US 11,657,630 B2
Methods and apparatus for testing multiple fields for machine vision
Andrew Hoelscher, Somerville, MA (US); and Nathaniel Bogan, Natick, MA (US)
Assigned to Cognex Corporation, Natick, MA (US)
Filed by Cognex Corporation, Natick, MA (US)
Filed on Dec. 28, 2020, as Appl. No. 17/135,888.
Application 17/135,888 is a continuation of application No. 16/129,170, filed on Sep. 12, 2018, granted, now 10,878,299.
Prior Publication US 2021/0150288 A1, May 20, 2021
This patent is subject to a terminal disclaimer.
Int. Cl. G06V 30/24 (2022.01); G06T 7/73 (2017.01); G06V 20/64 (2022.01)
CPC G06V 30/2504 (2022.01) [G06T 7/75 (2017.01); G06V 20/653 (2022.01)] 20 Claims
OG exemplary drawing
 
1. A computerized method for testing a pose of a three-dimensional model to three-dimensional data, the method comprising:
storing a three-dimensional model, the three-dimensional model comprising a set of probes, each probe including data for an associated portion of the three-dimensional model;
receiving three-dimensional data of an object, the three-dimensional data comprising a set of data entries;
converting the three-dimensional data into a set of fields, comprising:
generating a first field comprising a first set of values, wherein each value of the first set of values is indicative of a first characteristic of an associated one or more data entries from the set of data entries; and
generating a second field comprising a second set of values, wherein each value of the second set of values is indicative of a second characteristic of an associated one or more data entries from the set of data entries, wherein the second characteristic is different than the first characteristic; and
testing a pose of the three-dimensional model with the set of fields to determine a score for the pose based on the set of probes and associated values of the first field, the second field, or both.