US 11,991,457 B2
Inspection method and inspection apparatus
Shinya Nakashima, Kyoto (JP)
Assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
Filed by Panasonic Intellectual Property Management Co., Ltd., Osaka (JP)
Filed on Jul. 14, 2022, as Appl. No. 17/812,450.
Claims priority of application No. 2021-123121 (JP), filed on Jul. 28, 2021.
Prior Publication US 2023/0030308 A1, Feb. 2, 2023
Int. Cl. H04N 23/74 (2023.01); G01N 21/89 (2006.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); H04N 23/56 (2023.01); H04N 23/71 (2023.01)
CPC H04N 23/74 (2023.01) [G01N 21/89 (2013.01); G06T 7/001 (2013.01); G06T 7/60 (2013.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); H04N 23/56 (2023.01); H04N 23/71 (2023.01); G06T 2207/10152 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30148 (2013.01); G06V 2201/06 (2022.01)] 6 Claims
OG exemplary drawing
 
2. An inspection method for detecting an object included in an inspection body by imaging the inspection body by an inspection apparatus, the inspection apparatus including:
an illumination device configured to emit first light in a first wavelength band, second light in a second wavelength band, and reference light in a reference wavelength band overlapping with the first and second wavelength bands, wherein the first wavelength band and the second wavelength band do not overlap each other,
an imaging device configured to image the inspection body, and to output a pixel signal, and
an image processing device,
wherein the inspection method comprises:
emitting the first light, the second light, and the reference light to the inspection body at timings different from each other in one imaging time using the illumination device;
calculating a first reflectance that is a reflectance of the object in the first wavelength band and a second reflectance that is a reflectance of the object in the second wavelength band based on the pixel signal using the image processing device; and
determining physical properties of the object based on the first reflectance and the second reflectance using the image processing device,
wherein a first image is defined as an extracted image of the object by the first light, a second image is defined as an extracted image of the object by the second light, and a reference image is defined as an extracted image of the object by the reference light, and
wherein, when the object is one of a plurality of objects present in an inspection body, the inspection method further comprising:
generating the second image by subtracting a feature quantity of the first image from a feature quantity of the reference image using the image processing device; or
generating the first image by subtracting a feature quantity of the second image from the feature quantity of the reference image using the image processing device.