US 12,312,527 B2
Housing of electronic device and method for manufacturing the same
Hyunsu Kim, Gyeonggi-do (KR); Goeun Kim, Gyeonggi-do (KR); Inkyu Kim, Gyeonggi-do (KR); Hyesun Park, Gyeonggi-do (KR); Heesung Lee, Gyeonggi-do (KR); Youngjun Heo, Gyeonggi-do (KR); and Youngsoo Jung, Gyeonggi-do (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Gyeonggi-do (KR)
Filed on Aug. 5, 2022, as Appl. No. 17/881,861.
Application 17/881,861 is a continuation of application No. PCT/KR2022/010323, filed on Jul. 15, 2022.
Claims priority of application No. 10-2021-0132115 (KR), filed on Oct. 6, 2021; and application No. 10-2021-0162219 (KR), filed on Nov. 23, 2021.
Prior Publication US 2023/0106005 A1, Apr. 6, 2023
Int. Cl. C09K 13/02 (2006.01); H05K 5/04 (2006.01)
CPC C09K 13/02 (2013.01) [H05K 5/04 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A housing of an electronic device, comprising,
a metal frame,
wherein a surface of the metal frame has:
a gloss value of 1 gloss unit (Gu) to 10 Gu, and
a maximum height of a plurality of irregularities disposed on the surface in a range between 0.1 μm to 2.3 μm, and a maximum depth of valleys between the plurality of irregularities in a range between 0.1 μm to 1.8 μm, from an average height, and
a number of the plurality of irregularities per unit area of 1 cm2 in a range between 90 to 200, wherein the surface of the metal frame has:
37000 to 50000 peaks per unit area of 1mm2 and wherein a root mean square gradient for the peaks is 2500 to 4000, and
wherein the metal frame comprises particles having particles within the range of 76 um and 142 um.