US 11,982,633 B2
Method for analyzing signal of neutral atom imaging unit
Yongfu Wang, Beijing (CN); Qiugang Zong, Beijing (CN); Linghua Wang, Beijing (CN); Hongfei Chen, Beijing (CN); Hong Zou, Beijing (CN); Xiangqian Yu, Beijing (CN); Weihong Shi, Beijing (CN); and Lyu Zhou, Beijing (CN)
Assigned to Peking University, Beijing (CN)
Filed by Peking University, Beijing (CN)
Filed on Nov. 9, 2020, as Appl. No. 17/092,334.
Claims priority of application No. 202010042585.9 (CN), filed on Jan. 15, 2020.
Prior Publication US 2021/0215623 A1, Jul. 15, 2021
Int. Cl. G01N 23/04 (2018.01)
CPC G01N 23/04 (2013.01) [G01N 2223/10 (2013.01); G01N 2223/304 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A method for analyzing a signal of a neutral atom imaging unit, comprising:
preparing a neutral atom imaging unit, which includes a semiconductor detector array and modulation grids disposed at intervals in front of the semiconductor detector array;
preparing a neutral atom source plane, energetic neutral atoms emitted by the neutral atom source plane are received by the semiconductor detector array after passing through the modulation grids, and the modulation grids form a projection on the semiconductor detector array;
obtaining a detector response function according to the projection;
calculating a data signal obtained by the neutral atom imaging unit; and
imaging a neutral atom emission source according to the detector response function and the data signal.