US 12,308,982 B2
Method and apparatus for indicating fault status
Desheng Sun, Shenzhen (CN); and Li Ding, Shenzhen (CN)
Assigned to HUAWEI TECHNOLOGIES CO., LTD., Shenzhen (CN)
Filed by HUAWEI TECHNOLOGIES CO., LTD., Guangdong (CN)
Filed on Oct. 16, 2023, as Appl. No. 18/487,877.
Application 18/487,877 is a continuation of application No. 17/542,353, filed on Dec. 3, 2021, granted, now 11,843,504.
Application 17/542,353 is a continuation of application No. PCT/CN2020/094203, filed on Jun. 3, 2020.
Claims priority of application No. 201910480929.1 (CN), filed on Jun. 4, 2019.
Prior Publication US 2024/0048438 A1, Feb. 8, 2024
Int. Cl. H04L 41/0654 (2022.01); H04L 1/24 (2006.01); H04L 41/0686 (2022.01); H04L 41/0893 (2022.01)
CPC H04L 1/24 (2013.01) [H04L 41/0654 (2013.01); H04L 41/0686 (2013.01); H04L 41/0893 (2013.01)] 25 Claims
OG exemplary drawing
 
1. A method, comprising:
determining, by a first device, a fault status of R receiving logical lances of the first device;
determining, by the first device, N alignment marker (AM) groups, wherein each of the N AM groups includes M pieces of alignment marker group lane (AMGL) information, and at least part of the M pieces of AMGL information includes first indication information indicating the fault status of the R receiving logical lances of the first device; and
sending, by the first device in an ith period of N periods, respectively, M pieces of AMGL information included in an ith AM group, to a second device over M transmitting logical lanes, the N periods being in a one-to-one correspondence with the N AM groups, the N AM groups being sent to the second device in the respective N periods, wherein M, N, and R are positive integers, and i is a positive integer greater than 0 and less than or equal to N.