US 11,657,031 B2
Apparatus and method for generating data quality information of electric power equipment
Chung Hyo Kim, Daejeon (KR); Jun Churl Yoon, Daejeon (KR); Young Sung Lee, Daejeon (KR); Yong Hun Lim, Daejeon (KR); and Seong Ho Ju, Daejeon (KR)
Assigned to KOREA ELECTRIC POWER CORPORATION, Naju-si (KR)
Appl. No. 16/68,642
Filed by Korea Electric Power Corporation, Naju-si (KR)
PCT Filed Jun. 22, 2017, PCT No. PCT/KR2017/006565
§ 371(c)(1), (2) Date Jul. 6, 2018,
PCT Pub. No. WO2018/199386, PCT Pub. Date Nov. 1, 2018.
Claims priority of application No. 10-2017-0055152 (KR), filed on Apr. 28, 2017.
Prior Publication US 2021/0165775 A1, Jun. 3, 2021
Int. Cl. G06F 7/00 (2006.01); G06F 17/00 (2019.01); G06F 16/23 (2019.01); G06F 16/22 (2019.01); G01R 21/133 (2006.01); G06F 13/12 (2006.01)
CPC G06F 16/2358 (2019.01) [G01R 21/133 (2013.01); G06F 13/128 (2013.01); G06F 16/2282 (2019.01); G06F 16/2365 (2019.01)] 8 Claims
OG exemplary drawing
 
1. An apparatus for generating data quality information of electric power equipment, the apparatus comprising:
a data collector configured to receive a piece of measured data from electric power equipment; and
a quality value generator configured to include a logic circuit for generating a quality value based on a result of comparing the piece of measured data with set values stored in advance,
wherein the piece of measured data has an enumerated structure, and
the quality value corresponds to a quality value for a piece of measured data of a hierarchical structure,
wherein the pieces of measured data include a sequence number value, a measured time value, a measured value, and a data type value,
wherein the set values include a set data type value, a set minimum data value, a set maximum data value, a set minimum reference data value, a set maximum reference data value, a variable time, a variable value, and a set measurement period value, and
wherein the logic circuit includes
a first logic circuit for generating a type quality value based on a result of comparing the data type value with the set data type value;
a second logic circuit for generating a range quality value based on a result of comparing the measured value with the set maximum data value;
a third logic circuit for generating a reference quality value based on a result of comparing the measured value with the set maximum reference data value;
a fourth logic circuit for generating a varied quality value based on a result of comparing the time at which the measured value reaches the variable value with the variable time; and
a fifth logic circuit for generating an omitted quality value according to whether the measured value is updated for a period corresponding to the set measurement period value.