US 11,982,657 B2
Method for calibrating at least one analytic device with multiple repeated hardware components
Nadja Arens, Starnberg (DE); Andrea Geistanger, Munich (DE); Anton Hilger, Munich (DE); Daniel Intelmann, Schaftlach (DE); and Shirin Shahriari, Munich (DE)
Assigned to Roche Diagnostics Operations, Inc., Indianapolis, IN (US)
Filed by Roche Diagnostics Operations, Inc., Indianapolis, IN (US)
Filed on Jun. 14, 2022, as Appl. No. 17/806,764.
Application 17/806,764 is a continuation of application No. PCT/EP2020/086409, filed on Dec. 16, 2020.
Claims priority of application No. 19216960 (EP), filed on Dec. 17, 2019.
Prior Publication US 2022/0308024 A1, Sep. 29, 2022
Int. Cl. G01N 30/72 (2006.01); G01N 30/86 (2006.01)
CPC G01N 30/8665 (2013.01) [G01N 30/7233 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method for calibrating at least one analytic device with repeated hardware components, wherein the analytic device comprises a plurality of hardware components, wherein hardware components are physical and/or tangible parts of the analytic device, wherein the method comprises the following steps:
a) providing at least one calibrator sample i having a known target value of a concentration of at least one analyte;
b) at least one measuring step, wherein the measuring step comprises conducting at least one measurement on the calibrator sample using the analytic device (112), wherein at least one detector signal sijk is acquired, wherein i=1, . . . l with l≥2, wherein i refers to the number of the calibrator sample, j=1, . . . J with J≥2, wherein j refers to the number of the hardware component, wherein k=1, . . . Kij with Kij≥1, wherein k refers to the number of repetition of the measurement step;
c) at least one calibration step, wherein a relationship between the detector signal and the concentration of the analyte is determined, wherein the calibration step comprises:
c.1: providing at least one parametrized function, wherein the parametrized function has a set of parameters, wherein the set of parameters comprises parameters describing an analyte-specific part of the parametrized function, wherein the set of parameters further comprises parameters for an adjustment of the parametrized function to the hardware components;
c.2: determining calibration values by conducting a calibration based on the parametrized function; and
c.3: determining an analysis function on basis of an inverse of the parametrized function and the determined calibration values.