US 11,988,565 B2
Process-insensitive sensor circuit
Ali Mesgarani, Sunnyvale, CA (US); Farzan Farbiz, Mountain View, CA (US); Ke Yun, San Jose, CA (US); Dusan Stepanovic, Mountain View, CA (US); Seyedeh Sedigheh Hashemi, Santa Clara, CA (US); and Mansour Keramat, Los Gato, CA (US)
Assigned to Apple Inc., Cupertino, CA (US)
Filed by Apple Inc., Cupertino, CA (US)
Filed on May 6, 2021, as Appl. No. 17/313,844.
Prior Publication US 2022/0357212 A1, Nov. 10, 2022
Int. Cl. G01K 7/14 (2006.01); G01K 7/16 (2006.01); H01L 21/66 (2006.01); G06F 1/20 (2006.01)
CPC G01K 7/16 (2013.01) [H01L 22/12 (2013.01); G01K 7/14 (2013.01); G06F 1/206 (2013.01)] 19 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a plurality of sensor circuits included in an integrated circuit, wherein the plurality of sensor circuits are configured to measure corresponding ones of a plurality of physical parameters of the integrated circuit, wherein at least two of the plurality of sensor circuits are configured to measure a respective different type of physical parameter; and
a control circuit configured to:
receive respective information indicative of the plurality of physical parameters;
in response to an activation of a calibration mode, generate a plurality of weights associated with a function that derives a temperature of the integrated circuit from the plurality of physical parameters; and
in response to an activation of a mission mode, evaluate the function using the function, the plurality of weights, and at least two different types of physical parameters of the plurality of physical parameters to determine a temperature value of the integrated circuit.