US 11,656,198 B2
Sample support body
Takayuki Ohmura, Hamamatsu (JP); and Masahiro Kotani, Hamamatsu (JP)
Assigned to HAMAMATSU PHOTONICS K.K., Hamamatsu (JP)
Filed by HAMAMATSU PHOTONICS K.K., Hamamatsu (JP)
Filed on May 5, 2022, as Appl. No. 17/737,430.
Application 17/737,430 is a continuation of application No. 17/229,914, filed on Apr. 14, 2021, granted, now 11,360,049.
Application 17/229,914 is a continuation of application No. 16/644,743, granted, now 11,047,827, issued on Jun. 26, 2021, previously published as PCT/JP2018/031036, filed on Aug. 22, 2018.
Claims priority of application No. 2017-181597 (JP), filed on Sep. 21, 2017.
Prior Publication US 2022/0260528 A1, Aug. 18, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01N 27/62 (2021.01); H01J 49/04 (2006.01); G01N 27/623 (2021.01)
CPC G01N 27/623 (2021.01) [G01N 27/62 (2013.01); H01J 49/0418 (2013.01); H01J 49/0431 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A sample support body comprising:
an ionization substrate including a first surface and a second surface located on a side opposite to the first surface, the ionization substrate having a plurality of measurement regions for dropping a sample on the second surface; and
a marking that is provided on the second surface and that indicates boundaries of the plurality of measurement regions,
wherein a plurality of through-holes that open in the first surface and the second surface are formed at least in the measurement regions of the ionization substrate, and
a conductive layer is provided on peripheral edges of the through-holes at least on the second surface.