US 12,306,598 B2
Information processing apparatus
Takazumi Kawai, Tokyo (JP)
Assigned to NEC CORPORATION, Tokyo (JP)
Appl. No. 17/295,986
Filed by NEC Corporation, Tokyo (JP)
PCT Filed Nov. 27, 2018, PCT No. PCT/JP2018/043592
§ 371(c)(1), (2) Date May 21, 2021,
PCT Pub. No. WO2020/110201, PCT Pub. Date Jun. 4, 2020.
Prior Publication US 2022/0004154 A1, Jan. 6, 2022
Int. Cl. G05B 13/04 (2006.01); G06N 5/04 (2023.01)
CPC G05B 13/048 (2013.01) [G06N 5/04 (2013.01)] 16 Claims
OG exemplary drawing
 
1. An information processing apparatus comprising:
a memory storing instructions; and
at least one processor configured to execute the instructions to perform processing comprising:
retrieving a model for determining values of parameters of a manufacturing facility so that a state of the manufacturing facility becomes optimal, wherein the state of the manufacturing facility as an objective variable of the model, and wherein the parameters of the manufacturing facility are explanatory variables of the model;
retrieving current values of the parameters of the manufacturing facility, from sensors that measure the current values;
for each parameter, calculating a change route of the parameter by which the value of the parameter should be changed over time starting from the current value of the parameter to reach an optimal value of the parameter at which the state of the manufacturing facility becomes optimal, using the model;
for each parameter, calculating a quantity of change of the state of the manufacturing facility due to change of the value of the parameter along the change route, using the model;
for each parameter, calculating a score as an integrated value of a partial derivative of the quantity of change of the state of the manufacturing facility due to change of the value of the parameter along the change route;
ranking the parameters of the manufacturing facility by absolute values of the calculated scores;
selecting the parameters for which the calculated scores are negative;
determining whether an influence of the selected parameters on the state of the manufacturing facility is smaller than a first threshold;
when the influence of the selected parameters on the state of the manufacturing facility is smaller than first threshold, determining optimal values of the selected parameters, as the values of the selected parameters after the current values of the selected parameters along the change route;
determining whether an improvement in the state of the manufacturing facility that would occur by setting the selected parameters to the optimal values is greater than a second threshold; and
when the improvement in the state of the manufacturing facility that would occur is greater than the second threshold, setting the selected parameters of the manufacturing facility to the optimal values.