US 11,989,872 B2
Modular optical inspection station
Samuel Bruce Weiss, Palo Alto, CA (US); and Anna-Katrina Shedletsky, Palo Alto, CA (US)
Assigned to Instrumental, Inc., Los Altos, CA (US)
Filed by Instrumental, Inc., Los Altos, CA (US)
Filed on Mar. 30, 2022, as Appl. No. 17/708,993.
Application 17/708,993 is a continuation of application No. 16/984,062, filed on Aug. 3, 2020, granted, now 11,321,824.
Application 16/984,062 is a continuation of application No. 15/653,040, filed on Jul. 18, 2017, granted, now 10,783,624, issued on Sep. 22, 2020.
Claims priority of provisional application 62/378,359, filed on Aug. 23, 2016.
Claims priority of provisional application 62/363,555, filed on Jul. 18, 2016.
Prior Publication US 2022/0222808 A1, Jul. 14, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G06T 7/90 (2017.01); G01B 11/02 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); H04N 5/76 (2006.01); H04N 9/82 (2006.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01); G01N 21/93 (2006.01); G01N 21/956 (2006.01); H05B 47/16 (2020.01)
CPC G06T 7/0004 (2013.01) [G01B 11/022 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); H04N 5/76 (2013.01); H04N 9/8205 (2013.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01); G01N 2021/8825 (2013.01); G01N 21/93 (2013.01); G01N 2021/95638 (2013.01); H05B 47/16 (2020.01)] 20 Claims
OG exemplary drawing
 
1. A system for recording images of parts for optical inspection comprising:
an enclosure defining an imaging volume and configured to receive a unit of a part comprising a surface of interest located proximal an image plane within the imaging volume;
an optical sensor defining a field of view directed toward the imaging volume;
a set of lighting modules configured to output light toward the image plane; and
a computer system configured to:
trigger a first lighting module, in the set of lighting modules, to illuminate the surface of interest on the unit of the part at a first angle of incidence relative to the surface of interest;
trigger a second lighting module, in the set of lighting modules, to illuminate the surface of interest on the unit of the part at a second angle of incidence, different from the first angle of incidence, relative to the surface of interest;
record a timeseries of images of the surface of interest from the optical sensor; and
detect a first surface defect on the surface of interest on the unit in a first image, in the timeseries of images, corresponding to illumination of the surface of interest at the first angle of incidence; and
extract a real dimension of a feature on the unit in a second image, in the timeseries of images, corresponding to illumination of the surface of interest at the second angle of incidence.