US 12,306,731 B2
Evaluation of memory device health monitoring logic
Scott E. Schaefer, Boise, ID (US); Aaron P. Boehm, Boise, ID (US); Todd Jackson Plum, Boise, ID (US); Mark D. Ingram, Boise, ID (US); and Scott D. Van De Graaff, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Jan. 19, 2023, as Appl. No. 18/156,594.
Claims priority of provisional application 63/268,529, filed on Feb. 25, 2022.
Prior Publication US 2023/0315599 A1, Oct. 5, 2023
Int. Cl. G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/27 (2006.01); G06F 11/30 (2006.01)
CPC G06F 11/27 (2013.01) [G06F 11/0772 (2013.01); G06F 11/3037 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for evaluating health monitoring logic of a memory device, comprising:
identifying, at the memory device, a condition associated with a test mode of the memory device;
enabling, based on the identifying the condition associated with the test mode, the health monitoring logic of the memory device in a test mode configuration that corresponds to an expected output of the health monitoring logic; and
outputting, based on the enabling the health monitoring logic in the test mode configuration that corresponds to the expected output, an indication of a result of the health monitoring logic.