US 12,307,715 B2
Parameter calibration method and apparatus
Yilun Chen, Shenzhen (CN); and Han Li, Shenzhen (CN)
Assigned to SHENZHEN YINWANG INTELLIGENT TECHNOLOGIES CO., LTD., Shenzhen (CN)
Filed by Shenzhen Yinwang Intelligent Technologies Co., Ltd., Shenzhen (CN)
Filed on Jun. 30, 2022, as Appl. No. 17/854,506.
Application 17/854,506 is a continuation of application No. PCT/CN2019/129932, filed on Dec. 30, 2019.
Prior Publication US 2022/0358679 A1, Nov. 10, 2022
Int. Cl. G06K 9/00 (2022.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01)
CPC G06T 7/80 (2017.01) [G06T 7/73 (2017.01)] 22 Claims
OG exemplary drawing
 
1. A parameter calibration method, comprising:
generating a first calibration pattern for calibrating an image shooting device;
sending a first instruction, wherein the first instruction indicates a group of pose parameters of the image shooting device in a first time period, and wherein the group of pose parameters indicates a pose of the image shooting device;
sending a second instruction to the image shooting device, wherein the second instruction indicates a shooting occasion, a quantity of shooting times, or the shooting occasion and the quantity of shooting times of the image shooting device in the first time period;
obtaining, from the image shooting device, a shooting result resulting from a shot that is based on the first instruction and the second instruction, wherein the shooting result comprises at least a portion of the first calibration pattern;
extracting a quantity of feature points from the shooting result that correspond to a field of view of the image shooting device;
determining at least one sub-area comprised in the first calibration pattern;
performing uniformity adjustment on the quantity of feature points in the at least one sub-area; and
determining at least one intrinsic parameter of the image shooting device based on the shooting result.