US 11,984,150 B2
Word line drivers for multiple-die memory devices
Fatma Arzum Simsek-Ege, Boise, ID (US); and Mingdong Cui, Folsom, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Aug. 23, 2022, as Appl. No. 17/821,646.
Prior Publication US 2024/0071466 A1, Feb. 29, 2024
Int. Cl. G11C 11/40 (2006.01); G11C 11/22 (2006.01); G11C 11/408 (2006.01); H01L 23/00 (2006.01); H01L 25/00 (2006.01); H01L 25/065 (2023.01); H01L 25/18 (2023.01)
CPC G11C 11/4085 (2013.01) [G11C 11/221 (2013.01); G11C 11/2257 (2013.01); G11C 11/2259 (2013.01); G11C 11/4087 (2013.01); H01L 24/08 (2013.01); H01L 24/80 (2013.01); H01L 25/0657 (2013.01); H01L 25/18 (2013.01); H01L 25/50 (2013.01); H01L 2224/08145 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01); H01L 2924/1431 (2013.01); H01L 2924/1436 (2013.01); H01L 2924/1441 (2013.01)] 25 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a first semiconductor die comprising a plurality of word line conductors arranged in a stack along a first direction away from a substrate of the first semiconductor die, each word line conductor of the plurality of word line conductors extending along a second direction over the substrate and operable to access a respective set of one or more memory cells of the first semiconductor die;
a second semiconductor die comprising a plurality of word line driver circuits, each word line driver circuit of the plurality of word line driver circuits operable to bias a respective word line conductor of the plurality of word line conductors based at least in part on a first word line decoder signal and a respective second word line decoder signal of a plurality of second word line decoder signals; and
a plurality of electrical contacts, each electrical contact of the plurality of electrical contacts coupling a respective word line conductor of the plurality of word line conductors with a respective word line driver circuit of the plurality of word line driver circuits.