US 11,981,084 B2
Lifecycle condition-based manufacturing alteration
Kristopher J. Erickson, Palo Alto, CA (US); Jarrid Wittkopf, Palo Alto, CA (US); Rafael Ballagas, Palo Alto, CA (US); David Wayne George, Palo Alto, CA (US); Lihua Zhao, Palo Alto, CA (US); and William J. Allen, Corvallis, OR (US)
Assigned to Hewlett-Packard Development Company, L.P., Spring, TX (US)
Appl. No. 17/414,543
Filed by Hewlett-Packard Development Company, L.P., Spring, TX (US)
PCT Filed Jun. 18, 2019, PCT No. PCT/US2019/037706
§ 371(c)(1), (2) Date Jun. 16, 2021,
PCT Pub. No. WO2020/256702, PCT Pub. Date Dec. 24, 2020.
Prior Publication US 2022/0097306 A1, Mar. 31, 2022
Int. Cl. B29C 64/393 (2017.01); B29C 64/379 (2017.01); B29C 64/386 (2017.01); G06Q 10/0635 (2023.01); G06Q 10/0639 (2023.01); G06Q 10/20 (2023.01); G06Q 50/04 (2012.01); B33Y 50/00 (2015.01); B33Y 50/02 (2015.01); B33Y 80/00 (2015.01)
CPC B29C 64/386 (2017.08) [B29C 64/379 (2017.08); G06Q 10/0635 (2013.01); G06Q 10/0639 (2013.01); G06Q 10/20 (2013.01); G06Q 50/04 (2013.01); B33Y 50/00 (2014.12); B33Y 50/02 (2014.12); B33Y 80/00 (2014.12); Y02P 90/02 (2015.11); Y02P 90/30 (2015.11)] 15 Claims
OG exemplary drawing
 
1. A method comprising:
reading an identifier from a storage element, the storage element embedded within a part;
extracting, based on the identifier, lifecycle conditions specific to the part from the storage element embedded within the part;
performing part testing on the part following formation; and
altering manufacturing operations based on extracted lifecycle conditions for the part and an output of the part testing.