| CPC H03K 19/195 (2013.01) [G06N 10/00 (2019.01)] | 19 Claims |
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1. A method comprising:
measuring qubit device parameters for a plurality of qubit devices in a quantum processor circuit, the plurality of qubit devices comprising a fixed-frequency qubit device and a tunable qubit device;
measuring a frequency shift of the tunable qubit device under an operating condition, the operating condition comprising a flux modulation applied to the tunable qubit device;
measuring a coherence time of the tunable qubit device under the operating condition;
selecting initial gate parameters of a two-qubit quantum logic gate for application to a pair of qubits defined by the fixed-frequency qubit device and the tunable qubit device, wherein the initial gate parameters are selected based on the frequency shift and the coherence time;
generating refined gate parameters from the initial gate parameters based on spectroscopic measurements of the two-qubit quantum logic gate applied to the quantum processor circuit; and
benchmarking the two-qubit quantum logic gate based on the refined gate parameters.
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