US 11,988,562 B2
Interferometer with at least one dispersive element
Scott Bloom, Encinitas, CA (US)
Assigned to SYSTEMS & TECHNOLOGY RESEARCH, LLC, Woburn, MA (US)
Filed by Systems & Technology Research, LLC, Woburn, MA (US)
Filed on Mar. 23, 2022, as Appl. No. 17/701,847.
Claims priority of provisional application 63/172,132, filed on Apr. 8, 2021.
Prior Publication US 2022/0326086 A1, Oct. 13, 2022
Int. Cl. G01J 9/02 (2006.01); G02B 5/30 (2006.01)
CPC G01J 9/0246 (2013.01) [G02B 5/3083 (2013.01); G01J 2009/0226 (2013.01); G01J 2009/0253 (2013.01); G01J 2009/0284 (2013.01)] 6 Claims
OG exemplary drawing
 
1. An interferometer for measuring a frequency shift in an input wave, the interferometer comprising:
(a) a splitter, the splitter reflecting a first portion of the input wave along a first path located within a first interferometer arm, the splitter transmitting a second portion of the input wave along a second path located within a second interferometer arm, wherein each of the first and second portions of the input wave are reflected back to the splitter to yield a recombined wave, the recombined wave producing an interference pattern; and
(b) a common dispersive element located within both the first path in the first interferometer arm and the second path in the second interferometer arm;
(c) wherein a shift in frequency of a wave transmitted through the dispersive element modifies the path within its corresponding interferometer arm, wherein a change in the path with an interferometer arm caused by a frequency shift in the input wave creates a corresponding phase change in the interference pattern, the corresponding phase change in the interference pattern being utilized to calculate the frequency shift in the input wave.