US 12,313,482 B2
Sensor system, sensing method, and program
Takeshi Mori, Osaka (JP); Toshio Yamazaki, Fukui (JP); Isao Hattori, Fukui (JP); and Hirotsugu Suzuki, Ishikawa (JP)
Assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
Appl. No. 17/919,470
Filed by Panasonic Intellectual Property Management Co., Ltd., Osaka (JP)
PCT Filed Feb. 8, 2021, PCT No. PCT/JP2021/004542
§ 371(c)(1), (2) Date Oct. 17, 2022,
PCT Pub. No. WO2021/215077, PCT Pub. Date Oct. 28, 2021.
Claims priority of application No. 2020-075698 (JP), filed on Apr. 21, 2020; and application No. 2020-115186 (JP), filed on Jul. 2, 2020.
Prior Publication US 2023/0204442 A1, Jun. 29, 2023
Int. Cl. G01L 1/26 (2006.01); G01L 25/00 (2006.01); G01P 21/00 (2006.01)
CPC G01L 1/26 (2013.01) [G01L 25/00 (2013.01); G01P 21/00 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A sensor system comprising:
a sensor element configured to output an electric signal corresponding to an external force;
a signal processing circuit configured to convert the electric signal coming from the sensor element into a signal having a certain signal format and output the signal thus converted;
a pseudo-signal correction circuit configured to correct a pseudo-signal outputted by the sensor element; and
a self-diagnosis input circuit,
the sensor element being configured to perform, when receiving a test signal, a self-diagnosis based on the test signal, and then output the pseudo-signal, which represents a result of the self-diagnosis,
the pseudo-signal correction circuit being configured to correct the pseudo-signal based on environment information about an environment where at least one of the sensor element or the signal processing circuit is located,
the self-diagnosis input circuit being configured to output the test signal,
the self-diagnosis input circuit including a power supply circuit configured to generate an output signal, a conversion circuit configured to generate the test signal based on the output signal coming from the power supply circuit, and an output control circuit configured to instruct the conversion circuit to output the test signal, and
the power supply circuit including a band gap circuit configured to reduce output fluctuation, due to change in temperature, of the output signal to be outputted by the power supply circuit.