US 11,984,937 B2
Communication system with beam quality measurement
Chadi Khirallah, Tokyo (JP); Yuhua Chen, Tokyo (JP); Yassin Aden Awad, Tokyo (JP); Alberto Suarez, Tokyo (JP); and Robert Arnott, Tokyo (JP)
Assigned to NEC CORPORATION, Tokyo (JP)
Filed by NEC Corporation, Tokyo (JP)
Filed on Aug. 31, 2022, as Appl. No. 17/900,111.
Application 17/900,111 is a continuation of application No. 16/483,221, granted, now 11,476,957, previously published as PCT/JP2018/002678, filed on Jan. 29, 2018.
Claims priority of application No. 1701858 (GB), filed on Feb. 3, 2017; and application No. 1702281 (GB), filed on Feb. 10, 2017.
Prior Publication US 2022/0416918 A1, Dec. 29, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. H04B 17/309 (2015.01); H04B 7/06 (2006.01); H04W 24/10 (2009.01); H04W 36/00 (2009.01); H04W 36/30 (2009.01)
CPC H04B 17/309 (2015.01) [H04B 7/0695 (2013.01); H04W 24/10 (2013.01); H04W 36/0094 (2013.01); H04W 36/30 (2013.01)] 2 Claims
OG exemplary drawing
 
1. A method, performed by a communication device, the method comprising:
receiving measurement configuration information including a predetermined value and a parameter for defining a predetermined number of beams;
measuring a respective beam quality for each of a plurality of beams of a cell;
identifying M beams whose beam qualities are between a best beam quality among the respective beam quality for the each of the plurality of beams and a lower limit defined by the predetermined value; and
deriving a cell quality for the cell based on linear average of beam qualities of the M beams, and
wherein the M does not exceed the predetermined number of beams defined by the parameter.