| CPC H10B 43/27 (2023.02) [H01L 23/528 (2013.01); H10B 43/10 (2023.02); H01L 21/02164 (2013.01); H01L 21/0217 (2013.01); H01L 21/02271 (2013.01); H01L 21/02532 (2013.01); H01L 21/02595 (2013.01); H01L 21/30604 (2013.01); H01L 21/31111 (2013.01); H10D 64/037 (2025.01); H10D 64/685 (2025.01); H10D 64/693 (2025.01)] | 20 Claims |

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1. A 3D semiconductor device, comprising:
a gate stack structure disposed on a substrate, and comprising a plurality of gate layers electrically insulated from each other;
a channel pillar disposed on the substrate, penetrating through the gate stack structure and comprising a curved surface;
a first conductive pillar and a second conductive pillar disposed on the substrate, electrically coupled to the channel pillar and penetrating through the gate stack structure, wherein the first conductive pillar and the second conductive pillar are physically separated from each other and are each connected to the channel pillar;
a charge storage structure disposed between each of the plurality of gate layers and the channel pillar;
an insulating pillar disposed between the first conductive pillar and the second conductive pillar, wherein the first conductive pillar and the second conductive pillar are physically separated from each other and electrically isolated by the insulating pillar; and
an insulating layer disposed within the channel pillar,
wherein a material of the insulating layer is different from a material of the insulating pillar.
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