US 12,306,150 B2
Sample measurement device and measurement sample identification method
Satoru Watanabe, Kyoto (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP)
Appl. No. 17/439,315
Filed by Shimadzu Corporation, Koyo (JP)
PCT Filed Dec. 25, 2019, PCT No. PCT/JP2019/050888
§ 371(c)(1), (2) Date Sep. 14, 2021,
PCT Pub. No. WO2020/194955, PCT Pub. Date Oct. 1, 2020.
Claims priority of application No. 2019-055567 (JP), filed on Mar. 22, 2019.
Prior Publication US 2022/0155270 A1, May 19, 2022
Int. Cl. G01N 30/86 (2006.01)
CPC G01N 30/8631 (2013.01) [G01N 30/8679 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A sample measurement device comprising:
a measurement unit including a chromatograph or a mass spectrometer configured to measure a sample containing a plurality of components according to a measurement condition including a plurality of parameters; and
a processor configured to acquire measurement data based on an output of the measurement unit;
wherein the processor is configured to:
acquire a distribution of a measurement quality indicator according to the measurement condition based on the measurement data;
generate a component identification indicator by estimating retention times for each of components based on the distribution of the measurement quality indicator and the parameters used when the sample is measured; and
identify a peak of each of the components in the measurement data based on the component identification indicator.