US 12,308,081 B2
Configurable testing and repair system for non-volatile memory
Cheng-Yen Han, Zhubei (TW)
Assigned to iSTART-TEK INC., Zhubei (TW)
Filed by iSTART-TEK Inc., Zhubei (TW)
Filed on Jan. 31, 2024, as Appl. No. 18/428,471.
Claims priority of application No. 112202751 (TW), filed on Mar. 25, 2023.
Prior Publication US 2024/0321375 A1, Sep. 26, 2024
Int. Cl. G11C 29/12 (2006.01)
CPC G11C 29/12 (2013.01) 10 Claims
OG exemplary drawing
 
1. A configurable testing and repair system for a non-volatile memory, comprising:
a memory testing device capable of carrying a to-be-tested memory, the memory testing device being configured to perform a test operation on the to-be-tested memory to determine whether or not the to-be-tested memory is a to-be-repaired memory that needs to be repaired, and the memory testing device being configured to perform a diagnostic operation on the to-be-repaired memory, so as to generate defect data including a fault address and a fault data value;
a memory repair device capable of carrying the to-be-repaired memory, the memory repair device being configured to perform a repair operation on the to-be-tested memory according to the defect data; and
a control device connected to the memory testing device and the memory repair device, the control device being configured to control the memory testing device to perform the test operation and the diagnostic operation, and to control the memory repair device to perform the repair operation.