US 12,313,567 B2
Detection method of crease degree of screen and visual detection apparatus
Yali Liu, Hubei (CN); and Yongzhen Jia, Hubei (CN)
Assigned to WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD., Wuhan (CN)
Filed by WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD., Hubei (CN)
Filed on May 30, 2024, as Appl. No. 18/678,928.
Application 18/678,928 is a continuation of application No. 17/621,237, granted, now 12,025,570, previously published as PCT/CN2021/133100, filed on Nov. 25, 2021.
Claims priority of application No. 202111361273.5 (CN), filed on Nov. 17, 2021.
Prior Publication US 2024/0310295 A1, Sep. 19, 2024
Int. Cl. G01N 21/95 (2006.01); G01N 21/88 (2006.01)
CPC G01N 21/9515 (2013.01) [G01N 21/8851 (2013.01); G01N 2021/8887 (2013.01); G01N 2021/9513 (2013.01); G01N 2201/063 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A detection method of a crease degree of a screen, comprising following steps:
providing detection rays, and obliquely irradiating the detection rays onto a surface to be measured of the screen;
acquiring detection rays reflected by the surface to be measured of the screen to obtain a corresponding light source reflection image;
analyzing the light source reflection image to obtain deformation curvatures of the light source reflection image and taking one of a maximum deformation curvature and an average deformation curvature that are obtained through the deformation curvatures as an evaluation index of a crease degree of the screen, comprising:
obtaining the deformation curvatures of the light-spot stripes in the light source reflection image by an image algorithm; and
calculating the average deformation curvature, wherein the average deformation curvature is the evaluation index of the crease degree of the screen; and
evaluating the crease degree of the screen.