US 12,303,905 B2
Microscopic examination device and method of preparing a sample for microscopic examination
Sebastian Simmer, Bischoffen (DE); and Stefan Christ, Schoeffengrund (DE)
Assigned to LEICA MICROSYSTEMS CMS GMBH, Wetzlar (DE)
Filed by Leica Microsystems CMS GmbH, Wetzlar (DE)
Filed on May 5, 2021, as Appl. No. 17/308,764.
Claims priority of application No. 20174160 (EP), filed on May 12, 2020.
Prior Publication US 2021/0354145 A1, Nov. 18, 2021
Int. Cl. B01L 9/00 (2006.01); G02B 21/34 (2006.01)
CPC B01L 9/523 (2013.01) [B01L 9/54 (2013.01); G02B 21/34 (2013.01); B01L 2300/0829 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A microscopic examination device comprising:
a microscope and a sample preparation arrangement for preparing one or more samples to be examined in said microscope by pipetting one or more liquids into one or more sample receptacles for the one or more samples;
the sample preparation arrangement comprising a base, a receiving structure adapted to receive said one or more sample receptacles, a pipetting guide movably fixed or fixable in relation to the receiving structure; and
the pipetting guide comprising one or more pipette guiding structures positionable in relation to said one or more sample receptacles by pivoting the pipetting guide in relation to the base, wherein said one or more pipette guiding structures is or are positionable by pivoting the pipetting guide around one more axes, wherein said one or more axes include at least one of an axis normal to the base and an axis parallel to the base.