US 12,313,696 B2
Test load circuit
Kuo-Chan Hsu, Taoyuan (TW); Yun-Teng Shih, Taoyuan (TW); and Chia-Wei Lee, Taoyuan (TW)
Assigned to QUANTA COMPUTER INC., Taoyuan (TW)
Filed by Quanta Computer Inc., Taoyuan (TW)
Filed on Jan. 17, 2023, as Appl. No. 18/155,586.
Prior Publication US 2024/0241189 A1, Jul. 18, 2024
Int. Cl. G01R 31/40 (2020.01); G01R 31/319 (2006.01); G01R 31/3193 (2006.01)
CPC G01R 31/40 (2013.01) [G01R 31/31924 (2013.01); G01R 31/31932 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A test load circuit for testing a power supply comprising:
a test load configured to be electrically connected to a voltage source of the power supply;
a current sensor configured to detect an amount of current flowing through the test load;
an amplifier having an input and an output, the input being electrically connected to the test load, the amplifier being configured to amplify a voltage across the current sensor to generate a feedback signal at the output of the amplifier, the voltage across the current sensor being proportional to the test load current such that the voltage of the feedback signal is associated with the test load current; and
a processing device including:
a processing unit configured to generate a command signal having a voltage that is associated with a target current through the test load, and
a comparator having:
a first input electrically connected to the output of the amplifier to receive feedback signal,
a second input electrically connected to the processing unit to receive the command signal, and
an output electrically connected to the test load, the output having a voltage that is based at least in part on a current difference between the target current and the test load current,
wherein the test load has a variable resistance that is controllable by the output of the comparator, and
wherein the processing unit is configured to receive a user input indicative of the target current and to adjust a voltage of the command signal based at least in part on the target current to adjust test load current and cause the test load current to match the target current.