US 12,302,562 B2
Semiconductor structure and method of forming the same
Yu-Wei Jiang, Hsinchu (TW); Sheng-Chih Lai, Hsinchu County (TW); Kuo-Chang Chiang, Hsinchu (TW); Hung-Chang Sun, Kaohsiung (TW); Tsuching Yang, Taipei (TW); Feng-Cheng Yang, Hsinchu County (TW); and Chung-Te Lin, Tainan (TW)
Assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD., Hsinchu (TW)
Filed by TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD., Hsinchu (TW)
Filed on Aug. 27, 2021, as Appl. No. 17/460,100.
Prior Publication US 2023/0066393 A1, Mar. 2, 2023
Int. Cl. H10B 43/27 (2023.01)
CPC H10B 43/27 (2023.02) 20 Claims
OG exemplary drawing
 
1. A method, comprising:
forming a plurality of memory cells, comprising:
a plurality of first conductive lines over a substrate;
charge-trapping layers coupled to the first conductive lines;
channel layers arranged adjacent to the charge-trapping layers; and
a plurality of first filling regions arranged between the channel layers;
etching the first filling regions to form first trenches;
depositing a liner over upper surfaces of the charge-trapping layers and the channel layers and sidewalls of the first trenches;
forming second filling regions in the first trenches;
patterning the second filling regions to form second trenches;
depositing a partition region in each of the second trenches; and
removing the liner to expose the charge-trapping layers and the channel layers.