US 11,982,998 B2
Manufacturing monitoring assistance device, manufacturing monitoring assistance method, and manufacturing monitoring assistance program
Masanori Kitaoka, Tokyo (JP); Hisashi Endou, Tokyo (JP); Nobuhiro Kakeno, Tokyo (JP); Hiroshi Yoshikawa, Tokyo (JP); and Toshihiro Yamada, Tokyo (JP)
Assigned to HITACHI, LTD., Tokyo (JP)
Appl. No. 17/413,417
Filed by HITACHI, LTD., Tokyo (JP)
PCT Filed Jan. 30, 2020, PCT No. PCT/JP2020/003328
§ 371(c)(1), (2) Date Jun. 11, 2021,
PCT Pub. No. WO2020/166346, PCT Pub. Date Aug. 20, 2020.
Claims priority of application No. 2019-024966 (JP), filed on Feb. 15, 2019.
Prior Publication US 2022/0057789 A1, Feb. 24, 2022
Int. Cl. G05B 19/418 (2006.01)
CPC G05B 19/41875 (2013.01) [G05B 19/41805 (2013.01); G05B 19/4183 (2013.01); G05B 19/41885 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A manufacturing monitoring assistance device comprising:
a memory;
an input device;
an output device; and
a processor communicatively coupled to the memory, the input device, and the output device, wherein the processor is configured to:
create a computation model in a case where a product as a sample is normal, based on a three-dimensional form acquired from the product,
wherein the product comprises a plurality of members welded together;
create a corrective computation model in a case where the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and to perform a simulation on each of the computation model and the corrective computation model; and
determine a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and cause the output device to display the determined method and the abnormality index,
wherein the manufacturing process comprises a welding process, and
wherein the processor accepts entries, by user, of a state of an abnormality in the product, a position of the abnormality in the product, a condition of occurrence of the abnormality, and a degree of importance of the abnormality in association with a sort of the product, and regards the accepted state of the abnormality as the sample of the abnormal portion.