US 11,658,018 B2
Sample support body
Takayuki Ohmura, Hamamatsu (JP); and Masahiro Kotani, Hamamatsu (JP)
Assigned to HAMAMATSU PHOTONICS K.K., Hamamatsu (JP)
Appl. No. 16/647,426
Filed by HAMAMATSU PHOTONICS K.K., Hamamatsu (JP)
PCT Filed Aug. 3, 2018, PCT No. PCT/JP2018/029300
§ 371(c)(1), (2) Date Mar. 13, 2020,
PCT Pub. No. WO2019/058786, PCT Pub. Date Mar. 28, 2019.
Claims priority of application No. JP2017-181596 (JP), filed on Sep. 21, 2017.
Prior Publication US 2020/0273688 A1, Aug. 27, 2020
This patent is subject to a terminal disclaimer.
Int. Cl. H01J 49/04 (2006.01); B01L 3/00 (2006.01); G01N 27/623 (2021.01)
CPC H01J 49/0418 (2013.01) [B01L 3/50857 (2013.01); G01N 27/623 (2021.01); B01L 2300/0819 (2013.01); B01L 2300/0851 (2013.01)] 9 Claims
OG exemplary drawing
 
1. A sample support body comprising:
a substrate;
an ionization substrate disposed on the substrate; and
a support configured to support the ionization substrate with respect to the substrate such that a first surface of the ionization substrate which faces the substrate and the substrate are separated from each other,
wherein the ionization substrate has a plurality of measurement regions for dropping a sample on a second surface located on a side opposite to the first surface,
a plurality of through-holes that open in the first surface and the second surface are formed at least in the measurement regions of the ionization substrate,
a conductive layer is provided on peripheral edges of the through-holes at least on the second surface, and
the support has a first support provided on peripheral edges of the measurement regions on the first surface to separate the plurality of measurement regions when viewed in a direction in which the substrate and the ionization substrate face each other.