US 11,655,992 B2
Measuring system
Chun Hung Tsai, Kaohsiung (TW); and Hsuan Yu Chen, Kaohsiung (TW)
Assigned to ADVANCED SEMICONDUCTOR ENGINEERING, INC., Kaohsiung (TW)
Filed by Advanced Semiconductor Engineering, Inc., Kaohsiung (TW)
Filed on Feb. 13, 2018, as Appl. No. 15/895,701.
Prior Publication US 2019/0249891 A1, Aug. 15, 2019
Int. Cl. F24F 11/30 (2018.01); F24F 1/04 (2011.01); F24F 1/022 (2019.01); F24F 110/10 (2018.01); F24F 11/80 (2018.01); F24F 13/24 (2006.01)
CPC F24F 11/30 (2018.01) [F24F 1/022 (2013.01); F24F 1/04 (2013.01); F24F 11/80 (2018.01); F24F 2013/247 (2013.01); F24F 2110/10 (2018.01)] 20 Claims
OG exemplary drawing
 
1. A measuring system, comprising:
a temperature-variable container comprising:
a housing; and
a transparent plate disposed on the housing, the housing and the transparent plate together defining a space accommodating an object;
a first optical sensor unit disposed external to the temperature-variable container and configured to capture a plurality of local images respectively located on a plurality of local areas of the object through the transparent plate;
a second optical sensor unit disposed external to the temperature-variable container and configured to capture an image of an entire surface of the object through the transparent plate; and
an air conditioner configured to supply an air flow in a direction toward the transparent plate, wherein the air flow is supplied to mitigate a convection, generated by the increasing of a temperature of the space, between the first optical sensor unit and the transparent plate and between the second optical sensor unit and the transparent plate.