US 12,306,250 B2
Integrated circuit, an apparatus for testing an integrated circuit, a method for testing an integrated circuit and a computer program for implementing this method using magnetic field
Frank Mielke, Willich (DE)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by ADVANTEST CORPORATION, Tokyo (JP)
Filed on Dec. 2, 2022, as Appl. No. 18/074,249.
Application 18/074,249 is a continuation of application No. PCT/EP2021/052190, filed on Jan. 29, 2021.
Prior Publication US 2023/0099503 A1, Mar. 30, 2023
Int. Cl. G01R 31/319 (2006.01); G01R 31/3185 (2006.01)
CPC G01R 31/319 (2013.01) [G01R 31/318536 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An integrated circuit, comprising:
a functional circuit structure configured to provide a functionality; and
a test structure, coupled to the functional circuit structure, wherein the test structure is configured to set a signal to a test value, in response to a magnetic field impulse, to control a test of the functional circuit structure by the test structure.