US 11,656,270 B2
Apparatus and method of testing electronic components
Chun-Hung Sun, Kaohsiung (TW); and Yi-Ting Liu, Kaohsiung (TW)
Assigned to ASE TEST, INC., Kaohsiung (TW)
Filed by ASE TEST, INC., Kaohsiung (TW)
Filed on May 9, 2019, as Appl. No. 16/408,328.
Prior Publication US 2020/0355738 A1, Nov. 12, 2020
Int. Cl. G01R 31/28 (2006.01); G06T 11/20 (2006.01)
CPC G01R 31/2834 (2013.01) [G06T 11/206 (2013.01)] 1 Claim
OG exemplary drawing
 
1. An apparatus, comprising:
a control unit; and
a memory including computer program code; and
wherein the memory and the computer program code are configured to, with the control unit, cause the apparatus to:
apply a first signal having a first value and a second signal having a second value to an electronic component and a receiving feedback signal for determining a first parameter;
apply the first signal having a third value and the second signal to the electronic component and receiving a feedback signal for determining a second parameter;
apply the first signal having a fourth value and the second signal to the electronic component if the first parameter is different from the second parameter and receiving a feedback signal for determining a third parameter, wherein a first difference exists between the third value and the first value, wherein a second difference exists between the fourth value and the first value; and
provide the first parameter, the second parameter, and the third parameter to a display device for displaying in a two-dimensional plot,
wherein at least 64 parameters are determined based on the first signal and the second signal before a test of the electronic component is completed.