US 12,307,178 B2
Structural analysis for determining fault types in safety related logic
Shivakumar Shankar Chonnad, San Jose, CA (US)
Assigned to Synopsys, Inc., Sunnyvale, CA (US)
Filed by Synopsys, Inc., Mountain View, CA (US)
Filed on Feb. 24, 2022, as Appl. No. 17/680,226.
Claims priority of provisional application 63/153,779, filed on Feb. 25, 2021.
Prior Publication US 2022/0269846 A1, Aug. 25, 2022
Int. Cl. G06F 30/3323 (2020.01); G06F 11/22 (2006.01)
CPC G06F 30/3323 (2020.01) [G06F 11/221 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising:
obtaining circuit elements, a first observation point, and a first diagnostic point of a circuit design,
wherein the first observation point is at an output of a first circuit element of the circuit elements of the circuit design, and wherein the first diagnostic point is at an output of a first safety circuit device of the circuit design;
determining a first cone of influence including a first subset of the circuit elements based on the first observation point,
wherein the first subset of the circuit elements includes the first circuit element;
determining a first safety cone including a second subset of the circuit elements based on the first diagnostic point, wherein the first safety cone includes the first safety circuit device; and
determining a fault type associated with the circuit elements based on an intersection between the first cone of influence and the first safety cone.