US 11,982,802 B2
Device and method for performing total internal reflection scattering measurement
Cheng-An Lin, Taoyuan (TW); Tzu-Yin Hou, Yunlin County (TW); You-Wei Li, Yilan County (TW); Yuh-Show Tsai, New Taipei (TW); and Ming-Chen Wang, Taoyuan (TW)
Assigned to Chung Yuan Christian University, Taoyuan (TW)
Filed by Chung Yuan Christian University, Taoyuan (TW)
Filed on Mar. 31, 2022, as Appl. No. 17/710,103.
Prior Publication US 2023/0314786 A1, Oct. 5, 2023
Int. Cl. G02B 21/34 (2006.01); G02B 21/06 (2006.01); G01N 21/47 (2006.01)
CPC G02B 21/34 (2013.01) [G02B 21/06 (2013.01); G01N 21/47 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A device for performing a total internal reflection scattering (TIRS) measurement to a sample slide under a microscope, comprising:
a first reflective plate having a first opening;
a second reflective plate having a second and at least one third openings and disposed above the first reflective plate thereby defining a slot therebetween for accommodating the sample slide, wherein the first opening of the first reflective plate is disposed directly underneath the second opening of the second reflective plate;
a light source disposed in the space formed by the third opening of the second reflective plate and configured to emit a light into the slot to illuminate the sample slide accommodated therein; and
a first blackout layer disposed on top of the third opening thereby covering the light source and keeping the emitted light from leaking;
wherein, the sample slide accommodated in the slot has an edge being directly disposed underneath the light source, and the emitted light is reflected inside the slot and the sample slide thereby achieving the TIRS measurement to the sample slide.