energy Services and Technology Corp. Powered clamp assembly 12312899 Cl. E21B 33/085.
Nory, Ravikiran: See--
Nimbalker, Ajit; Nory, Ravikiran; Wager, Stefan; Orsino, Antonino; and Koorapaty, Havish 12317350 Cl. H04W 76/15.
Nose, Takafumi: See--
Nagai, Hiroki; Matsui, Takaaki; Nose, Takafumi; Isobe, Koichiro; Nogimura, Ryo; and Kanai, Kazuyuki 12315952 Cl. H01M 50/291.
Noskowicz, Christopher; to SWIFT ENGINEERING, INC. Systems and methods for aerodynamic deployment of wing structures 12312083 Cl. B64C 9/00.
Notaro, Douglas; Honda, Masahiro; Kendall, Mark; Yoh, Hiroshi; Martinez, Yenny Natali; Wang, Patrick; Flores, Roberto; and Ta, Timmy, to Goodman Manufacturing Company LP Systems and methods for air temperature control including A2L sensors 12313273 Cl. F24F 11/36.
Noteboom, Scott: See--
Huet, Jonathan; Marsal Perendreu, Julia; Montes Monteserin, David; and Noteboom, Scott 12317444 Cl. H05K 7/1489.
Notestein, Justin M.; Stair, Peter C.; and Yan, Huan, to Northwestern University Tandem catalysis for alkane and alcohol dehydrogenation coupled to selective hydrogen combustion 12311343 Cl. B01J 23/42.
Noto, Nicholas A.; Truong, Tipper; and Shilane, Philip N., to EMC IP Holding Company LLC Cold tiering microservice for deduplicated data 12314140 Cl. G06F 11/1453.
Notrica, Michael Andrew: See--
Oleson, Mark Arthur; Notrica, Michael Andrew; Johnston, Donald Taylor; Steszyn, Michael; Valois, Peter; Rueegger, Peter; and McMillan, Joseph 12310452 Cl. A43B 23/0205.
Noui, Louahab: See--
Reitterer, Joerg; Noui, Louahab; and Schoeffmann, Michael 12311622 Cl. B29D 11/00807.
Noujima, Masafumi: See--
Hasegawa, Mitsuru; Kimura, Tomonori; and Noujima, Masafumi 12312659 Cl. C22C 27/06.
Nouri, Joseph; and Strand, Kaden, to Hewlett-Packard Development Company, L.P. Synthetic timestamp compensating for skew between system clock and sensor clock 12314079 Cl. G06F 1/14.
NOVA SOUTHEASTERN UNIVERSITY, INC.: See--
Soloviev, Alexander V.; and Dean, Cayla W. 12313806 Cl. G01V 3/081.
Novaliq GmbH: See--
Wiedersberg, Sandra; Günther, Bernhard; and Scherer, Dieter 12310977 Cl. A61K 31/568.
NOVARTIS AG: See--
Deng, Haibing; Liu, Jinbiao; Oyang, Counde; Wang, Ce; Xiao, Qitao; Xun, Guoliang; and Zeng, Haiqiang 12312353 Cl. C07D 473/34.
NOVATEK Microelectronics Corp.: See--
Cheng, Huan-Teng 12315425 Cl. G09G 3/2096.
Liu, Chun-Yuan; Yeh, Yun-Hsiang; and Chen, Yen-Heng 12314493 Cl. G06F 3/0362.
Novelo Ascencio, Aldo Ivan Hand hygiene monitoring and user reinforcement at an intelligent hand hygiene device 12311072 Cl. A61L 2/24.
Novendstern, Max: See--
Blania, Alex; Novendstern, Max; Sippl, Philipp; Brendel, Christian; Herbig, Sandro; Wenus, Luis; and Nageswaran, Shravan 12314952 Cl. G06Q 20/40145.
Novocure GmbH: See--
Bomzon, Zeev; Naveh, Ariel; and Yesharim, Ofir 12311167 Cl. A61N 1/36002.
Hagemann, Carsten; Lohr, Mario; Kessler, Almuth F.; Burek, Malgorzata; Forster, Carola; Brami, Catherine; Hershkovich, Hadas Sara; and Voloshin-Sela, Tali 12311136 Cl. A61M 37/00.
