US 11,989,084 B2
Self-healing process control system
Paul Francis McLaughlin, Ambler, PA (US); and Christopher Paul Ladas, Doylestown, PA (US)
Assigned to HONEYWELL INTERNATIONAL INC., Charlotte, NC (US)
Filed by Honeywell International Inc., Morris Plains, NJ (US)
Filed on Sep. 23, 2020, as Appl. No. 16/948,565.
Prior Publication US 2022/0091922 A1, Mar. 24, 2022
Int. Cl. G06F 11/00 (2006.01); G05B 19/4155 (2006.01); G06F 9/455 (2018.01); G06F 11/07 (2006.01); G06F 11/16 (2006.01); G06F 11/20 (2006.01)
CPC G06F 11/0793 (2013.01) [G05B 19/4155 (2013.01); G06F 9/45558 (2013.01); G06F 11/0727 (2013.01); G06F 11/073 (2013.01); G06F 11/0751 (2013.01); G06F 11/0778 (2013.01); G06F 11/1666 (2013.01); G06F 11/2028 (2013.01); G06F 11/2033 (2013.01); G05B 2219/31368 (2013.01); G06F 2009/45583 (2013.01)] 20 Claims
OG exemplary drawing
 
1. One or more hardware-based non-transitory memory devices storing computer-readable instructions which, when executed by one or more processors disposed in a computing device included in a self-healing control system, cause the computing device to:
monitor a logic block and a memory block included in a subset of the system to detect a fault condition of stuck bits related to the subset of the system, wherein the logic block and the memory block includes at least one of field-programmable logic (FPL), a field-programmable gate array (FPGA), or a system-on-chip device;
determine the subset of the logic block or the memory block that is impacted by the fault condition, wherein a node comprising the logic block or memory block impacted by the fault condition is determined to be a failed node in a fail state; and
swap the subset of the logic block or the memory block for a second logic block or a second memory block, the second logic block or the second memory block being capable of carrying out the functions of the subset of the logic block or the memory block;
disable the subset of the logic block or the memory block while the failed node is in the fail state;
automatically repair the subset of the logic block or the memory block impacted by the fault condition, wherein the repaired subset of the logic block or the memory block causes the failed node to return to an operational mode,
automatically repair the subset of the logic block or the memory block impacted by the fault condition, wherein the repaired subset of the logic block or the memory block causes the failed node to return to an operational mode, wherein automatically repair comprising at least one of manner:
provide power cycle upon a memory area in the memory block that identified the fault,
reset, by a repair module, to fix the failed node based on a user command,
reboot the failed node from the memory block to clear through memory subsystem power of one of the failed nodes by the repair module, and
repair a failed node with a stuck bit by resetting the memory and restoring a database; and
perform at least one action with respect to the subset of the logic block and the memory block comprising updating a fault log and/or an event log to record each action taken by the self-healing control system.