US 11,984,181 B2
Systems and methods for evaluating integrity of adjacent sub blocks of data storage apparatuses
Srinivasan Seetharaman, Milpitas, CA (US); Sourabh Sankule, Bangalore (IN); and Piyush Girish Sagdeo, Santa Clara, CA (US)
Assigned to Western Digital Technologies, Inc., San Jose, CA (US)
Filed by Western Digital Technologies, Inc., San Jose, CA (US)
Filed on Jun. 28, 2019, as Appl. No. 16/457,166.
Prior Publication US 2020/0409808 A1, Dec. 31, 2020
Int. Cl. G11C 29/44 (2006.01); G06F 11/20 (2006.01); G11C 29/38 (2006.01); G11C 29/04 (2006.01)
CPC G11C 29/44 (2013.01) [G06F 11/2094 (2013.01); G11C 29/38 (2013.01); G06F 2201/82 (2013.01); G11C 2029/0409 (2013.01)] 23 Claims
OG exemplary drawing
 
1. A data storage apparatus, comprising:
a non-volatile memory, wherein:
the non-volatile memory includes a block comprising N wordlines physically partitioned on the block into a first sub-block and a second sub-block;
the first sub-block comprises a first subset of the N wordlines; and
the second sub-block comprises a second subset of the N wordlines different than the first subset; and
one or more processors, individually or in combination, configured to:
determine whether a failure has been detected in the first sub-block;
in response to determining that the failure has been detected in the first sub-block:
mark the second sub-block with an initial designation as a defective sub-block;
perform at least one test on the second sub-block to determine a usability of the second sub-block; and
mark, based on the at least one test, the second sub-block with a second designation that is one of a tested usable sub-block or a tested defective sub-block; and
in response to determining that the failure has not been detected in the first sub-block:
refrain from marking the second sub-block with the initial designation as a defective sub-block.