CPC H01J 37/22 (2013.01) [H01J 2237/2482 (2013.01); H01J 2237/2614 (2013.01)] | 15 Claims |
1. A system, comprising:
a transmission electron microscope (TEM) having a back focal plane;
a plurality of mirrors forming an optical cavity, a focal spot of the optical cavity positioned at the back focal plane of the TEM, the optical cavity positioned to allow an electron beam provided by the TEM to pass through the focal spot of the optical cavity, and the optical cavity being operable to admit a laser beam;
a laser with variable polarization angle of laser light coupled to the optical cavity and operable to provide a laser beam of a specified wavelength and the variable polarization angle to enter the optical cavity, the laser beam being reflected from the plurality of mirrors to provide a standing wave optical phase plate focused at the back focal plane of the TEM to cause a modulation of the electron beam; and
an image plane of the TEM positioned to receive the electron beam modulated by the standing wave optical phase plate, to form an image according to the variable polarization angle.
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