CPC G11C 29/38 (2013.01)  17 Claims 
1. A method for testing a circuit, the method comprising:
performing, by a test engine, a test of bit write to a memory, the test comprising:
defining a set of bit write address bit groups and their respective decodes based on a set of input bits from an address to be tested of a memory location, wherein each respective decode comprises a multiinput, multioutput combination that converts a binary code of M input lines into one of N outputs, and wherein the set of input bits are taken from predetermined bit locations in the address;
generating an encoded binary number in a predetermined range of 1 to M based on the set of input bits from the address;
generating, from the encoded binary number, a decoded binary number in a predetermined range of 1 to N;
generating, from a bit pattern of the decoded binary number, a bit mask for the bit groups;
generating, from a bit pattern of the encoded binary number, expect data;
performing a bit write operation comprising a partial write to the address to store a sequence of bits, the sequence of bits selected using a predetermined bit pattern testing algorithm configured to test bit write capability;
reading a content of the address; and
comparing bits selected using the bit mask to the expect data.
