US 11,988,670 B2
Integrated sample processing system with multiple detection capability
Aaron Hudson, Northborough, MA (US); Takayuki Mizutani, Edina, MN (US); Subhasish Purkayastha, Acton, MA (US); and Thomas W. Roscoe, Prior Lake, MN (US)
Assigned to Beckman Coulter, Inc., Brea, CA (US); and DH Technologies Development Pte. Ltd., (SG)
Filed by BECKMAN COULTER, INC., Brea, CA (US); and DH TECHNOLOGIES DEVELOPMENT PTE. LTD., Singapore (SG)
Filed on Jul. 25, 2022, as Appl. No. 17/814,530.
Application 17/814,530 is a continuation of application No. 16/616,052, granted, now 11,402,386, previously published as PCT/US2018/033927, filed on May 22, 2018.
Claims priority of provisional application 62/607,773, filed on Dec. 19, 2017.
Claims priority of provisional application 62/509,601, filed on May 22, 2017.
Prior Publication US 2023/0011115 A1, Jan. 12, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G01N 33/68 (2006.01); G01N 27/624 (2021.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01)
CPC G01N 33/6848 (2013.01) [G01N 27/624 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/025 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method performed by a sample processing system comprising an analyzer, a mass spectrometer, a sample introduction apparatus, and a control system, the control system operatively coupled to the analyzer, the mass spectrometer, and the sample introduction apparatus, the method comprising:
performing, by the analyzer, a primary analysis of an analyte in a first processed sample aliquot derived from a first sample aliquot of a sample in a reaction vessel;
determining, whether a concentration of analyte in the first processed sample aliquot is below, above, or equal to a predetermined threshold;
transferring, by the sample introduction apparatus, a second processed sample aliquot derived from a second sample aliquot of the sample from the analyzer to the mass spectrometer; and
performing, by the mass spectrometer, a secondary analysis of the analyte or another analyte in the second processed sample aliquot in a secondary analysis.