US 11,989,452 B2
Read-disturb-based logical storage read temperature information identification system
Ali Aiouaz, Bee Cave, TX (US); Walter A. O'Brien, III, Westborough, MA (US); and Leland W. Thompson, Tustin, CA (US)
Assigned to Dell Products L.P., Round Rock, TX (US)
Filed by Dell Products L.P., Round Rock, TX (US)
Filed on Jan. 21, 2022, as Appl. No. 17/581,785.
Prior Publication US 2023/0236761 A1, Jul. 27, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 3/06 (2006.01); G06F 12/10 (2016.01)
CPC G06F 3/0659 (2013.01) [G06F 3/0619 (2013.01); G06F 3/0673 (2013.01); G06F 12/10 (2013.01); G06F 2212/657 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A read-disturb-based logical storage read temperature identification system, comprising:
a global read temperature identification subsystem; and
at least one storage device coupled to the global read temperature identification subsystem, wherein each at least one storage device is configured to:
identify from at least one physical block in that storage device, read disturb information associated with a plurality of rows provided by the at least one physical block in that storage device;
determine a respective read temperature for each of the plurality of rows provided by the at least one physical block in that storage device that is based on the read disturb information identified for one or more of its adjacent rows;
generate a local physical storage read temperature map that associates each of the read temperatures with a respective physical storage index that identifies the row provided by the at least one physical block in that storage device for which that read temperature was determined;
map each of the read temperatures in the local physical storage read temperature map to one or more logical storage elements included in a logical-to-physical storage element mapping for that storage device to generate a local logical storage element read temperature map; and
provide the local logical storage element read temperature map to the global read temperature identification subsystem.