US 12,307,323 B2
Authentication of identifiers by light scattering
Michael N. Kozicki, Phoenix, AZ (US)
Assigned to Arizona Board of Regents on behalf of Arizona State University, Scottsdale, AZ (US)
Appl. No. 18/701,030
Filed by Arizona Board of Regents on behalf of Arizona State University, Scottsdale, AZ (US)
PCT Filed Oct. 18, 2022, PCT No. PCT/US2022/047067
§ 371(c)(1), (2) Date Apr. 12, 2024,
PCT Pub. No. WO2023/069471, PCT Pub. Date Apr. 27, 2023.
Claims priority of provisional application 63/397,803, filed on Aug. 12, 2022.
Claims priority of provisional application 63/256,946, filed on Oct. 18, 2021.
Prior Publication US 2025/0005308 A1, Jan. 2, 2025
Int. Cl. G06K 7/10 (2006.01); G06K 7/14 (2006.01)
CPC G06K 7/10722 (2013.01) [G06K 7/1413 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of identifying a test pattern, the method comprising:
positioning a test pattern in the field of view of a first imaging device, wherein the test pattern is on a first substrate and comprises a first multiplicity of particles that reflect or emit light;
illuminating the test pattern with light from a first light source, wherein the light from the first light source defines a first test angle of incidence with respect to the first substrate and a first test azimuthal angle with respect to an optical axis of the first imaging device;
obtaining, with the first imaging device, a first test image of light reflected by the first multiplicity of particles, wherein the first test image comprises first indicia associated with the first test angle of incidence and the first test azimuthal angle; and
comparing the first test image with a first reference image of a reference pattern obtained by a second imaging device, wherein the reference pattern is on a second substrate and comprises a second multiplicity of particles that reflect light, and the first reference image comprises second indicia associated with the second alignment feature and is obtained by illuminating the reference pattern with light from a reference light source that defines a first reference angle of incidence with respect to the second substrate and a first reference azimuthal angle with respect to an optical axis of the second imaging device.