US 11,988,709 B2
System capable of detecting failure of component of system and method thereof
Lok Won Kim, Seongnam-si (KR)
Assigned to DEEPX CO., LTD., Seongnam-si (KR)
Filed by DEEPX CO., LTD., Seongnam-si (KR)
Filed on Dec. 27, 2021, as Appl. No. 17/562,979.
Claims priority of application No. 10-2020-0189414 (KR), filed on Dec. 31, 2020; and application No. 10-2021-0181082 (KR), filed on Dec. 16, 2021.
Prior Publication US 2022/0206068 A1, Jun. 30, 2022
Int. Cl. G01R 31/26 (2020.01); G01R 31/317 (2006.01); G06N 3/02 (2006.01)
CPC G01R 31/31701 (2013.01) [G01R 31/31713 (2013.01); G06N 3/02 (2013.01)] 27 Claims
OG exemplary drawing
 
1. A system capable of testing a component in the system during runtime, the system comprising:
a substrate;
a plurality of functional components on the substrate, at least one of the plurality of functional components including a circuitry;
a system bus in a form of electrically conductive patterns on the substrate that allow the plurality of functional components to communicate with each other;
one or more test wrappers, each of the one or more test wrappers being connected to at least one of the plurality of functional components; and
an in-system component tester (ICT) configured to:
select at least one functional component of the plurality of functional components as a component under test (CUT) in an idle state; and
test, via the one or more test wrappers, the at least one functional component selected as the CUT.