Novostia SA: See--
Perrier, Philippe 12310844 Cl. A61F 2/2403.
Novus International, Inc.: See--
Van Lawrence, Bradley; and Buresh, Robert Edward 12310386 Cl. A23K 20/105.
Nowak, Olivia: See--
Staser, Brian H.; Hopman, Lisa Marie; VanDevender, Kevin; and Nowak, Olivia 12312848 Cl. E05D 15/165.
Noy, Aleksandr; Ho, Nga Thuy; Hummer, Gerhard; Siggel, Marc; LAWRENCE LIVERMORE NATIONAL SECURITY, LLC; and THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, to MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V. Nanotube-vesicle compositions and uses thereof 12311053 Cl. A61K 9/1271.
Nozaki, Kenji: See--
Matsumoto, Hayato; Sugimura, Shunsuke; Shibata, Takehiro; Hokari, Tomofumi; Yasuda, Yuichiro; Nozaki, Kenji; Komatsu, Tomotaka; Yamagoe, Yosuke; Kikuzawa, Ryohei; and Yamamoto, Kengo 12313016 Cl. F02D 41/042.
Nozdrin, Alexander: See--
Tudoran, Radu; Nozdrin, Alexander; Bortoli, Stefano; Hassan, Mohamad Al Hajj; Axenie, Cristian; Li, Hailin; and Brasche, Goetz 12314264 Cl. G06F 16/24568.
NSK LTD.: See--
Kobayashi, Daisuke 12313495 Cl. G01M 13/04.
Nsubuga, Hakimu: See--
Basheer, Chanbasha; and Nsubuga, Hakimu 12312259 Cl. C02F 1/46109.
NTK CUTTING TOOLS CO., LTD.: See--
Takeuchi, Yuki; Moteki, Jun; Takeuchi, Hiroki; Katsu, Yusuke; Hara, Yasushi; Fujii, Hidetoshi; and Morisada, Yoshiaki 12311461 Cl. B23K 20/1255.
NTT DOCOMO, INC.: See--
Asai, Hiroki; Kurasawa, Hisashi; and Isoda, Yoshinori 12314678 Cl. G06F 40/56.
Kakishima, Yuichi; Matsumura, Yuki; Furuta, Takayuki; and Oguma, Yuta 12317098 Cl. H04W 16/28.
Matsumura, Yuki; Takeda, Kazuki; and Nagata, Satoshi 12317300 Cl. H04W 72/535.
NTT Research, Inc.: See--
Khurana, Dakshita; and Waters, Brent 12316611 Cl. H04L 63/0428.
Wee, Hoeteck 12316759 Cl. H04L 9/088.
Nubis Communications, Inc.: See--
Winzer, Peter Johannes 12313893 Cl. G02B 6/443.
Winzer, Peter Johannes; Giles, Clinton Randy; de Valicourt, Guilhem; and Pupalaikis, Peter James 12313886 Cl. G02B 6/3608.
Nübl, Philipp: See--
Sinseder, Dominik; Nübl, Philipp; Weigl, Stefan; Voit, Stefan; Schöberl, Stefan; and Schmitt, Thomas 12313070 Cl. F04C 2/16.
NUCLEON CYBER LTD.: See--
Zavdi, Moran 12316659 Cl. H04L 63/1425.
Nuclera, Ltd.: See--
Chen, Michael Chun Hao; McInroy, Gordon Ross; Chen, Sihong; and Cook, Ian Haston 12312611 Cl. C12N 9/1264.
Nucleus Therapeutics Pty. Ltd.: See--
Campbell, James; Dubljevic, Valentina; Hansen, James; Rattray, Zahra; and Zhou, Jiangbing 12312417 Cl. C07K 16/44.
NuCurrent, Inc.: See--
Alam, Md. Nazmul; and Peralta, Alberto 12316137 Cl. H02J 50/23.
Singh, Vinit; and Frysz, Christine A. 12316128 Cl. H02J 50/005.
Nuhant, Philippe Marcel: See--
Gerstenberger, Brian Stephen; Flick, Andrew Christopher; Kung, Daniel Wei-Shung; Lombardo, Vincent Michael; Mousseau, James John; Nuhant, Philippe Marcel; Robinson, Jr., Ralph Pelton; Schmitt, Daniel Copley; Schnute, Mark Edward; Thorarensen, Atli; Trujillo, John Isidro; Unwalla, Rayomand Jal; and Wu, Huixian 12312344 Cl. C07D 413/14.
