CPC C01G 15/006 (2013.01) [C01G 15/00 (2013.01); C04B 35/01 (2013.01); C04B 35/44 (2013.01); C04B 35/50 (2013.01); C23C 14/34 (2013.01); C23C 14/3414 (2013.01); H01B 1/08 (2013.01); C01P 2002/72 (2013.01); C01P 2006/10 (2013.01); C01P 2006/40 (2013.01); C04B 35/64 (2013.01); C04B 2235/3217 (2013.01); C04B 2235/3224 (2013.01); C04B 2235/3227 (2013.01); C04B 2235/3286 (2013.01); C04B 2235/3293 (2013.01); C04B 2235/6562 (2013.01); C04B 2235/6567 (2013.01); C04B 2235/764 (2013.01); C04B 2235/77 (2013.01); C04B 2235/80 (2013.01); C04B 2235/9638 (2013.01); H01J 37/3426 (2013.01); H01J 37/3429 (2013.01)] | 10 Claims |
1. An oxide semiconductor film obtained by sputtering a sputtering target, comprising an oxide sintered body, comprising:
a garnet phase represented by a general formula (I):
Ln3In2Ga3-XAlxO12 (I)
wherein,
Ln represents one or more metal elements selected from the group consisting of Nd and Sm X satisfies an expression 0≤X<3, and
a bixbyite phase represented by In2O3.
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