US 12,306,712 B2
Data storage device and method for identifying a failing area of memory based on a cluster of bit errors
Eran Sharon, Rishon Lezion (IL); Daniel J. Linnen, Naperville, IL (US); James Tom, Los Altos, CA (US); Nika Yanuka, Hadera (IL); Tomer Eliash, Kfar Saba (IL); Preston Thomson, Boise, ID (US); and Kirubakaran Periyannan, Santa Clara, CA (US)
Assigned to Sandisk Technologies, Inc., Milpitas, CA (US)
Filed by Western Digital Technologies, Inc., San Jose, CA (US)
Filed on Aug. 7, 2023, as Appl. No. 18/230,982.
Prior Publication US 2025/0053477 A1, Feb. 13, 2025
Int. Cl. G06F 11/07 (2006.01); G06F 11/10 (2006.01); G06F 11/30 (2006.01)
CPC G06F 11/102 (2013.01) [G06F 11/07 (2013.01); G06F 11/1068 (2013.01); G06F 11/3037 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A data storage device comprising:
a memory; and
a processor coupled with the memory and configured to:
track a number of failed bits in each of a plurality of sections of the memory;
determine whether the number of failed bits in a given section of the memory exceeds the number of failed bits in at least one other section of the memory by more than a threshold; and
in response to determining that the number of failed bits in the given section of the memory exceeds the number of failed bits in the at least one other section of the memory by more than the threshold, retire the given section of the memory.