CPC H10B 43/27 (2023.02) [H01L 23/5283 (2013.01); H01L 27/0207 (2013.01); H01L 29/167 (2013.01); H01L 29/47 (2013.01); H01L 29/7827 (2013.01); H01L 29/792 (2013.01); H10B 43/10 (2023.02); H10B 43/20 (2023.02); H10B 41/10 (2023.02); H10B 41/20 (2023.02); H10B 53/20 (2023.02)] | 20 Claims |
1. A 3D semiconductor device, the device comprising:
a first level comprising a first single crystal layer and a memory control circuit, said memory control circuit comprising a plurality of first transistors;
a first metal layer overlaying said first single crystal layer;
a second metal layer overlaying said first metal layer;
a third metal layer overlaying said second metal layer;
a plurality of second transistors disposed atop said third metal layer;
a plurality of third transistors disposed atop said plurality of second transistors;
a fourth metal layer disposed atop said plurality of third transistors; and
a memory array comprising word-lines,
wherein said memory array comprises at least four memory mini arrays,
wherein each of said memory mini arrays comprises at least four rows by at least four columns of memory cells,
wherein at least one of said plurality of second transistors comprises a metal gate,
wherein each of said memory cells comprises at least one of said plurality of second transistors or at least one of said plurality of third transistors, and
wherein said memory control circuit comprises at least one digital to analog converter circuit.
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