US 12,306,424 B2
Metasurface-based imaging system, design method, and detector
Xiangang Luo, Chengdu (CN); Fei Zhang, Chengdu (CN); Mingbo Pu, Chengdu (CN); Ting Xie, Chengdu (CN); and Xiaoliang Ma, Chengdu (CN)
Assigned to THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES, Chengdu (CN)
Appl. No. 18/856,800
Filed by THE INSTITUTE OF OPTICS AND ELECTRONICS, THE CHINESE ACADEMY OF SCIENCES, Sichuan (CN)
PCT Filed Mar. 30, 2023, PCT No. PCT/CN2023/085142
§ 371(c)(1), (2) Date Oct. 14, 2024,
PCT Pub. No. WO2023/197884, PCT Pub. Date Oct. 19, 2023.
Claims priority of application No. 202210392652.9 (CN), filed on Apr. 15, 2022.
Prior Publication US 2025/0116801 A1, Apr. 10, 2025
Int. Cl. G02B 5/20 (2006.01); B82Y 20/00 (2011.01); G02B 1/00 (2006.01)
CPC G02B 5/206 (2013.01) [B82Y 20/00 (2013.01); G02B 1/002 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A metasurface-based imaging system, wherein the imaging system comprises
a quadratic-phase-based monolayer metasurface structure and a wavevector filter sequentially arranged in an optical axis direction, wherein
the quadratic-phase-based monolayer metasurface structure can achieve ±89° field-of-view imaging; the wavevector filter has a critical angle θt for a design wavelength of the imaging system; when an incident angle to the wavevector filter is greater than the critical angle θt, an incident wave cannot pass through the wavevector filter, and each position of the wavevector filter is equivalent to an aperture stop.