US 11,988,729 B2
Measuring device and measuring method
Norikazu Mizuochi, Kyoto (JP); and Ernst David Herbschleb, Kyoto (JP)
Assigned to KYOTO UNIVERSITY, Kyoto (JP); and SUMIDA CORPORATION, Tokyo (JP)
Appl. No. 17/761,065
Filed by Kyoto University, Kyoto (JP); and SUMIDA CORPORATION, Tokyo (JP)
PCT Filed Sep. 3, 2020, PCT No. PCT/JP2020/033470
§ 371(c)(1), (2) Date Mar. 16, 2022,
PCT Pub. No. WO2021/054141, PCT Pub. Date Mar. 25, 2021.
Claims priority of application No. 2019-168515 (JP), filed on Sep. 17, 2019.
Prior Publication US 2022/0349964 A1, Nov. 3, 2022
Int. Cl. G01V 3/00 (2006.01); G01N 24/00 (2006.01); G01R 33/32 (2006.01)
CPC G01R 33/323 (2013.01) [G01N 24/006 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A measuring device comprising:
an irradiation unit that irradiates a quantum sensor element with electromagnetic waves for operating an electron spin state of the quantum sensor element that changes due to interaction with a measurement target, in a pulse sequence in which a time τ between π/2 pulses is a variable value according to the intensity of a physical quantity of the measurement target; and
a physical quantity measuring unit that calculates the physical quantity of the measurement target based on the electron spin state after the interaction with the measurement target.