US 12,309,499 B2
Inspection method and inspection apparatus
Shinya Nakashima, Kyoto (JP)
Assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
Filed by Panasonic Intellectual Property Management Co., Ltd., Osaka (JP)
Filed on Apr. 12, 2024, as Appl. No. 18/634,332.
Application 18/634,332 is a continuation of application No. 17/812,450, filed on Jul. 14, 2022, granted, now 11,991,457.
Claims priority of application No. 2021-123121 (JP), filed on Jul. 28, 2021.
Prior Publication US 2024/0276103 A1, Aug. 15, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. H04N 23/74 (2023.01); G01N 21/89 (2006.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); H04N 23/56 (2023.01); H04N 23/71 (2023.01)
CPC H04N 23/74 (2023.01) [G01N 21/89 (2013.01); G06T 7/001 (2013.01); G06T 7/60 (2013.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); H04N 23/56 (2023.01); H04N 23/71 (2023.01); G06T 2207/10152 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30148 (2013.01); G06V 2201/06 (2022.01)] 14 Claims
OG exemplary drawing
 
1. An inspection method for detecting an object included in an inspection body by imaging the inspection body by an inspection apparatus,
the inspection apparatus including
an illumination device that is capable of emitting first light in a first wavelength band and reference light in a reference wavelength band overlapping with the first wavelength band, and
an imaging device that images the inspection body, and outputs a pixel signal,
the inspection method comprising:
emitting, by the illumination device, the first light and the reference light to the inspection body at different timings in one imaging time; and
generating an image based on the pixel signal.