Nuhn, Malte: See--
Bakir, Gokhan H.; Bortnik, Marcin; Nuhn, Malte; and Ilangovan, Kavin Karthik 12314313 Cl. G06F 16/583.
Nuopponen, Markus: See--
Yliperttula, Marjo; Merivaara, Arto; Koivunotko, Elle; Manninen, Kalle; Valkonen, Sami; Nuopponen, Markus; and Paasonen, Lauri 12312604 Cl. C12N 5/0693.
NURO, INC.: See--
Divekar, Noopur; Yang, Tao; Mustufa, Heba; McLaughlin, Bryan; White, Paul; Sutarwala, Quresh; and Nambi, Prasanna 12311780 Cl. B60L 3/0046.
Nussbaum, Bryan R.: See--
Jordan, II, Jackie O.; Donovan, John; Turrentine, David; Wollenschlager, Torri; Nussbaum, Bryan R.; Stockweather, Deanna; Stoiber, Jeffrey W.; Markwardt, Kerstin; Carlson, Gail L.; Schiebel, Kyle C.; Winslow, Troy; Harr, Joseph P.; Wagner, Ellakate; Harris, Jr., Michael; and Sun, Jennylind 12314020 Cl. G05B 15/02.
Nutanix, Inc.: See--
Agarwal, Harshit; and Memon, Tabrez Parvez 12316702 Cl. H04L 67/1034.
Maturi, Mohan; Parab, Nitin; Taneja, Vidhi; and Gill, Binny Sher 12314696 Cl. G06F 8/60.
Nutman, Thomas B.: See--
Lustigman, Sara; Nutman, Thomas B.; and Bennuru, Sasisekhar 12311016 Cl. A61K 39/0003.
NUTRI'EARTH: See--
Defrize, Jerémy; Dormigny, Thomas; and Destailleur, Charles-Antoine 12310341 Cl. A01K 67/30.
NUTRITION & BIOSCIENCES USA 4, INC.: See--
Behabtu, Natnael; Harvey, Monica; Lenges, Christian Peter; and Beardsall, Ian Robert 12312722 Cl. D04H 1/587.
Nuvasive, Inc.: See--
Lin, Erika; Malik, Jeremy; Donahoe, Ryan; Stein, Christopher; and Hannah, David 12310862 Cl. A61F 2/4465.
NUVOTON TECHNOLOGY CORPORATION: See--
Li, Wen-Yi 12316277 Cl. H03B 5/364.
Tu, Yu-Hui 12314190 Cl. G06F 12/1408.
NUVOTON TECHNOLOGY CORPORATION JAPAN: See--
Nishio, Akihiko; and Doi, Hiroyuki 12317533 Cl. H10D 30/475.
NVIDIA CORPORATION: See--
Dogru, Selim; Sastry, Kumara; Swanson, John; and Singh, Vivek K. 12315131 Cl. G06T 7/0008.
Fetterman, Michael; Gadre, Shirish; Heinrich, Steven James; Stich, Martin; and Yin, Liang 12314175 Cl. G06F 12/0802.
Ganju, Siddha 12316397 Cl. H04B 17/3913.
Golbus, Jason; Parsons, Chad; Twardowski, Kirk; Gupta, Lalit; Wang, Jesse; Lee, Ka Yun; Chen, Amy; Challa, Ramya; and Gupta, Karan 12315589 Cl. G11C 7/1048.
Goska, Benjamin; Albright, Ryan; Mecham, William Andrew; Weese, William Ryan; Carkin, Aaron Richard; and Thompson, Michael 12314451 Cl. G06F 21/70.
Kozlowski, Pawel; and Aizenshtein, Maksim 12315064 Cl. G06T 15/00.
Murat, Nuri Arar; Jiang, Hairong; Puri, Nishant; Shetty, Rajath; and Avadhanam, Niranjan 12314854 Cl. G06N 3/08.
Ouyang, Yaobin; and Lin, Nan 12315070 Cl. G06T 15/06.
