US 11,988,465 B2
Radiative cooling device and radiative cooling method
Masahiro Suemitsu, Osaka (JP); and Tadashi Saito, Osaka (JP)
Assigned to Osaka Gas Co., Ltd., Osaka (JP)
Appl. No. 17/260,742
Filed by Osaka Gas Co., Ltd., Osaka (JP)
PCT Filed Mar. 9, 2020, PCT No. PCT/JP2020/009989
§ 371(c)(1), (2) Date Jan. 15, 2021,
PCT Pub. No. WO2020/195743, PCT Pub. Date Oct. 1, 2020.
Claims priority of application No. 2019-060427 (JP), filed on Mar. 27, 2019; and application No. 2019-167164 (JP), filed on Sep. 13, 2019.
Prior Publication US 2021/0262745 A1, Aug. 26, 2021
Int. Cl. F28F 21/08 (2006.01); B32B 7/023 (2019.01); B32B 7/027 (2019.01); B32B 7/12 (2006.01); B32B 27/36 (2006.01); G02B 1/04 (2006.01); G02B 5/20 (2006.01); G02B 5/26 (2006.01)
CPC F28F 21/089 (2013.01) [B32B 7/023 (2019.01); B32B 7/027 (2019.01); B32B 7/12 (2013.01); B32B 27/36 (2013.01); G02B 1/04 (2013.01); G02B 5/208 (2013.01); G02B 5/26 (2013.01); B32B 2255/205 (2013.01); B32B 2307/732 (2013.01); F28F 2245/06 (2013.01)] 24 Claims
OG exemplary drawing
 
1. A radiative cooling device comprising an infrared radiative layer for radiating infrared light from a radiative surface and a light reflective layer disposed on the side opposite to the presence side of the radiative surface of the infrared radiative layer,
wherein the infrared radiative layer comprises a resin material layer having a thickness adjusted to discharge a greater thermal radiation energy than absorbed solar light energy in a wavelength band ranging from 8 μm to 14 μm, and
wherein the thickness of the resin material layer is adjusted to obtain:
light absorption characteristics that provide light absorbance equal to or less than 13% for a wavelength average from 0.4 μm to 0.5 μm, light absorbance equal to or less than 4% for a wavelength average from 0.5 μm to 0.8 μm, light absorbance equal to or less than 1% for a wavelength average from 0.8 μm to 1.5 μm, and light absorbance equal to or less than 40% for a wavelength average from 1.5 μm to 2.5 μm; and
heat emissivity characteristics of equal to or greater than 40% for wavelength average of the emissivity from 8 μm to 14 μm.