Wu, Yonghai; Chen, Jianjun; Tang, Yongmao; Yang, Jing; and Feng, Wei 12316863 Cl. H04N 19/186.
NXP B.V.: See--
Acar, Mustafa; Freidl, Philipp Franz; Kamphuis, Antonius Hendrikus Jozef; Bergman, Jan Willem; and Mandamparambil, Rajesh 12315995 Cl. H01Q 1/48.
Elend, Bernd Uwe Gerhard; den Besten, Gerrit Willem; and van der Heijden, Rigor Hendrikus Lambertus 12316733 Cl. H04L 7/041.
Galtie, Franck; Schlagenhaft, Rolf Dieter; and Barrilado Gonzalez, Andres 12316683 Cl. H04L 63/205.
Hoogzaad, Gian; Crand, Olivier; Buytenhuijs, Robert Victor; and Bardy, Serge 12316291 Cl. H03G 3/3042.
Küchler, Wolfgang; Tertinek, Stefan; and Gruber, Andreas 12313766 Cl. G01S 7/0234.
McGowan, Robert Anthony 12314192 Cl. G06F 13/14.
Quax, Guido Wouter Willem 12316107 Cl. H02H 9/046.
Roudiere, Sylvain; Martinez, Vincent Pierre; and Salle, Didier 12313764 Cl. G01S 7/023.
Seemann, Jochen; Elend, Bernd Uwe Gerhard; and Muth, Matthias Berthold 12314203 Cl. G06F 13/4004.
Singh, Chanpreet; Herrmann, Stephan Matthias; Naidu, Sharath Subramanya; Sharma, Nikhil; Jha, Bhagwan Babu; and Kumar, Maninder 12316981 Cl. H04N 23/80.
Youn, Jihwan; Ravindran, Satish; van Sloun, Ruud; Wu, Ryan Haoyun; and Li, Jun 12313774 Cl. G01S 7/417.
NXP USA, Inc.: See--
de Jong, Gerben Willem; Bergervoet, Jozef Reinerus Maria; van der Heijden, Mark Pieter; and Elkassir, Bilal 12316283 Cl. H03F 1/3241.
Guarin Aristizabal, Gustavo Adolfo; and Steigemann, Mark 12313729 Cl. G01S 13/878.
Nyamwange, Elvis; to BANK OF AMERICA CORPORATION System and method for generating user identity based encrypted data files using capsule neural networks to prevent identity misappropriation 12314363 Cl. G06F 21/32.
Nycz, Jeffrey: See--
Fessler, Richard G.; Serbousek, Jon C.; Nycz, Jeffrey; and Serbousek, Jill A. 12310641 Cl. A61B 17/8605.
Nydam, Scott: See--
Hrecznyj, Michael; Azzouz, Michael M.; Nydam, Scott; and Kondrad, Marcos Silva 12311725 Cl. B60H 1/00264.
Nye, Katelyn Rose: See--
Tegzes, Pal; Herczeg, Zita; Yang, Hongxu; Kiss, Zoltan; Cziria, Balazs Peter; Dalal, Poonam; Baenen, Alec Joseph; Rao, Gireesha Chinthamani; Heckel, Beth Ann; Goswami, Pulak; Zhou, Dennis Wei; Avinash, Gopal Biligeri; Ferenczi, Lehel; and Nye, Katelyn Rose 12315158 Cl. G06T 7/0012.
Nygren, Aaron John; Gopalakrishnan, Karthik; and Liu, Tsun Ho, to Advanced Micro Devices, Inc. Read clock start and stop for synchronous memories 12315551 Cl. G11C 11/4076.
Nykänen, Henri: See--
Zilkie, Aaron John; Nykänen, Henri; Peters, Frank; Tsai, Charles Su-Chang; and Yu, Guomin 12313878 Cl. G02B 6/12004.
Nyquist, Sarah: See--
Aiden, Erez; Dudchenko, Olga; Aiden, Aviva; Stamenova, Elena; Batra, Sanjit Singh; Omer, Arina; Adastra, Per Aspera; Durand, Neva; Massenkoff, Maxim; Nyquist, Sarah; Tzen, Anthony; Lui, Christopher; Pham, Melanie; and Lander, Eric 12315601 Cl. G16B 5/10.